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Determination of fluorescence quantum efficiency in solutions by thermal lens measurements at several wavelengths: application to rhodamine 6G (2005)
Jacinto, C.; Lima, S. M.; Catunda, Tomaz
Source: Journal de Physique IV. Conference titles: International Conference on Photoacoustic and Photothermal Phenomena - ICPPP. Unidade: IFSC
Subjects: TEMPERATURA, LASER
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ABNT
JACINTO, C. e LIMA, S. M. e CATUNDA, Tomaz. Determination of fluorescence quantum efficiency in solutions by thermal lens measurements at several wavelengths: application to rhodamine 6G. Journal de Physique IV. Les Ulis Cedex A: E D P Sciences. . Acesso em: 14 fev. 2026. , 2005
APA
Jacinto, C., Lima, S. M., & Catunda, T. (2005). Determination of fluorescence quantum efficiency in solutions by thermal lens measurements at several wavelengths: application to rhodamine 6G. Journal de Physique IV. Les Ulis Cedex A: E D P Sciences.
NLM
Jacinto C, Lima SM, Catunda T. Determination of fluorescence quantum efficiency in solutions by thermal lens measurements at several wavelengths: application to rhodamine 6G. Journal de Physique IV. 2005 ; 125( Ju 2005): 225-227.[citado 2026 fev. 14 ]
Vancouver
Jacinto C, Lima SM, Catunda T. Determination of fluorescence quantum efficiency in solutions by thermal lens measurements at several wavelengths: application to rhodamine 6G. Journal de Physique IV. 2005 ; 125( Ju 2005): 225-227.[citado 2026 fev. 14 ]
Trabalho de evento-anais periodico
High-sensitivity absorption coefficients measurements using thermal lens spectrometry (2005)
Jacinto, C.; Catunda, Tomaz
Source: Journal de Physique IV. Conference titles: International Conference on Photoacoustic and Photothermal Phenomena - ICPPP. Unidade: IFSC
Subjects: LENTES, ESPECTROMETRIA, ESPECTROSCOPIA
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JACINTO, C. e CATUNDA, Tomaz. High-sensitivity absorption coefficients measurements using thermal lens spectrometry. Journal de Physique IV. Les Ulis Cedex A: E D P Sciences. . Acesso em: 14 fev. 2026. , 2005
APA
Jacinto, C., & Catunda, T. (2005). High-sensitivity absorption coefficients measurements using thermal lens spectrometry. Journal de Physique IV. Les Ulis Cedex A: E D P Sciences.
NLM
Jacinto C, Catunda T. High-sensitivity absorption coefficients measurements using thermal lens spectrometry. Journal de Physique IV. 2005 ; 125( Ju 2005): 229-232.[citado 2026 fev. 14 ]
Vancouver
Jacinto C, Catunda T. High-sensitivity absorption coefficients measurements using thermal lens spectrometry. Journal de Physique IV. 2005 ; 125( Ju 2005): 229-232.[citado 2026 fev. 14 ]
Artigo de periodico
Investigation of the critical behavior at lyotropic systems by collinear mirage technique (2005)
Honda, Bruno Silveira Lima; Mukai, H; Fernandes, P R G; Shibli, Suhaila Maluf
Source: Journal de Physique IV. Unidade: IF
Subjects: MUDANÇA DE FASE, CRISTAIS LÍQUIDOS
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ABNT
HONDA, Bruno Silveira Lima et al. Investigation of the critical behavior at lyotropic systems by collinear mirage technique. Journal de Physique IV, v. 125, p. 245-247, 2005Tradução . . Disponível em: https://doi.org/10.1051/jp4:2005125058. Acesso em: 14 fev. 2026.
APA
Honda, B. S. L., Mukai, H., Fernandes, P. R. G., & Shibli, S. M. (2005). Investigation of the critical behavior at lyotropic systems by collinear mirage technique. Journal de Physique IV, 125, 245-247. doi:10.1051/jp4:2005125058
NLM
Honda BSL, Mukai H, Fernandes PRG, Shibli SM. Investigation of the critical behavior at lyotropic systems by collinear mirage technique [Internet]. Journal de Physique IV. 2005 ; 125 245-247.[citado 2026 fev. 14 ] Available from: https://doi.org/10.1051/jp4:2005125058
Vancouver
Honda BSL, Mukai H, Fernandes PRG, Shibli SM. Investigation of the critical behavior at lyotropic systems by collinear mirage technique [Internet]. Journal de Physique IV. 2005 ; 125 245-247.[citado 2026 fev. 14 ] Available from: https://doi.org/10.1051/jp4:2005125058
Trabalho de evento-anais periodico
Fluorescence quantum efficiency in 'Nd IND.2''O IND.3'-doped aluminosilicate glasses by multiwavelength thermal lens method (2005)
Astrath, N. G. C.; Rohling, J. H.; Bento, A. C.; Baesso, Mauro Luciano; Jacinto, C.; Lima, Sandro Marcio; Nunes, Luiz Antônio de Oliveira ; Catunda, Tomaz
Source: Journal de Physique IV. Conference titles: International Conference on Photoacoustic and Photothermal Phenomena - ICPPP. Unidade: IFSC
Subjects: ESPECTROSCOPIA DA LUZ, ESPECTROSCOPIA ÓPTICA, LASER, VIDRO
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ABNT
ASTRATH, N. G. C. et al. Fluorescence quantum efficiency in 'Nd IND.2''O IND.3'-doped aluminosilicate glasses by multiwavelength thermal lens method. Journal de Physique IV. Les Ulis Cedex A: E D P Sciences. . Acesso em: 14 fev. 2026. , 2005
APA
Astrath, N. G. C., Rohling, J. H., Bento, A. C., Baesso, M. L., Jacinto, C., Lima, S. M., et al. (2005). Fluorescence quantum efficiency in 'Nd IND.2''O IND.3'-doped aluminosilicate glasses by multiwavelength thermal lens method. Journal de Physique IV. Les Ulis Cedex A: E D P Sciences.
NLM
Astrath NGC, Rohling JH, Bento AC, Baesso ML, Jacinto C, Lima SM, Nunes LA de O, Catunda T. Fluorescence quantum efficiency in 'Nd IND.2''O IND.3'-doped aluminosilicate glasses by multiwavelength thermal lens method. Journal de Physique IV. 2005 ; 125( Ju 2005): 185-187.[citado 2026 fev. 14 ]
Vancouver
Astrath NGC, Rohling JH, Bento AC, Baesso ML, Jacinto C, Lima SM, Nunes LA de O, Catunda T. Fluorescence quantum efficiency in 'Nd IND.2''O IND.3'-doped aluminosilicate glasses by multiwavelength thermal lens method. Journal de Physique IV. 2005 ; 125( Ju 2005): 185-187.[citado 2026 fev. 14 ]
Trabalho de evento-anais periodico
Influence of probe beam multi-reflection on thermal lens measurements: application to Nd:YAG rods (2005)
Nunes, A. R.; Rohling, J. H.; Medina, A. N.; Pereira, J. R. D.; Bento, A. C.; Baesso, Mauro Luciano; Nunes, Luiz Antônio de Oliveira ; Catunda, Tomaz
Source: Journal de Physique IV. Conference titles: International Conference on Photoacoustic and Photothermal Phenomena - ICPPP. Unidade: IFSC
Subjects: ESPECTROSCOPIA DA LUZ, LASER, ESPECTROSCOPIA ÓPTICA, TEMPERATURA
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NUNES, A. R. et al. Influence of probe beam multi-reflection on thermal lens measurements: application to Nd:YAG rods. Journal de Physique IV. Les Ulis Cedex A: E D P Sciences. . Acesso em: 14 fev. 2026. , 2005
APA
Nunes, A. R., Rohling, J. H., Medina, A. N., Pereira, J. R. D., Bento, A. C., Baesso, M. L., et al. (2005). Influence of probe beam multi-reflection on thermal lens measurements: application to Nd:YAG rods. Journal de Physique IV. Les Ulis Cedex A: E D P Sciences.
NLM
Nunes AR, Rohling JH, Medina AN, Pereira JRD, Bento AC, Baesso ML, Nunes LA de O, Catunda T. Influence of probe beam multi-reflection on thermal lens measurements: application to Nd:YAG rods. Journal de Physique IV. 2005 ; 125( Ju 2005): 189-191.[citado 2026 fev. 14 ]
Vancouver
Nunes AR, Rohling JH, Medina AN, Pereira JRD, Bento AC, Baesso ML, Nunes LA de O, Catunda T. Influence of probe beam multi-reflection on thermal lens measurements: application to Nd:YAG rods. Journal de Physique IV. 2005 ; 125( Ju 2005): 189-191.[citado 2026 fev. 14 ]
Trabalho de evento-anais periodico
Photoacoustic characterization of PC/PMMA blends doped with Eu'(acac)IND.3' (2005)
Dias, D. T.; Bonzanini, R.; Rubira, A. F.; Muniz, E. C.; Medina, A. N.; Baesso, Mauro Luciano; Nunes, Luiz Antônio de Oliveira ; Bento, A. C.
Source: Journal de Physique IV. Conference titles: International Conference on Photoacoustic and Photothermal Phenomena - ICPPP. Unidade: IFSC
Subjects: ESPECTROSCOPIA, LUMINESCÊNCIA
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ABNT
DIAS, D. T. et al. Photoacoustic characterization of PC/PMMA blends doped with Eu'(acac)IND.3'. Journal de Physique IV. Les Ulis Cedex A: E D P Sciences. . Acesso em: 14 fev. 2026. , 2005
APA
Dias, D. T., Bonzanini, R., Rubira, A. F., Muniz, E. C., Medina, A. N., Baesso, M. L., et al. (2005). Photoacoustic characterization of PC/PMMA blends doped with Eu'(acac)IND.3'. Journal de Physique IV. Les Ulis Cedex A: E D P Sciences.
NLM
Dias DT, Bonzanini R, Rubira AF, Muniz EC, Medina AN, Baesso ML, Nunes LA de O, Bento AC. Photoacoustic characterization of PC/PMMA blends doped with Eu'(acac)IND.3'. Journal de Physique IV. 2005 ; 125( Ju 2005): 387-390.[citado 2026 fev. 14 ]
Vancouver
Dias DT, Bonzanini R, Rubira AF, Muniz EC, Medina AN, Baesso ML, Nunes LA de O, Bento AC. Photoacoustic characterization of PC/PMMA blends doped with Eu'(acac)IND.3'. Journal de Physique IV. 2005 ; 125( Ju 2005): 387-390.[citado 2026 fev. 14 ]
Trabalho de evento-anais periodico
Spectroscopic study of ds/dT in commercial filter by using the thermal lens technique (2005)
Lima, Sandro Marcio; Catunda, Tomaz
Source: Journal de Physique IV. Conference titles: International Conference on Photoacoustic and Photothermal Phenomena - ICPPP. Unidade: IFSC
Subjects: ESPECTROMETRIA, LENTES, ESPECTROSCOPIA
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ABNT
LIMA, Sandro Marcio e CATUNDA, Tomaz. Spectroscopic study of ds/dT in commercial filter by using the thermal lens technique. Journal de Physique IV. Les Ulis Cedex A: E D P Sciences. . Acesso em: 14 fev. 2026. , 2005
APA
Lima, S. M., & Catunda, T. (2005). Spectroscopic study of ds/dT in commercial filter by using the thermal lens technique. Journal de Physique IV. Les Ulis Cedex A: E D P Sciences.
NLM
Lima SM, Catunda T. Spectroscopic study of ds/dT in commercial filter by using the thermal lens technique. Journal de Physique IV. 2005 ; 125( Ju 2005): 221-223.[citado 2026 fev. 14 ]
Vancouver
Lima SM, Catunda T. Spectroscopic study of ds/dT in commercial filter by using the thermal lens technique. Journal de Physique IV. 2005 ; 125( Ju 2005): 221-223.[citado 2026 fev. 14 ]
Trabalho de evento-anais periodico
Thermal lens determination of fluorescence quantum efficiency of 'ANTPOT.3 F IND.4' level of 'Tm IND.3+' ions in solids (2005)
Oliveira, S. L.; Lima, Sandro Márcio; Catunda, Tomaz ; Vargas, H.; Nunes, Luiz Antônio de Oliveira ; Rohling, J. H.; Bento, A. C.; Baesso, Mauro Luciano
Source: Journal de Physique IV. Conference titles: International Conference on Photoacoustic and Photothermal Phenomena - ICPPP. Unidade: IFSC
Subjects: ESPECTROSCOPIA DA LUZ, ESPECTROSCOPIA ÓPTICA, LASER
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ABNT
OLIVEIRA, S. L. et al. Thermal lens determination of fluorescence quantum efficiency of 'ANTPOT.3 F IND.4' level of 'Tm IND.3+' ions in solids. Journal de Physique IV. Les Ulis Cedex A: E D P Sciences. . Acesso em: 14 fev. 2026. , 2005
APA
Oliveira, S. L., Lima, S. M., Catunda, T., Vargas, H., Nunes, L. A. de O., Rohling, J. H., et al. (2005). Thermal lens determination of fluorescence quantum efficiency of 'ANTPOT.3 F IND.4' level of 'Tm IND.3+' ions in solids. Journal de Physique IV. Les Ulis Cedex A: E D P Sciences.
NLM
Oliveira SL, Lima SM, Catunda T, Vargas H, Nunes LA de O, Rohling JH, Bento AC, Baesso ML. Thermal lens determination of fluorescence quantum efficiency of 'ANTPOT.3 F IND.4' level of 'Tm IND.3+' ions in solids. Journal de Physique IV. 2005 ; 125( Ju 2005): 193-196.[citado 2026 fev. 14 ]
Vancouver
Oliveira SL, Lima SM, Catunda T, Vargas H, Nunes LA de O, Rohling JH, Bento AC, Baesso ML. Thermal lens determination of fluorescence quantum efficiency of 'ANTPOT.3 F IND.4' level of 'Tm IND.3+' ions in solids. Journal de Physique IV. 2005 ; 125( Ju 2005): 193-196.[citado 2026 fev. 14 ]
Trabalho de evento-anais periodico
Thermo-optical properties of iron-doped low silica calcium aluminosilicate glasses determined by photothermal methods (2005)
Miura, R. K.; Udo, P. T.; Rohling, J. H.; Falcão, E. A.; Medina, A. N.; Pereira, J. R. D.; Bento, A. C.; Baesso, M. L.; Oliveira, S. L.; Nunes, Luiz Antônio de Oliveira
Source: Journal de Physique IV. Conference titles: International Conference on Photoacoustic and Photothermal Phenomena - ICPPP. Unidade: IFSC
Subjects: ESPECTROSCOPIA, ESPECTROMETRIA, ESPECTROSCOPIA ÓPTICA, LASER, VIDRO
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ABNT
MIURA, R. K. et al. Thermo-optical properties of iron-doped low silica calcium aluminosilicate glasses determined by photothermal methods. Journal de Physique IV. Les Ulis Cedex A: E D P Sciences. . Acesso em: 14 fev. 2026. , 2005
APA
Miura, R. K., Udo, P. T., Rohling, J. H., Falcão, E. A., Medina, A. N., Pereira, J. R. D., et al. (2005). Thermo-optical properties of iron-doped low silica calcium aluminosilicate glasses determined by photothermal methods. Journal de Physique IV. Les Ulis Cedex A: E D P Sciences.
NLM
Miura RK, Udo PT, Rohling JH, Falcão EA, Medina AN, Pereira JRD, Bento AC, Baesso ML, Oliveira SL, Nunes LA de O. Thermo-optical properties of iron-doped low silica calcium aluminosilicate glasses determined by photothermal methods. Journal de Physique IV. 2005 ; 125( Ju 2005): 197-199.[citado 2026 fev. 14 ]
Vancouver
Miura RK, Udo PT, Rohling JH, Falcão EA, Medina AN, Pereira JRD, Bento AC, Baesso ML, Oliveira SL, Nunes LA de O. Thermo-optical properties of iron-doped low silica calcium aluminosilicate glasses determined by photothermal methods. Journal de Physique IV. 2005 ; 125( Ju 2005): 197-199.[citado 2026 fev. 14 ]
Trabalho de evento-anais periodico
Depth profile study of polyaniline films by photoacoustic spectroscopy (2005)
Albuquerque, J. E.; Balogh, Debora Terezia; Faria, Roberto Mendonça
Source: Journal de Physique IV. Conference titles: International Conference on Photoacoustic and Photothermal Phenomena - ICPPP. Unidade: IFSC
Subjects: ESPECTROSCOPIA, FILMES FINOS, POLÍMEROS (MATERIAIS)
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ABNT
ALBUQUERQUE, J. E. e BALOGH, Debora Terezia e FARIA, Roberto Mendonça. Depth profile study of polyaniline films by photoacoustic spectroscopy. Journal de Physique IV. Les Ulis Cedex A: E D P Sciences. . Acesso em: 14 fev. 2026. , 2005
APA
Albuquerque, J. E., Balogh, D. T., & Faria, R. M. (2005). Depth profile study of polyaniline films by photoacoustic spectroscopy. Journal de Physique IV. Les Ulis Cedex A: E D P Sciences.
NLM
Albuquerque JE, Balogh DT, Faria RM. Depth profile study of polyaniline films by photoacoustic spectroscopy. Journal de Physique IV. 2005 ; 125( Ju 2005): 63-65.[citado 2026 fev. 14 ]
Vancouver
Albuquerque JE, Balogh DT, Faria RM. Depth profile study of polyaniline films by photoacoustic spectroscopy. Journal de Physique IV. 2005 ; 125( Ju 2005): 63-65.[citado 2026 fev. 14 ]
Artigo de periodico
Heavy metals in six Brazilian watersheds: levels of contamination in the state of São Paulo (2003)
Tomazelli, Andréa Cristina; Martinelli, Luiz Antonio
Source: Journal de Physique IV. Conference titles: (12.. Unidade: CENA
Subjects: METAIS PESADOS, BACIA HIDROGRÁFICA, CONTAMINAÇÃO
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ABNT
TOMAZELLI, Andréa Cristina e MARTINELLI, Luiz Antonio. Heavy metals in six Brazilian watersheds: levels of contamination in the state of São Paulo. Journal de Physique IV, v. 107, p. 1305-1308, 2003Tradução . . Disponível em: https://doi.org/10.1051/jp4:20030540. Acesso em: 14 fev. 2026.
APA
Tomazelli, A. C., & Martinelli, L. A. (2003). Heavy metals in six Brazilian watersheds: levels of contamination in the state of São Paulo. Journal de Physique IV, 107, 1305-1308. doi:10.1051/jp4:20030540
NLM
Tomazelli AC, Martinelli LA. Heavy metals in six Brazilian watersheds: levels of contamination in the state of São Paulo [Internet]. Journal de Physique IV. 2003 ; 107 1305-1308.[citado 2026 fev. 14 ] Available from: https://doi.org/10.1051/jp4:20030540
Vancouver
Tomazelli AC, Martinelli LA. Heavy metals in six Brazilian watersheds: levels of contamination in the state of São Paulo [Internet]. Journal de Physique IV. 2003 ; 107 1305-1308.[citado 2026 fev. 14 ] Available from: https://doi.org/10.1051/jp4:20030540
Artigo de periodico
Heavy metals in South America aerosol during 20th century from Illimani ice-core, Eastern Bolivian Andes (2003)
Correia, Alexandre Lima ; Delmas, R. J.; Freydier, Remi ; Simões, J; Taupin, Jean-Denis ; Dupré, B; Artaxo Netto, Paulo Eduardo
Source: Journal de Physique IV. Unidade: IF
Subjects: FÍSICA, AEROSSOL, POLUIÇÃO, POLUIÇÃO AMBIENTAL, POLUIÇÃO ATMOSFÉRICA
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ABNT
CORREIA, Alexandre Lima et al. Heavy metals in South America aerosol during 20th century from Illimani ice-core, Eastern Bolivian Andes. Journal de Physique IV, 2003Tradução . . Disponível em: https://doi.org/10.1051/jp4:20030309. Acesso em: 14 fev. 2026.
APA
Correia, A. L., Delmas, R. J., Freydier, R., Simões, J., Taupin, J. -D., Dupré, B., & Artaxo Netto, P. E. (2003). Heavy metals in South America aerosol during 20th century from Illimani ice-core, Eastern Bolivian Andes. Journal de Physique IV. doi:10.1051/jp4:20030309
NLM
Correia AL, Delmas RJ, Freydier R, Simões J, Taupin J-D, Dupré B, Artaxo Netto PE. Heavy metals in South America aerosol during 20th century from Illimani ice-core, Eastern Bolivian Andes [Internet]. Journal de Physique IV. 2003 ;[citado 2026 fev. 14 ] Available from: https://doi.org/10.1051/jp4:20030309
Vancouver
Correia AL, Delmas RJ, Freydier R, Simões J, Taupin J-D, Dupré B, Artaxo Netto PE. Heavy metals in South America aerosol during 20th century from Illimani ice-core, Eastern Bolivian Andes [Internet]. Journal de Physique IV. 2003 ;[citado 2026 fev. 14 ] Available from: https://doi.org/10.1051/jp4:20030309
Artigo de periodico
Low temperature operation of 0.13 µm partially-depleted SOI nMOSFETs with floating body (2002)
Pavanello, Marcelo Antonio ; Martino, João Antonio ; Mercha, A.; Rafi, J.M.; Simoen, Eddy ; Claeys, Cor ; Van Meer, H.; De Meyer, K.
Source: Journal de Physique IV. Unidade: EP
Assunto: CIRCUITOS INTEGRADOS MOS
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ABNT
PAVANELLO, Marcelo Antonio et al. Low temperature operation of 0.13 µm partially-depleted SOI nMOSFETs with floating body. Journal de Physique IV, v. 12, n. 3, 2002Tradução . . Acesso em: 14 fev. 2026.
APA
Pavanello, M. A., Martino, J. A., Mercha, A., Rafi, J. M., Simoen, E., Claeys, C., et al. (2002). Low temperature operation of 0.13 µm partially-depleted SOI nMOSFETs with floating body. Journal de Physique IV, 12( 3).
NLM
Pavanello MA, Martino JA, Mercha A, Rafi JM, Simoen E, Claeys C, Van Meer H, De Meyer K. Low temperature operation of 0.13 µm partially-depleted SOI nMOSFETs with floating body. Journal de Physique IV. 2002 ;12( 3):[citado 2026 fev. 14 ]
Vancouver
Pavanello MA, Martino JA, Mercha A, Rafi JM, Simoen E, Claeys C, Van Meer H, De Meyer K. Low temperature operation of 0.13 µm partially-depleted SOI nMOSFETs with floating body. Journal de Physique IV. 2002 ;12( 3):[citado 2026 fev. 14 ]
Artigo de periodico
Low temperature operation of graded-channel SOI nMOSFETs for analog applications (2002)
Pavanello, Marcelo Antonio ; Agopian, Paula Ghedini Der ; Martino, João Antonio ; Flandre, Denis
Source: Journal de Physique IV. Unidade: EP
Assunto: CIRCUITOS INTEGRADOS MOS
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ABNT
PAVANELLO, Marcelo Antonio et al. Low temperature operation of graded-channel SOI nMOSFETs for analog applications. Journal de Physique IV, v. 12, n. 3, 2002Tradução . . Disponível em: https://doi.org/10.1051/jp420020030. Acesso em: 14 fev. 2026.
APA
Pavanello, M. A., Agopian, P. G. D., Martino, J. A., & Flandre, D. (2002). Low temperature operation of graded-channel SOI nMOSFETs for analog applications. Journal de Physique IV, 12( 3). doi:10.1051/jp420020030
NLM
Pavanello MA, Agopian PGD, Martino JA, Flandre D. Low temperature operation of graded-channel SOI nMOSFETs for analog applications [Internet]. Journal de Physique IV. 2002 ;12( 3):[citado 2026 fev. 14 ] Available from: https://doi.org/10.1051/jp420020030
Vancouver
Pavanello MA, Agopian PGD, Martino JA, Flandre D. Low temperature operation of graded-channel SOI nMOSFETs for analog applications [Internet]. Journal de Physique IV. 2002 ;12( 3):[citado 2026 fev. 14 ] Available from: https://doi.org/10.1051/jp420020030
Artigo de periodico
Back gate voltage and buried-oxide thickness influences on the series resistance of fully depleted SOI MOSFETs at 77 K (1998)
Nicolett, Aparecido Sirley; Martino, João Antonio ; Simoen, Eddy ; Claeys, Cor
Source: Journal de Physique IV. Unidade: EP
Assunto: ENERGIA ELÉTRICA
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ABNT
NICOLETT, Aparecido Sirley et al. Back gate voltage and buried-oxide thickness influences on the series resistance of fully depleted SOI MOSFETs at 77 K. Journal de Physique IV, v. 8, p. 25-28, 1998Tradução . . Disponível em: https://doi.org/10.1051/jp4:1998306. Acesso em: 14 fev. 2026.
APA
Nicolett, A. S., Martino, J. A., Simoen, E., & Claeys, C. (1998). Back gate voltage and buried-oxide thickness influences on the series resistance of fully depleted SOI MOSFETs at 77 K. Journal de Physique IV, 8, 25-28. doi:10.1051/jp4:1998306
NLM
Nicolett AS, Martino JA, Simoen E, Claeys C. Back gate voltage and buried-oxide thickness influences on the series resistance of fully depleted SOI MOSFETs at 77 K [Internet]. Journal de Physique IV. 1998 ;8 25-28.[citado 2026 fev. 14 ] Available from: https://doi.org/10.1051/jp4:1998306
Vancouver
Nicolett AS, Martino JA, Simoen E, Claeys C. Back gate voltage and buried-oxide thickness influences on the series resistance of fully depleted SOI MOSFETs at 77 K [Internet]. Journal de Physique IV. 1998 ;8 25-28.[citado 2026 fev. 14 ] Available from: https://doi.org/10.1051/jp4:1998306
Artigo de periodico
A new method to extract the effective trap density at the buried oxide/underlying substrate interface in enhancement-mode SOI MOSFETs at low temperatures (1998)
Pavanello, Marcelo Antonio ; Martino, João Antonio
Source: Journal de Physique IV. Unidade: EP
Subjects: EQUIPAMENTOS ELÉTRICOS, MÁQUINAS ELÉTRICAS
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ABNT
PAVANELLO, Marcelo Antonio e MARTINO, João Antonio. A new method to extract the effective trap density at the buried oxide/underlying substrate interface in enhancement-mode SOI MOSFETs at low temperatures. Journal de Physique IV, v. 8, p. 45-48, 1998Tradução . . Disponível em: https://doi.org/10.1051/jp4:1998311. Acesso em: 14 fev. 2026.
APA
Pavanello, M. A., & Martino, J. A. (1998). A new method to extract the effective trap density at the buried oxide/underlying substrate interface in enhancement-mode SOI MOSFETs at low temperatures. Journal de Physique IV, 8, 45-48. doi:10.1051/jp4:1998311
NLM
Pavanello MA, Martino JA. A new method to extract the effective trap density at the buried oxide/underlying substrate interface in enhancement-mode SOI MOSFETs at low temperatures [Internet]. Journal de Physique IV. 1998 ;8 45-48.[citado 2026 fev. 14 ] Available from: https://doi.org/10.1051/jp4:1998311
Vancouver
Pavanello MA, Martino JA. A new method to extract the effective trap density at the buried oxide/underlying substrate interface in enhancement-mode SOI MOSFETs at low temperatures [Internet]. Journal de Physique IV. 1998 ;8 45-48.[citado 2026 fev. 14 ] Available from: https://doi.org/10.1051/jp4:1998311
Artigo de periodico
Analysis of the substrate effect on enhancement-mode SOI nMOSFET effective channel length and series resistance extraction at 77 K (1998)
Pavanello, Marcelo Antonio ; Nicolett, Aparecido Sirley; Martino, João Antonio
Source: Journal de Physique IV. Unidade: EP
Assunto: ENERGIA ELÉTRICA
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ABNT
PAVANELLO, Marcelo Antonio e NICOLETT, Aparecido Sirley e MARTINO, João Antonio. Analysis of the substrate effect on enhancement-mode SOI nMOSFET effective channel length and series resistance extraction at 77 K. Journal de Physique IV, v. 8, p. 49-52, 1998Tradução . . Disponível em: https://doi.org/10.1051/jp4:1998312. Acesso em: 14 fev. 2026.
APA
Pavanello, M. A., Nicolett, A. S., & Martino, J. A. (1998). Analysis of the substrate effect on enhancement-mode SOI nMOSFET effective channel length and series resistance extraction at 77 K. Journal de Physique IV, 8, 49-52. doi:10.1051/jp4:1998312
NLM
Pavanello MA, Nicolett AS, Martino JA. Analysis of the substrate effect on enhancement-mode SOI nMOSFET effective channel length and series resistance extraction at 77 K [Internet]. Journal de Physique IV. 1998 ;8 49-52.[citado 2026 fev. 14 ] Available from: https://doi.org/10.1051/jp4:1998312
Vancouver
Pavanello MA, Nicolett AS, Martino JA. Analysis of the substrate effect on enhancement-mode SOI nMOSFET effective channel length and series resistance extraction at 77 K [Internet]. Journal de Physique IV. 1998 ;8 49-52.[citado 2026 fev. 14 ] Available from: https://doi.org/10.1051/jp4:1998312
Artigo de periodico
Xafs Study of 'Cdte ind. 1-x''S ind. x' Semiconductor Glass Composites (1997)
Martins Alves, M C; Alves, O L; Barbosa, L C; Craievich, Aldo Felix ; Ramos, A; Traverse , A
Source: Journal de Physique IV. Unidade: IF
Assunto: SEMICONDUTORES
A citação é gerada automaticamente e pode não estar totalmente de acordo com as normas
ABNT
MARTINS ALVES, M C et al. Xafs Study of 'Cdte ind. 1-x''S ind. x' Semiconductor Glass Composites. Journal de Physique IV, v. 7, p. C2-1251-1252, 1997Tradução . . Acesso em: 14 fev. 2026.
APA
Martins Alves, M. C., Alves, O. L., Barbosa, L. C., Craievich, A. F., Ramos, A., & Traverse , A. (1997). Xafs Study of 'Cdte ind. 1-x''S ind. x' Semiconductor Glass Composites. Journal de Physique IV, 7, C2-1251-1252.
NLM
Martins Alves MC, Alves OL, Barbosa LC, Craievich AF, Ramos A, Traverse A. Xafs Study of 'Cdte ind. 1-x''S ind. x' Semiconductor Glass Composites. Journal de Physique IV. 1997 ; 7 C2-1251-1252.[citado 2026 fev. 14 ]
Vancouver
Martins Alves MC, Alves OL, Barbosa LC, Craievich AF, Ramos A, Traverse A. Xafs Study of 'Cdte ind. 1-x''S ind. x' Semiconductor Glass Composites. Journal de Physique IV. 1997 ; 7 C2-1251-1252.[citado 2026 fev. 14 ]

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