Filtros : "Journal of Integrated Circuits and Systems" "2022" Limpar

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  • Fonte: Journal of Integrated Circuits and Systems. Unidade: EESC

    Assuntos: POTENCIAL ELÉTRICO, DIODOS, ENGENHARIA ELÉTRICA

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    • ABNT

      CELINO, Daniel Ricardo et al. A physics-based RTD model accounting for space charge and phonon scattering effects. Journal of Integrated Circuits and Systems, v. 17, n. 1, p. 1-8, 2022Tradução . . Disponível em: https://doi.org/10.29292/jics.v17il.545. Acesso em: 15 nov. 2025.
    • APA

      Celino, D. R., Souza, A. M. de, Plazas, C. L. M. P., Ragi, R., & Romero, M. A. (2022). A physics-based RTD model accounting for space charge and phonon scattering effects. Journal of Integrated Circuits and Systems, 17( 1), 1-8. doi:10.29292/jics.v17il.545
    • NLM

      Celino DR, Souza AM de, Plazas CLMP, Ragi R, Romero MA. A physics-based RTD model accounting for space charge and phonon scattering effects [Internet]. Journal of Integrated Circuits and Systems. 2022 ; 17( 1): 1-8.[citado 2025 nov. 15 ] Available from: https://doi.org/10.29292/jics.v17il.545
    • Vancouver

      Celino DR, Souza AM de, Plazas CLMP, Ragi R, Romero MA. A physics-based RTD model accounting for space charge and phonon scattering effects [Internet]. Journal of Integrated Circuits and Systems. 2022 ; 17( 1): 1-8.[citado 2025 nov. 15 ] Available from: https://doi.org/10.29292/jics.v17il.545
  • Fonte: Journal of Integrated Circuits and Systems. Unidade: EP

    Assuntos: CIRCUITOS INTEGRADOS, ONDAS ELETROMAGNÉTICAS, PROCESSAMENTO DE DADOS, TERCEIRA DIMENSÃO

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    • ABNT

      SERRANO, Ariana Maria da Conceição Lacorte Caniato et al. Millimeter-wave wireless integrated systems–what to expect for future solutions. Journal of Integrated Circuits and Systems, v. 17, n. 2, p. 1-6, 2022Tradução . . Disponível em: https://doi.org/10.29292/jics.v17i2.627. Acesso em: 15 nov. 2025.
    • APA

      Serrano, A. M. da C. L. C., Alves, G. M. A., Abe, I. Y., & Marcelo, G. A. P. (2022). Millimeter-wave wireless integrated systems–what to expect for future solutions. Journal of Integrated Circuits and Systems, 17( 2), 1-6. doi:10.29292/jics.v17i2.627
    • NLM

      Serrano AM da CLC, Alves GMA, Abe IY, Marcelo GAP. Millimeter-wave wireless integrated systems–what to expect for future solutions [Internet]. Journal of Integrated Circuits and Systems. 2022 ; 17( 2): 1-6.[citado 2025 nov. 15 ] Available from: https://doi.org/10.29292/jics.v17i2.627
    • Vancouver

      Serrano AM da CLC, Alves GMA, Abe IY, Marcelo GAP. Millimeter-wave wireless integrated systems–what to expect for future solutions [Internet]. Journal of Integrated Circuits and Systems. 2022 ; 17( 2): 1-6.[citado 2025 nov. 15 ] Available from: https://doi.org/10.29292/jics.v17i2.627
  • Fonte: Journal of Integrated Circuits and Systems. Unidade: EP

    Assuntos: TRANSISTORES, SENSOR, CIRCUITOS INTEGRADOS MOS

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    • ABNT

      RANGEL, Ricardo Cardoso e SASAKI, Kátia Regina Akemi e MARTINO, João Antonio. Reconfigurable SOI-MOSFET: past, present and future applications. Journal of Integrated Circuits and Systems, v. 17, n. 2, p. 1-9, 2022Tradução . . Disponível em: https://doi.org/10.29292/jics.v17i2.626. Acesso em: 15 nov. 2025.
    • APA

      Rangel, R. C., Sasaki, K. R. A., & Martino, J. A. (2022). Reconfigurable SOI-MOSFET: past, present and future applications. Journal of Integrated Circuits and Systems, 17( 2), 1-9. doi:10.29292/jics.v17i2.626
    • NLM

      Rangel RC, Sasaki KRA, Martino JA. Reconfigurable SOI-MOSFET: past, present and future applications [Internet]. Journal of Integrated Circuits and Systems. 2022 ; 17( 2): 1-9.[citado 2025 nov. 15 ] Available from: https://doi.org/10.29292/jics.v17i2.626
    • Vancouver

      Rangel RC, Sasaki KRA, Martino JA. Reconfigurable SOI-MOSFET: past, present and future applications [Internet]. Journal of Integrated Circuits and Systems. 2022 ; 17( 2): 1-9.[citado 2025 nov. 15 ] Available from: https://doi.org/10.29292/jics.v17i2.626
  • Fonte: Journal of Integrated Circuits and Systems. Unidade: EP

    Assuntos: TRANSISTORES, SENSOR, CIRCUITOS ANALÓGICOS, CIRCUITOS DIGITAIS

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    • ABNT

      AGOPIAN, Paula Ghedini Der et al. Tunnel-FET evolution and applications for analog circuits. Journal of Integrated Circuits and Systems, v. 17, n. 2, p. 1-7, 2022Tradução . . Disponível em: https://doi.org/10.29292/jics.v17i2.631. Acesso em: 15 nov. 2025.
    • APA

      Agopian, P. G. D., Martino, J. A., Simoen, E., Rooyackers, R., & Claeys, C. (2022). Tunnel-FET evolution and applications for analog circuits. Journal of Integrated Circuits and Systems, 17( 2), 1-7. doi:10.29292/jics.v17i2.631
    • NLM

      Agopian PGD, Martino JA, Simoen E, Rooyackers R, Claeys C. Tunnel-FET evolution and applications for analog circuits [Internet]. Journal of Integrated Circuits and Systems. 2022 ; 17( 2): 1-7.[citado 2025 nov. 15 ] Available from: https://doi.org/10.29292/jics.v17i2.631
    • Vancouver

      Agopian PGD, Martino JA, Simoen E, Rooyackers R, Claeys C. Tunnel-FET evolution and applications for analog circuits [Internet]. Journal of Integrated Circuits and Systems. 2022 ; 17( 2): 1-7.[citado 2025 nov. 15 ] Available from: https://doi.org/10.29292/jics.v17i2.631
  • Fonte: Journal of Integrated Circuits and Systems. Unidades: EP, EESC

    Assuntos: TRANSISTORES, NANOELETRÔNICA, TEMPERATURA

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    • ABNT

      SIMOEN, Eddy et al. Performance perspective of gate-all-around double nanosheet CMOS beyond high-speed logic applications. Journal of Integrated Circuits and Systems, v. 17, n. 2, p. 1-9, 2022Tradução . . Disponível em: https://doi.org/10.29292/jics.v17i2.617. Acesso em: 15 nov. 2025.
    • APA

      Simoen, E., Coelho, C. H. S., Silva, V. C. P. da, Martino, J. A., Agopian, P. G. D., Oliveira, A., et al. (2022). Performance perspective of gate-all-around double nanosheet CMOS beyond high-speed logic applications. Journal of Integrated Circuits and Systems, 17( 2), 1-9. doi:10.29292/jics.v17i2.617
    • NLM

      Simoen E, Coelho CHS, Silva VCP da, Martino JA, Agopian PGD, Oliveira A, Cretu B, Veloso A. Performance perspective of gate-all-around double nanosheet CMOS beyond high-speed logic applications [Internet]. Journal of Integrated Circuits and Systems. 2022 ; 17( 2): 1-9.[citado 2025 nov. 15 ] Available from: https://doi.org/10.29292/jics.v17i2.617
    • Vancouver

      Simoen E, Coelho CHS, Silva VCP da, Martino JA, Agopian PGD, Oliveira A, Cretu B, Veloso A. Performance perspective of gate-all-around double nanosheet CMOS beyond high-speed logic applications [Internet]. Journal of Integrated Circuits and Systems. 2022 ; 17( 2): 1-9.[citado 2025 nov. 15 ] Available from: https://doi.org/10.29292/jics.v17i2.617
  • Fonte: Journal of Integrated Circuits and Systems. Unidade: EP

    Assuntos: TRANSISTORES, NANOTECNOLOGIA, BAIXA TEMPERATURA

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    • ABNT

      SILVA, Vanessa Cristina Pereira da et al. Experimental analysis of trade-off between transistor efficiency and unit gain frequency of nanosheet NMOSFET down to -100°C. Journal of Integrated Circuits and Systems, v. 17, n. 1, p. 1-6, 2022Tradução . . Disponível em: https://doi.org/10.29292/jics.v17il.550. Acesso em: 15 nov. 2025.
    • APA

      Silva, V. C. P. da, Leal, J. V. da C., Perina, W. F., Martino, J. A., Simoen, E., Veloso, A., & Agopian, P. G. D. (2022). Experimental analysis of trade-off between transistor efficiency and unit gain frequency of nanosheet NMOSFET down to -100°C. Journal of Integrated Circuits and Systems, 17( 1), 1-6. doi:10.29292/jics.v17i1.550
    • NLM

      Silva VCP da, Leal JV da C, Perina WF, Martino JA, Simoen E, Veloso A, Agopian PGD. Experimental analysis of trade-off between transistor efficiency and unit gain frequency of nanosheet NMOSFET down to -100°C [Internet]. Journal of Integrated Circuits and Systems. 2022 ;17( 1): 1-6.[citado 2025 nov. 15 ] Available from: https://doi.org/10.29292/jics.v17il.550
    • Vancouver

      Silva VCP da, Leal JV da C, Perina WF, Martino JA, Simoen E, Veloso A, Agopian PGD. Experimental analysis of trade-off between transistor efficiency and unit gain frequency of nanosheet NMOSFET down to -100°C [Internet]. Journal of Integrated Circuits and Systems. 2022 ;17( 1): 1-6.[citado 2025 nov. 15 ] Available from: https://doi.org/10.29292/jics.v17il.550

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