ReP USP - Resultado da busca

Artigo de periodico
Aquaregia and oxigen plasma treatments on fluorinated tin oxide for assembly of PLEDs devices using OC1C10-PPV as emissive polymer (2009)
Santos, Emerson Roberto; Burini Junior, Elvo Calixto ; Fonseca, Fernando Josepetti
Source: Sensors & Transducers Journal. Unidade: EP
Assunto: FILMES FINOS
A citação é gerada automaticamente e pode não estar totalmente de acordo com as normas
ABNT
SANTOS, Emerson Roberto e BURINI JUNIOR, Elvo Calixto e FONSECA, Fernando Josepetti. Aquaregia and oxigen plasma treatments on fluorinated tin oxide for assembly of PLEDs devices using OC1C10-PPV as emissive polymer. Sensors & Transducers Journal, v. 101, n. 2, 2009Tradução . . Acesso em: 04 out. 2024.
APA
Santos, E. R., Burini Junior, E. C., & Fonseca, F. J. (2009). Aquaregia and oxigen plasma treatments on fluorinated tin oxide for assembly of PLEDs devices using OC1C10-PPV as emissive polymer. Sensors & Transducers Journal, 101( 2).
NLM
Santos ER, Burini Junior EC, Fonseca FJ. Aquaregia and oxigen plasma treatments on fluorinated tin oxide for assembly of PLEDs devices using OC1C10-PPV as emissive polymer. Sensors & Transducers Journal. 2009 ;101( 2):[citado 2024 out. 04 ]
Vancouver
Santos ER, Burini Junior EC, Fonseca FJ. Aquaregia and oxigen plasma treatments on fluorinated tin oxide for assembly of PLEDs devices using OC1C10-PPV as emissive polymer. Sensors & Transducers Journal. 2009 ;101( 2):[citado 2024 out. 04 ]
Artigo de periodico
Opto-electrical properties of single layer flexible electroluminescence device with ruthenium complex (2008)
Santos, G.; Fonseca, Fernando Josepetti ; Andrade, Adnei Melges de ; Patrocinio, Antônio Otávio de Toledo; Mizoguchi, Sergio Kenji; Iha, Neyde Yukie Murakami ; Peres, M.; Simões, W.; Monteiro, T.; Pereira, L.
Source: Journal of Non-Crystalline Solids. Unidades: EP, IEE, IQ
Subjects: RUTÊNIO, LUMINESCÊNCIA, FOTOCONDUTIVIDADE, FILMES FINOS
A citação é gerada automaticamente e pode não estar totalmente de acordo com as normas
ABNT
SANTOS, G. et al. Opto-electrical properties of single layer flexible electroluminescence device with ruthenium complex. Journal of Non-Crystalline Solids, v. 354, n. 19-25, p. 2571-2574, 2008Tradução . . Disponível em: https://doi.org/10.1016/j.jnoncrysol.2007.10.064. Acesso em: 04 out. 2024.
APA
Santos, G., Fonseca, F. J., Andrade, A. M. de, Patrocinio, A. O. de T., Mizoguchi, S. K., Iha, N. Y. M., et al. (2008). Opto-electrical properties of single layer flexible electroluminescence device with ruthenium complex. Journal of Non-Crystalline Solids, 354( 19-25), 2571-2574. doi:10.1016/j.jnoncrysol.2007.10.064
NLM
Santos G, Fonseca FJ, Andrade AM de, Patrocinio AO de T, Mizoguchi SK, Iha NYM, Peres M, Simões W, Monteiro T, Pereira L. Opto-electrical properties of single layer flexible electroluminescence device with ruthenium complex [Internet]. Journal of Non-Crystalline Solids. 2008 ;354( 19-25): 2571-2574.[citado 2024 out. 04 ] Available from: https://doi.org/10.1016/j.jnoncrysol.2007.10.064
Vancouver
Santos G, Fonseca FJ, Andrade AM de, Patrocinio AO de T, Mizoguchi SK, Iha NYM, Peres M, Simões W, Monteiro T, Pereira L. Opto-electrical properties of single layer flexible electroluminescence device with ruthenium complex [Internet]. Journal of Non-Crystalline Solids. 2008 ;354( 19-25): 2571-2574.[citado 2024 out. 04 ] Available from: https://doi.org/10.1016/j.jnoncrysol.2007.10.064
Artigo de periodico
Influence of the deposition parameters on the morphology and electrical conductivity of PANI/PSS self-assembled films (2008)
Braga, Guilherme de Souza; Paterno, Leonardo Giordano ; Lima, John Paul Hempel; Fonseca, Fernando Josepetti ; Andrade, Adnei Melges de
Source: Materials Science and Engineering: C. Unidades: EP, IEE
Assunto: FILMES FINOS
A citação é gerada automaticamente e pode não estar totalmente de acordo com as normas
ABNT
BRAGA, Guilherme de Souza et al. Influence of the deposition parameters on the morphology and electrical conductivity of PANI/PSS self-assembled films. Materials Science and Engineering: C, v. 28, n. 4, p. 555-562, 2008Tradução . . Disponível em: https://doi.org/10.1016/j.msec.2007.06.003. Acesso em: 04 out. 2024.
APA
Braga, G. de S., Paterno, L. G., Lima, J. P. H., Fonseca, F. J., & Andrade, A. M. de. (2008). Influence of the deposition parameters on the morphology and electrical conductivity of PANI/PSS self-assembled films. Materials Science and Engineering: C, 28( 4), 555-562. doi:10.1016/j.msec.2007.06.003
NLM
Braga G de S, Paterno LG, Lima JPH, Fonseca FJ, Andrade AM de. Influence of the deposition parameters on the morphology and electrical conductivity of PANI/PSS self-assembled films [Internet]. Materials Science and Engineering: C. 2008 ;28( 4): 555-562.[citado 2024 out. 04 ] Available from: https://doi.org/10.1016/j.msec.2007.06.003
Vancouver
Braga G de S, Paterno LG, Lima JPH, Fonseca FJ, Andrade AM de. Influence of the deposition parameters on the morphology and electrical conductivity of PANI/PSS self-assembled films [Internet]. Materials Science and Engineering: C. 2008 ;28( 4): 555-562.[citado 2024 out. 04 ] Available from: https://doi.org/10.1016/j.msec.2007.06.003
Artigo de periodico
Nanostructure formation in polymer thin films influenced by humidity (2007)
Gliemann, Hartmut; Almeida, Arlete Tavares; Petri, Denise Freitas Siqueira ; Schimmel, Thomas
Source: Surface and Interface Analysis. Unidade: IQ
Subjects: BLENDAS, NANOTECNOLOGIA, FILMES FINOS
A citação é gerada automaticamente e pode não estar totalmente de acordo com as normas
ABNT
GLIEMANN, Hartmut et al. Nanostructure formation in polymer thin films influenced by humidity. Surface and Interface Analysis, v. 39, n. 1, p. 1-8, 2007Tradução . . Disponível em: https://doi.org/10.1002/sia.2339. Acesso em: 04 out. 2024.
APA
Gliemann, H., Almeida, A. T., Petri, D. F. S., & Schimmel, T. (2007). Nanostructure formation in polymer thin films influenced by humidity. Surface and Interface Analysis, 39( 1), 1-8. doi:10.1002/sia.2339
NLM
Gliemann H, Almeida AT, Petri DFS, Schimmel T. Nanostructure formation in polymer thin films influenced by humidity [Internet]. Surface and Interface Analysis. 2007 ; 39( 1): 1-8.[citado 2024 out. 04 ] Available from: https://doi.org/10.1002/sia.2339
Vancouver
Gliemann H, Almeida AT, Petri DFS, Schimmel T. Nanostructure formation in polymer thin films influenced by humidity [Internet]. Surface and Interface Analysis. 2007 ; 39( 1): 1-8.[citado 2024 out. 04 ] Available from: https://doi.org/10.1002/sia.2339
Artigo de periodico
The influence of diffusion of fluorine compounds for silicon lateral etching (2004)
Verdonck, Patrick Bernard; Goodyear, Alec; Braithwaite, Nicholas
Source: Thin Solid Films,. Unidade: EP
Assunto: FILMES FINOS
A citação é gerada automaticamente e pode não estar totalmente de acordo com as normas
ABNT
VERDONCK, Patrick Bernard e GOODYEAR, Alec e BRAITHWAITE, Nicholas. The influence of diffusion of fluorine compounds for silicon lateral etching. Thin Solid Films, v. 459, n. 1-2, p. 141-144, 2004Tradução . . Disponível em: https://doi.org/10.1016/j.tsf.2003.12.117. Acesso em: 04 out. 2024.
APA
Verdonck, P. B., Goodyear, A., & Braithwaite, N. (2004). The influence of diffusion of fluorine compounds for silicon lateral etching. Thin Solid Films,, 459( 1-2), 141-144. doi:10.1016/j.tsf.2003.12.117
NLM
Verdonck PB, Goodyear A, Braithwaite N. The influence of diffusion of fluorine compounds for silicon lateral etching [Internet]. Thin Solid Films,. 2004 ; 459( 1-2): 141-144.[citado 2024 out. 04 ] Available from: https://doi.org/10.1016/j.tsf.2003.12.117
Vancouver
Verdonck PB, Goodyear A, Braithwaite N. The influence of diffusion of fluorine compounds for silicon lateral etching [Internet]. Thin Solid Films,. 2004 ; 459( 1-2): 141-144.[citado 2024 out. 04 ] Available from: https://doi.org/10.1016/j.tsf.2003.12.117
Artigo de periodico
High-density plasma chemical vapor deposition of amorphous carbon films (2004)
Mousinho, Ana Paula; Mansano, Ronaldo Domingues ; Verdonck, Patrick Bernard
Source: Diamond and Related Materials,. Unidade: EP
Assunto: FILMES FINOS
A citação é gerada automaticamente e pode não estar totalmente de acordo com as normas
ABNT
MOUSINHO, Ana Paula e MANSANO, Ronaldo Domingues e VERDONCK, Patrick Bernard. High-density plasma chemical vapor deposition of amorphous carbon films. Diamond and Related Materials, v. 13, n. 2, p. 311-315, 2004Tradução . . Disponível em: https://doi.org/10.1016/j.diamond.2003.10.024. Acesso em: 04 out. 2024.
APA
Mousinho, A. P., Mansano, R. D., & Verdonck, P. B. (2004). High-density plasma chemical vapor deposition of amorphous carbon films. Diamond and Related Materials,, 13( 2), 311-315. doi:10.1016/j.diamond.2003.10.024
NLM
Mousinho AP, Mansano RD, Verdonck PB. High-density plasma chemical vapor deposition of amorphous carbon films [Internet]. Diamond and Related Materials,. 2004 ; 13( 2): 311-315.[citado 2024 out. 04 ] Available from: https://doi.org/10.1016/j.diamond.2003.10.024
Vancouver
Mousinho AP, Mansano RD, Verdonck PB. High-density plasma chemical vapor deposition of amorphous carbon films [Internet]. Diamond and Related Materials,. 2004 ; 13( 2): 311-315.[citado 2024 out. 04 ] Available from: https://doi.org/10.1016/j.diamond.2003.10.024
Artigo de periodico
Correlation between mechanical and electrical properties of silicon oxide deposited by PECVD-TEOS at low temperature (2004)
Gonçalves, Lucas Gonçalves Dias; Viana, Carlos Eduardo; Santos, J. C.; Morimoto, Nilton Itiro
Source: Surface & Coatings Technology,. Unidade: EP
Assunto: FILMES FINOS
A citação é gerada automaticamente e pode não estar totalmente de acordo com as normas
ABNT
GONÇALVES, Lucas Gonçalves Dias et al. Correlation between mechanical and electrical properties of silicon oxide deposited by PECVD-TEOS at low temperature. Surface & Coatings Technology, v. 180-181, p. 275-279, 2004Tradução . . Disponível em: https://doi.org/10.1016/s0257-8972(03)01212-x. Acesso em: 04 out. 2024.
APA
Gonçalves, L. G. D., Viana, C. E., Santos, J. C., & Morimoto, N. I. (2004). Correlation between mechanical and electrical properties of silicon oxide deposited by PECVD-TEOS at low temperature. Surface & Coatings Technology,, 180-181, 275-279. doi:10.1016/s0257-8972(03)01212-x
NLM
Gonçalves LGD, Viana CE, Santos JC, Morimoto NI. Correlation between mechanical and electrical properties of silicon oxide deposited by PECVD-TEOS at low temperature [Internet]. Surface & Coatings Technology,. 2004 ;180-181 275-279.[citado 2024 out. 04 ] Available from: https://doi.org/10.1016/s0257-8972(03)01212-x
Vancouver
Gonçalves LGD, Viana CE, Santos JC, Morimoto NI. Correlation between mechanical and electrical properties of silicon oxide deposited by PECVD-TEOS at low temperature [Internet]. Surface & Coatings Technology,. 2004 ;180-181 275-279.[citado 2024 out. 04 ] Available from: https://doi.org/10.1016/s0257-8972(03)01212-x
Artigo de periodico
Nanostructured films of perylene derivatives: high performance materials for taste sensor applications (2004)
Constantino, Carlos José Leopoldo; Antunes, P. A.; Venâncio, Everaldo Carlos; Consolin, N.; Fonseca, Fernando Josepetti ; Mattoso, Luiz Henrique Capparelli; Aroca, Ricardo F.; Oliveira Junior, Osvaldo Novais de; Riul Junior, Antonio
Source: Sensor Letters. Unidades: EP, IFSC
Assunto: FILMES FINOS
A citação é gerada automaticamente e pode não estar totalmente de acordo com as normas
ABNT
CONSTANTINO, Carlos José Leopoldo et al. Nanostructured films of perylene derivatives: high performance materials for taste sensor applications. Sensor Letters, v. 2, n. 2, p. 95-101, 2004Tradução . . Acesso em: 04 out. 2024.
APA
Constantino, C. J. L., Antunes, P. A., Venâncio, E. C., Consolin, N., Fonseca, F. J., Mattoso, L. H. C., et al. (2004). Nanostructured films of perylene derivatives: high performance materials for taste sensor applications. Sensor Letters, 2( 2), 95-101.
NLM
Constantino CJL, Antunes PA, Venâncio EC, Consolin N, Fonseca FJ, Mattoso LHC, Aroca RF, Oliveira Junior ON de, Riul Junior A. Nanostructured films of perylene derivatives: high performance materials for taste sensor applications. Sensor Letters. 2004 ; 2( 2): 95-101.[citado 2024 out. 04 ]
Vancouver
Constantino CJL, Antunes PA, Venâncio EC, Consolin N, Fonseca FJ, Mattoso LHC, Aroca RF, Oliveira Junior ON de, Riul Junior A. Nanostructured films of perylene derivatives: high performance materials for taste sensor applications. Sensor Letters. 2004 ; 2( 2): 95-101.[citado 2024 out. 04 ]
Artigo de periodico
The adsorption of squaric acid and its derived species on silver and gold surfaces studied by SERS (2004)
Sant'Ana, Antonio Carlos; Santos, Paulo Sérgio ; Temperini, Márcia Laudelina Arruda
Source: Journal of Electroanalytical Chemistry. Unidade: IQ
Subjects: ADSORÇÃO, FILMES FINOS, FÍSICO-QUÍMICA
A citação é gerada automaticamente e pode não estar totalmente de acordo com as normas
ABNT
SANT'ANA, Antonio Carlos e SANTOS, Paulo Sérgio e TEMPERINI, Márcia Laudelina Arruda. The adsorption of squaric acid and its derived species on silver and gold surfaces studied by SERS. Journal of Electroanalytical Chemistry, v. 571, n. 2, p. 247-254, 2004Tradução . . Disponível em: https://doi.org/10.1016/j.jelechem.2004.05.014. Acesso em: 04 out. 2024.
APA
Sant'Ana, A. C., Santos, P. S., & Temperini, M. L. A. (2004). The adsorption of squaric acid and its derived species on silver and gold surfaces studied by SERS. Journal of Electroanalytical Chemistry, 571( 2), 247-254. doi:10.1016/j.jelechem.2004.05.014
NLM
Sant'Ana AC, Santos PS, Temperini MLA. The adsorption of squaric acid and its derived species on silver and gold surfaces studied by SERS [Internet]. Journal of Electroanalytical Chemistry. 2004 ; 571( 2): 247-254.[citado 2024 out. 04 ] Available from: https://doi.org/10.1016/j.jelechem.2004.05.014
Vancouver
Sant'Ana AC, Santos PS, Temperini MLA. The adsorption of squaric acid and its derived species on silver and gold surfaces studied by SERS [Internet]. Journal of Electroanalytical Chemistry. 2004 ; 571( 2): 247-254.[citado 2024 out. 04 ] Available from: https://doi.org/10.1016/j.jelechem.2004.05.014
Artigo de periodico
The influence of nitrogen on the dielectric constant and surface hardness in diamond-like carbon (DLC) films (2004)
Guerino, M.; Massi, Marcos; Maciel, Homero Santiago; Otani, C.; Mansano, Ronaldo Domingues ; Verdonck, Patrick Bernard; Libardi, J.
Source: Diamond and Related Materials,. Unidade: EP
Assunto: FILMES FINOS
A citação é gerada automaticamente e pode não estar totalmente de acordo com as normas
ABNT
GUERINO, M. et al. The influence of nitrogen on the dielectric constant and surface hardness in diamond-like carbon (DLC) films. Diamond and Related Materials, v. 13, n. 2, p. 316-319, 2004Tradução . . Disponível em: https://doi.org/10.1016/j.diamond.2003.10.016. Acesso em: 04 out. 2024.
APA
Guerino, M., Massi, M., Maciel, H. S., Otani, C., Mansano, R. D., Verdonck, P. B., & Libardi, J. (2004). The influence of nitrogen on the dielectric constant and surface hardness in diamond-like carbon (DLC) films. Diamond and Related Materials,, 13( 2), 316-319. doi:10.1016/j.diamond.2003.10.016
NLM
Guerino M, Massi M, Maciel HS, Otani C, Mansano RD, Verdonck PB, Libardi J. The influence of nitrogen on the dielectric constant and surface hardness in diamond-like carbon (DLC) films [Internet]. Diamond and Related Materials,. 2004 ; 13( 2): 316-319.[citado 2024 out. 04 ] Available from: https://doi.org/10.1016/j.diamond.2003.10.016
Vancouver
Guerino M, Massi M, Maciel HS, Otani C, Mansano RD, Verdonck PB, Libardi J. The influence of nitrogen on the dielectric constant and surface hardness in diamond-like carbon (DLC) films [Internet]. Diamond and Related Materials,. 2004 ; 13( 2): 316-319.[citado 2024 out. 04 ] Available from: https://doi.org/10.1016/j.diamond.2003.10.016
Artigo de periodico
Low-temperature PECVD deposition of highly conductive microcrystalline silicon thin films (2003)
Nardes, Alexandre Mantovani; Andrade, Adnei Melges de ; Fonseca, Fernando Josepetti ; Dirani, Ely Antonio Tadeu ; Muccillo, Reginaldo ; Muccillo, Eliana Navarro dos Santos
Source: Journal of Materials Science: materials in electronics. Unidade: EP
Assunto: FILMES FINOS
A citação é gerada automaticamente e pode não estar totalmente de acordo com as normas
ABNT
NARDES, Alexandre Mantovani et al. Low-temperature PECVD deposition of highly conductive microcrystalline silicon thin films. Journal of Materials Science: materials in electronics, v. 14, n. 5-7, p. 407-411, 2003Tradução . . Acesso em: 04 out. 2024.
APA
Nardes, A. M., Andrade, A. M. de, Fonseca, F. J., Dirani, E. A. T., Muccillo, R., & Muccillo, E. N. dos S. (2003). Low-temperature PECVD deposition of highly conductive microcrystalline silicon thin films. Journal of Materials Science: materials in electronics, 14( 5-7), 407-411.
NLM
Nardes AM, Andrade AM de, Fonseca FJ, Dirani EAT, Muccillo R, Muccillo EN dos S. Low-temperature PECVD deposition of highly conductive microcrystalline silicon thin films. Journal of Materials Science: materials in electronics. 2003 ;14( 5-7): 407-411.[citado 2024 out. 04 ]
Vancouver
Nardes AM, Andrade AM de, Fonseca FJ, Dirani EAT, Muccillo R, Muccillo EN dos S. Low-temperature PECVD deposition of highly conductive microcrystalline silicon thin films. Journal of Materials Science: materials in electronics. 2003 ;14( 5-7): 407-411.[citado 2024 out. 04 ]
Artigo de periodico
An artificial taste sensor based on conducting polymers (2003)
Riul Junior, Antonio; Malmegrim, Roger R; Fonseca, Fernando Josepetti ; Mattoso, Luiz Henrique Capparelli
Source: Biosensors and Bioelectronics. Unidade: EP
Subjects: SENSORES BIOMÉDICOS, POLÍMEROS (MATERIAIS), FILMES FINOS
A citação é gerada automaticamente e pode não estar totalmente de acordo com as normas
ABNT
RIUL JUNIOR, Antonio et al. An artificial taste sensor based on conducting polymers. Biosensors and Bioelectronics, v. 18, n. 11, p. 1365-1369, 2003Tradução . . Disponível em: https://doi.org/10.1016/s0956-5663(03)00069-1. Acesso em: 04 out. 2024.
APA
Riul Junior, A., Malmegrim, R. R., Fonseca, F. J., & Mattoso, L. H. C. (2003). An artificial taste sensor based on conducting polymers. Biosensors and Bioelectronics, 18( 11), 1365-1369. doi:10.1016/s0956-5663(03)00069-1
NLM
Riul Junior A, Malmegrim RR, Fonseca FJ, Mattoso LHC. An artificial taste sensor based on conducting polymers [Internet]. Biosensors and Bioelectronics. 2003 ; 18( 11): 1365-1369.[citado 2024 out. 04 ] Available from: https://doi.org/10.1016/s0956-5663(03)00069-1
Vancouver
Riul Junior A, Malmegrim RR, Fonseca FJ, Mattoso LHC. An artificial taste sensor based on conducting polymers [Internet]. Biosensors and Bioelectronics. 2003 ; 18( 11): 1365-1369.[citado 2024 out. 04 ] Available from: https://doi.org/10.1016/s0956-5663(03)00069-1
Artigo de periodico
Extraction of the oxide charge density at front and back interfaces of SOI nMOSFETs devices (2002)
Nicolett, Aparecido Sirley; Martino, João Antonio ; Simoen, Eddy ; Claeys, Cor
Source: Solid-State Electronics. Unidade: EP
Assunto: FILMES FINOS
A citação é gerada automaticamente e pode não estar totalmente de acordo com as normas
ABNT
NICOLETT, Aparecido Sirley et al. Extraction of the oxide charge density at front and back interfaces of SOI nMOSFETs devices. Solid-State Electronics, n. 9, p. 1381-1387, 2002Tradução . . Disponível em: https://doi.org/10.1016/s0038-1101(02)00067-9. Acesso em: 04 out. 2024.
APA
Nicolett, A. S., Martino, J. A., Simoen, E., & Claeys, C. (2002). Extraction of the oxide charge density at front and back interfaces of SOI nMOSFETs devices. Solid-State Electronics, ( 9), 1381-1387. doi:10.1016/s0038-1101(02)00067-9
NLM
Nicolett AS, Martino JA, Simoen E, Claeys C. Extraction of the oxide charge density at front and back interfaces of SOI nMOSFETs devices [Internet]. Solid-State Electronics. 2002 ;( 9): 1381-1387.[citado 2024 out. 04 ] Available from: https://doi.org/10.1016/s0038-1101(02)00067-9
Vancouver
Nicolett AS, Martino JA, Simoen E, Claeys C. Extraction of the oxide charge density at front and back interfaces of SOI nMOSFETs devices [Internet]. Solid-State Electronics. 2002 ;( 9): 1381-1387.[citado 2024 out. 04 ] Available from: https://doi.org/10.1016/s0038-1101(02)00067-9
Artigo de periodico
Electrical and structural characterization of DLC films deposited by magnetron sputtering (2001)
Massi, Marcos; Maciel, Homero Santiago; Otani, C.; Mansano, Ronaldo Domingues ; Verdonck, Patrick Bernard
Source: Journal of Materials Science: Materials in Electronics. Unidade: EP
Assunto: FILMES FINOS
A citação é gerada automaticamente e pode não estar totalmente de acordo com as normas
ABNT
MASSI, Marcos et al. Electrical and structural characterization of DLC films deposited by magnetron sputtering. Journal of Materials Science: Materials in Electronics, v. 12, p. 343-346, 2001Tradução . . Acesso em: 04 out. 2024.
APA
Massi, M., Maciel, H. S., Otani, C., Mansano, R. D., & Verdonck, P. B. (2001). Electrical and structural characterization of DLC films deposited by magnetron sputtering. Journal of Materials Science: Materials in Electronics, 12, 343-346.
NLM
Massi M, Maciel HS, Otani C, Mansano RD, Verdonck PB. Electrical and structural characterization of DLC films deposited by magnetron sputtering. Journal of Materials Science: Materials in Electronics. 2001 ; 12 343-346.[citado 2024 out. 04 ]
Vancouver
Massi M, Maciel HS, Otani C, Mansano RD, Verdonck PB. Electrical and structural characterization of DLC films deposited by magnetron sputtering. Journal of Materials Science: Materials in Electronics. 2001 ; 12 343-346.[citado 2024 out. 04 ]

USP Schools

ReP

Filtros

Authors

USP affiliated authors

Date published

Subjects

Source title

Indexado em