Development of double layer structure 1-electrical characterization (1996)
Source: Proceedings. Conference titles: Conference of the Brazilian Microelectronics Society. Unidade: EP
Assunto: SEMICONDUTORES
ABNT
PEREIRA, Jose Augusto de Alencar Mendes e TORRES, Luiz Carlos Molina. Development of double layer structure 1-electrical characterization. 1996, Anais.. São Paulo: Sbmicro, 1996. . Acesso em: 09 set. 2024.APA
Pereira, J. A. de A. M., & Torres, L. C. M. (1996). Development of double layer structure 1-electrical characterization. In Proceedings. São Paulo: Sbmicro.NLM
Pereira JA de AM, Torres LCM. Development of double layer structure 1-electrical characterization. Proceedings. 1996 ;[citado 2024 set. 09 ]Vancouver
Pereira JA de AM, Torres LCM. Development of double layer structure 1-electrical characterization. Proceedings. 1996 ;[citado 2024 set. 09 ]