ReP USP - Resultado da busca

Trabalho de evento-anais periodico
The structural properties of the protective layer of microlamps under polarization (2017)
Cassimiro, Vinicius Roberto de Sylos; Fantini, Márcia Carvalho de Abreu ; Pereyra, Inés ; Páez Carreño, Marcelo Nelson ; Alayo Chávez, Marco Isaías ; Rehder, Gustavo Pamplona ; Cunha Junior, Rubens Martins; Trcera, Nicolas
Source: Proceedings Science BWSP. Conference titles: Brazilian Workshop on Semiconductor Physics. Unidades: IF, EP
Subjects: CRISTALOGRAFIA FÍSICA, FILMES FINOS, ESPECTROSCOPIA DE RAIO X
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ABNT
CASSIMIRO, Vinicius Roberto de Sylos et al. The structural properties of the protective layer of microlamps under polarization. Proceedings Science BWSP. São Paulo: Instituto de Física, Universidade de São Paulo. Disponível em: https://doi.org/10.17648/bwsp-2017-70051. Acesso em: 17 out. 2024. , 2017
APA
Cassimiro, V. R. de S., Fantini, M. C. de A., Pereyra, I., Páez Carreño, M. N., Alayo Chávez, M. I., Rehder, G. P., et al. (2017). The structural properties of the protective layer of microlamps under polarization. Proceedings Science BWSP. São Paulo: Instituto de Física, Universidade de São Paulo. doi:10.17648/bwsp-2017-70051
NLM
Cassimiro VR de S, Fantini MC de A, Pereyra I, Páez Carreño MN, Alayo Chávez MI, Rehder GP, Cunha Junior RM, Trcera N. The structural properties of the protective layer of microlamps under polarization [Internet]. Proceedings Science BWSP. 2017 ; 1 4 .[citado 2024 out. 17 ] Available from: https://doi.org/10.17648/bwsp-2017-70051
Vancouver
Cassimiro VR de S, Fantini MC de A, Pereyra I, Páez Carreño MN, Alayo Chávez MI, Rehder GP, Cunha Junior RM, Trcera N. The structural properties of the protective layer of microlamps under polarization [Internet]. Proceedings Science BWSP. 2017 ; 1 4 .[citado 2024 out. 17 ] Available from: https://doi.org/10.17648/bwsp-2017-70051
Trabalho de evento-anais periodico
Chemical bonding and composition of silicon nitride films prepared by inductively coupled plasma chemical vapor deposition (2010)
Matsuoka, Masao; Isotani, Sadao; Mamani, Wilmer Alexe Sucasaire; Zambom, Luís da Silva ; Ogata, Katsuhiko
Source: Surface & Coatings Technology. Conference titles: International Workshop on Plasma-Based Ion Implantation and Deposition. Unidades: IF, EP
Assunto: ESPECTROSCOPIA DE RAIO X
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ABNT
MATSUOKA, Masao et al. Chemical bonding and composition of silicon nitride films prepared by inductively coupled plasma chemical vapor deposition. Surface & Coatings Technology. Amsterdam: Elsevier Science. Disponível em: http://www.sciencedirect.com/science/journal/02578972. Acesso em: 17 out. 2024. , 2010
APA
Matsuoka, M., Isotani, S., Mamani, W. A. S., Zambom, L. da S., & Ogata, K. (2010). Chemical bonding and composition of silicon nitride films prepared by inductively coupled plasma chemical vapor deposition. Surface & Coatings Technology. Amsterdam: Elsevier Science. Recuperado de http://www.sciencedirect.com/science/journal/02578972
NLM
Matsuoka M, Isotani S, Mamani WAS, Zambom L da S, Ogata K. Chemical bonding and composition of silicon nitride films prepared by inductively coupled plasma chemical vapor deposition [Internet]. Surface & Coatings Technology. 2010 ; 204 18-19.[citado 2024 out. 17 ] Available from: http://www.sciencedirect.com/science/journal/02578972
Vancouver
Matsuoka M, Isotani S, Mamani WAS, Zambom L da S, Ogata K. Chemical bonding and composition of silicon nitride films prepared by inductively coupled plasma chemical vapor deposition [Internet]. Surface & Coatings Technology. 2010 ; 204 18-19.[citado 2024 out. 17 ] Available from: http://www.sciencedirect.com/science/journal/02578972
Artigo de periodico
Local bonding in PECVD-"SiO IND.X" "N IND.Y" films (2006)
Criado, Denise ; Alayo Chávez, Marco Isaías ; Fantini, Márcia Carvalho de Abreu ; Pereyra, Inés
Source: Journal of Non-Crystalline Solids. Unidades: IF, EP
Subjects: FILMES FINOS, ESPECTROSCOPIA DE RAIO X
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ABNT
CRIADO, Denise et al. Local bonding in PECVD-"SiO IND.X" "N IND.Y" films. Journal of Non-Crystalline Solids, v. 352, n. 9-20, p. 1298-1302, 2006Tradução . . Disponível em: http://www.sciencedirect.com/science?_ob=PublicationURL&_cdi=5594&_pubType=J&_auth=y&_acct=C000049650&_version=1&_urlVersion=0&_userid=972067&md5=214bac5d32eab2194b6eace9325ac20e. Acesso em: 17 out. 2024.
APA
Criado, D., Alayo Chávez, M. I., Fantini, M. C. de A., & Pereyra, I. (2006). Local bonding in PECVD-"SiO IND.X" "N IND.Y" films. Journal of Non-Crystalline Solids, 352( 9-20), 1298-1302. Recuperado de http://www.sciencedirect.com/science?_ob=PublicationURL&_cdi=5594&_pubType=J&_auth=y&_acct=C000049650&_version=1&_urlVersion=0&_userid=972067&md5=214bac5d32eab2194b6eace9325ac20e
NLM
Criado D, Alayo Chávez MI, Fantini MC de A, Pereyra I. Local bonding in PECVD-"SiO IND.X" "N IND.Y" films [Internet]. Journal of Non-Crystalline Solids. 2006 ; 352( 9-20): 1298-1302.[citado 2024 out. 17 ] Available from: http://www.sciencedirect.com/science?_ob=PublicationURL&_cdi=5594&_pubType=J&_auth=y&_acct=C000049650&_version=1&_urlVersion=0&_userid=972067&md5=214bac5d32eab2194b6eace9325ac20e
Vancouver
Criado D, Alayo Chávez MI, Fantini MC de A, Pereyra I. Local bonding in PECVD-"SiO IND.X" "N IND.Y" films [Internet]. Journal of Non-Crystalline Solids. 2006 ; 352( 9-20): 1298-1302.[citado 2024 out. 17 ] Available from: http://www.sciencedirect.com/science?_ob=PublicationURL&_cdi=5594&_pubType=J&_auth=y&_acct=C000049650&_version=1&_urlVersion=0&_userid=972067&md5=214bac5d32eab2194b6eace9325ac20e
Artigo de periodico
The external beam facility used to characterize corrosion products in mettalic statuettes (2005)
Rizzutto, Márcia de Almeida ; Tabacniks, Manfredo Harri ; Added, Nemitala ; Barbosa, M D L; Curado, Jessica Fleury; Santos, W A; Lima, Silvia Cunha; Melo, Hercílio Gomes de ; Neiva, Augusto Camara
Source: Nuclear Instruments & Methods in Physics Research Section B-Beam Interactions with Materials and Atoms. Unidades: IF, EP, MAE
Subjects: DIFRAÇÃO POR RAIOS X, DETECÇÃO DE PARTÍCULAS, FEIXES ÓPTICOS, ESPECTROSCOPIA DE RAIO X
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ABNT
RIZZUTTO, Márcia de Almeida et al. The external beam facility used to characterize corrosion products in mettalic statuettes. Nuclear Instruments & Methods in Physics Research Section B-Beam Interactions with Materials and Atoms, v. 240, n. 1-2, p. 549-553, 2005Tradução . . Disponível em: https://doi.org/10.1016/j.nimb.2005.06.153. Acesso em: 17 out. 2024.
APA
Rizzutto, M. de A., Tabacniks, M. H., Added, N., Barbosa, M. D. L., Curado, J. F., Santos, W. A., et al. (2005). The external beam facility used to characterize corrosion products in mettalic statuettes. Nuclear Instruments & Methods in Physics Research Section B-Beam Interactions with Materials and Atoms, 240( 1-2), 549-553. doi:10.1016/j.nimb.2005.06.153
NLM
Rizzutto M de A, Tabacniks MH, Added N, Barbosa MDL, Curado JF, Santos WA, Lima SC, Melo HG de, Neiva AC. The external beam facility used to characterize corrosion products in mettalic statuettes [Internet]. Nuclear Instruments & Methods in Physics Research Section B-Beam Interactions with Materials and Atoms. 2005 ; 240( 1-2): 549-553.[citado 2024 out. 17 ] Available from: https://doi.org/10.1016/j.nimb.2005.06.153
Vancouver
Rizzutto M de A, Tabacniks MH, Added N, Barbosa MDL, Curado JF, Santos WA, Lima SC, Melo HG de, Neiva AC. The external beam facility used to characterize corrosion products in mettalic statuettes [Internet]. Nuclear Instruments & Methods in Physics Research Section B-Beam Interactions with Materials and Atoms. 2005 ; 240( 1-2): 549-553.[citado 2024 out. 17 ] Available from: https://doi.org/10.1016/j.nimb.2005.06.153
Trabalho de evento-resumo
Xanes characterization in PECVD-SiOxNy films (2004)
Criado, Denise ; Alayo Chávez, Marco Isaías ; Pereyra, Inés ; Fantini, Márcia Carvalho de Abreu
Source: Program. Conference titles: Encontro da SBPMat. Unidades: IF, EP
Subjects: MATERIAIS, FILMES FINOS, ESPECTROSCOPIA DE RAIO X
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ABNT
CRIADO, Denise et al. Xanes characterization in PECVD-SiOxNy films. 2004, Anais.. São Carlos: SBPMat, 2004. Disponível em: http://www.sbpmat.org.br/3meeting/simposio_b.pdf. Acesso em: 17 out. 2024.
APA
Criado, D., Alayo Chávez, M. I., Pereyra, I., & Fantini, M. C. de A. (2004). Xanes characterization in PECVD-SiOxNy films. In Program. São Carlos: SBPMat. Recuperado de http://www.sbpmat.org.br/3meeting/simposio_b.pdf
NLM
Criado D, Alayo Chávez MI, Pereyra I, Fantini MC de A. Xanes characterization in PECVD-SiOxNy films [Internet]. Program. 2004 ;[citado 2024 out. 17 ] Available from: http://www.sbpmat.org.br/3meeting/simposio_b.pdf
Vancouver
Criado D, Alayo Chávez MI, Pereyra I, Fantini MC de A. Xanes characterization in PECVD-SiOxNy films [Internet]. Program. 2004 ;[citado 2024 out. 17 ] Available from: http://www.sbpmat.org.br/3meeting/simposio_b.pdf
Artigo de periodico
Local order structure of a-Si'O IND.X' 'N IND.Y':H grown by PECVD (2002)
Scopel, Wanderla Luis ; Fantini, Márcia Carvalho de Abreu ; Alayo Chávez, Marco Isaías ; Pereyra, Inés
Source: Brazilian Journal of Physics. Unidades: IF, EP
Subjects: ESPECTROSCOPIA DE RAIO X, ESPECTROMETRIA
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ABNT
SCOPEL, Wanderla Luis et al. Local order structure of a-Si'O IND.X' 'N IND.Y':H grown by PECVD. Brazilian Journal of Physics, v. 32, n. 2A, p. 366-368, 2002Tradução . . Disponível em: http://www.sbf.if.usp.br/bjp/Vol32/Num2a/v32_366.pdf. Acesso em: 17 out. 2024.
APA
Scopel, W. L., Fantini, M. C. de A., Alayo Chávez, M. I., & Pereyra, I. (2002). Local order structure of a-Si'O IND.X' 'N IND.Y':H grown by PECVD. Brazilian Journal of Physics, 32( 2A), 366-368. Recuperado de http://www.sbf.if.usp.br/bjp/Vol32/Num2a/v32_366.pdf
NLM
Scopel WL, Fantini MC de A, Alayo Chávez MI, Pereyra I. Local order structure of a-Si'O IND.X' 'N IND.Y':H grown by PECVD [Internet]. Brazilian Journal of Physics. 2002 ; 32( 2A): 366-368.[citado 2024 out. 17 ] Available from: http://www.sbf.if.usp.br/bjp/Vol32/Num2a/v32_366.pdf
Vancouver
Scopel WL, Fantini MC de A, Alayo Chávez MI, Pereyra I. Local order structure of a-Si'O IND.X' 'N IND.Y':H grown by PECVD [Internet]. Brazilian Journal of Physics. 2002 ; 32( 2A): 366-368.[citado 2024 out. 17 ] Available from: http://www.sbf.if.usp.br/bjp/Vol32/Num2a/v32_366.pdf
Artigo de periodico
Local structure and bonds of amorphous silicon oxynitride thin films (2002)
Scopel, Wanderla Luis ; Fantini, Márcia Carvalho de Abreu ; Alayo Chávez, Marco Isaías ; Pereyra, Inés
Source: Thin Solid Films. Unidades: IF, EP
Subjects: ESPECTROSCOPIA DE RAIO X, ESPECTROMETRIA, FILMES FINOS
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ABNT
SCOPEL, Wanderla Luis et al. Local structure and bonds of amorphous silicon oxynitride thin films. Thin Solid Films, v. 413, n. 1-2, p. 59-64, 2002Tradução . . Disponível em: https://doi.org/10.1016/s0040-6090(02)00346-2. Acesso em: 17 out. 2024.
APA
Scopel, W. L., Fantini, M. C. de A., Alayo Chávez, M. I., & Pereyra, I. (2002). Local structure and bonds of amorphous silicon oxynitride thin films. Thin Solid Films, 413( 1-2), 59-64. doi:10.1016/s0040-6090(02)00346-2
NLM
Scopel WL, Fantini MC de A, Alayo Chávez MI, Pereyra I. Local structure and bonds of amorphous silicon oxynitride thin films [Internet]. Thin Solid Films. 2002 ; 413( 1-2): 59-64.[citado 2024 out. 17 ] Available from: https://doi.org/10.1016/s0040-6090(02)00346-2
Vancouver
Scopel WL, Fantini MC de A, Alayo Chávez MI, Pereyra I. Local structure and bonds of amorphous silicon oxynitride thin films [Internet]. Thin Solid Films. 2002 ; 413( 1-2): 59-64.[citado 2024 out. 17 ] Available from: https://doi.org/10.1016/s0040-6090(02)00346-2

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