Computed tomography with monochromatic x-rays from the national synchroton light source (1991)
- Authors:
- Autor USP: STOJANOFF, VIVIAN - IF
- Unidade: IF
- Assunto: MATÉRIA CONDENSADA
- Language: Inglês
- Imprenta:
- Source:
- Título: Nuclear Instruments and Methods B
- Volume/Número/Paginação/Ano: v.56-7, n.2 , p.1208, 1991
-
ABNT
DILMANIAN, F A et al. Computed tomography with monochromatic x-rays from the national synchroton light source. Nuclear Instruments and Methods B, v. 56-7, n. 2 , p. 1208, 1991Tradução . . Acesso em: 11 mar. 2026. -
APA
Dilmanian, F. A., Garett, R. F., Thomlinson, W. C., Berman, L. E., Chapman, L. D., Hasting, J. B., et al. (1991). Computed tomography with monochromatic x-rays from the national synchroton light source. Nuclear Instruments and Methods B, 56-7( 2 ), 1208. -
NLM
Dilmanian FA, Garett RF, Thomlinson WC, Berman LE, Chapman LD, Hasting JB, Luke PN, Overluizen T, Siddons DP, Slatkin DN, Stojanoff V, Thompson AC. Computed tomography with monochromatic x-rays from the national synchroton light source. Nuclear Instruments and Methods B. 1991 ;56-7( 2 ): 1208.[citado 2026 mar. 11 ] -
Vancouver
Dilmanian FA, Garett RF, Thomlinson WC, Berman LE, Chapman LD, Hasting JB, Luke PN, Overluizen T, Siddons DP, Slatkin DN, Stojanoff V, Thompson AC. Computed tomography with monochromatic x-rays from the national synchroton light source. Nuclear Instruments and Methods B. 1991 ;56-7( 2 ): 1208.[citado 2026 mar. 11 ] - Caracterizacao de defeitos produzidos por carbono em silicio czochralski - doadores termicamente gerados
- Influence of growth conditions on properties of inp homoepitaxial layers grown by liquid phase epitaxy
- Efeitos do carbono na formacao de defeitos no silicio czochralski
- Effects of boron concentration upon oxygen precipitation in cz silicon
- Defects in as-grown n-type czochralski silicon crystals
- Effects of 450'GRAUS'c thermal annealing upon oxygen precipitation in b-doped cz si wafers
- X-ray topography of a lysozyme crystal
- Estudos de defeitos em silício
- Estudo da cinetica de precipitacao do oxigenio em monocristais de si: b a partir de tecnicas de raios-x
- Efeito do carbono na formacao de defeitos em silicio
How to cite
A citação é gerada automaticamente e pode não estar totalmente de acordo com as normas