Filtros : "DIFRAÇÃO POR RAIOS X" "Dinamarca" Removidos: "BUENO, SONIA MARIA VILLELA" " IFSC222" "1920" "Abes/Andis/Aidis" "Universidade Federal de Santa Catarina (UFSC)" "Universidade Ibirapuera - UNIB" "FFLCH-FLC" "ICB-BMH" " IFSC011" Limpar

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  • Source: Journal of Applied Crystallography. Unidade: IF

    Subjects: DIFRAÇÃO POR RAIOS X, RADIAÇÃO SINCROTRON

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      MORELHAO, Sergio Luiz et al. X-ray dynamical diffraction in amino acid crystals: a step towards improving structural resolution of biological molecules via physical phase measurements. Journal of Applied Crystallography, v. 50, n. 3, p. 689-700, 2017Tradução . . Disponível em: https://doi.org/10.1107/S1600576717004757. Acesso em: 15 jul. 2024.
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      Morelhao, S. L., Remédios, C. M. R., Calligaris, G. A., & Nisbet, G. (2017). X-ray dynamical diffraction in amino acid crystals: a step towards improving structural resolution of biological molecules via physical phase measurements. Journal of Applied Crystallography, 50( 3), 689-700. doi:10.1107/S1600576717004757
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      Morelhao SL, Remédios CMR, Calligaris GA, Nisbet G. X-ray dynamical diffraction in amino acid crystals: a step towards improving structural resolution of biological molecules via physical phase measurements [Internet]. Journal of Applied Crystallography. 2017 ; 50( 3): 689-700.[citado 2024 jul. 15 ] Available from: https://doi.org/10.1107/S1600576717004757
    • Vancouver

      Morelhao SL, Remédios CMR, Calligaris GA, Nisbet G. X-ray dynamical diffraction in amino acid crystals: a step towards improving structural resolution of biological molecules via physical phase measurements [Internet]. Journal of Applied Crystallography. 2017 ; 50( 3): 689-700.[citado 2024 jul. 15 ] Available from: https://doi.org/10.1107/S1600576717004757
  • Source: Journal of Applied Crystallography. Unidade: IF

    Subjects: DIFRAÇÃO POR RAIOS X, MATERIAIS NANOESTRUTURADOS

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      MORELHAO, Sergio Luiz et al. Nanoscale characterization of bismuth telluride epitaxial layers by advanced X-ray analysis. Journal of Applied Crystallography, v. 50, n. 2, p. 399-410, 2017Tradução . . Disponível em: https://doi.org/10.1107/S1600576717000760. Acesso em: 15 jul. 2024.
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      Morelhao, S. L., Fornari, C. I., Rappl, P. H. de O., & Abramof, E. (2017). Nanoscale characterization of bismuth telluride epitaxial layers by advanced X-ray analysis. Journal of Applied Crystallography, 50( 2), 399-410. doi:10.1107/S1600576717000760
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      Morelhao SL, Fornari CI, Rappl PH de O, Abramof E. Nanoscale characterization of bismuth telluride epitaxial layers by advanced X-ray analysis [Internet]. Journal of Applied Crystallography. 2017 ; 50( 2): 399-410.[citado 2024 jul. 15 ] Available from: https://doi.org/10.1107/S1600576717000760
    • Vancouver

      Morelhao SL, Fornari CI, Rappl PH de O, Abramof E. Nanoscale characterization of bismuth telluride epitaxial layers by advanced X-ray analysis [Internet]. Journal of Applied Crystallography. 2017 ; 50( 2): 399-410.[citado 2024 jul. 15 ] Available from: https://doi.org/10.1107/S1600576717000760
  • Source: Acta Crystallographica Section F. Unidade: FCFRP

    Subjects: DIFRAÇÃO POR RAIOS X, FOSFOLIPASES A, VENENOS DE ORIGEM ANIMAL

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      SALVADOR, G. H. M. et al. Crystallization and preliminary X-ray diffraction analysis of crotoxin B from crotalus durissus collilineatus venon. Acta Crystallographica Section F, v. 65, n. 10, p. 1011-1013, 2009Tradução . . Disponível em: https://doi.org/10.1107/s1744309109032631. Acesso em: 15 jul. 2024.
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      Salvador, G. H. M., Fernandes, C. A. H., Correa, L. C., Santos Filho, N. A., Soares, A. M., & Fontes, M. R. M. (2009). Crystallization and preliminary X-ray diffraction analysis of crotoxin B from crotalus durissus collilineatus venon. Acta Crystallographica Section F, 65( 10), 1011-1013. doi:10.1107/s1744309109032631
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      Salvador GHM, Fernandes CAH, Correa LC, Santos Filho NA, Soares AM, Fontes MRM. Crystallization and preliminary X-ray diffraction analysis of crotoxin B from crotalus durissus collilineatus venon [Internet]. Acta Crystallographica Section F. 2009 ; 65( 10): 1011-1013.[citado 2024 jul. 15 ] Available from: https://doi.org/10.1107/s1744309109032631
    • Vancouver

      Salvador GHM, Fernandes CAH, Correa LC, Santos Filho NA, Soares AM, Fontes MRM. Crystallization and preliminary X-ray diffraction analysis of crotoxin B from crotalus durissus collilineatus venon [Internet]. Acta Crystallographica Section F. 2009 ; 65( 10): 1011-1013.[citado 2024 jul. 15 ] Available from: https://doi.org/10.1107/s1744309109032631
  • Source: Acta Crystallographica A. Conference titles: Congress and General Assembly of the International Union of Crystallography - IUCr. Unidade: IFSC

    Subjects: POLIMORFISMO, ARTRITE REUMATOIDE, CRISTALOGRAFIA FÍSICA, DIFRAÇÃO POR RAIOS X

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      FERNÁNDEZ, Daniel e VEGA, Daniel e ELLENA, Javier. Factors determining polymorphhism of leflunomide. Acta Crystallographica A. Copenhagen: Blackwell Munksgaard. Disponível em: https://doi.org/10.1107/S0108767305085399. Acesso em: 15 jul. 2024. , 2005
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      Fernández, D., Vega, D., & Ellena, J. (2005). Factors determining polymorphhism of leflunomide. Acta Crystallographica A. Copenhagen: Blackwell Munksgaard. doi:10.1107/S0108767305085399
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      Fernández D, Vega D, Ellena J. Factors determining polymorphhism of leflunomide [Internet]. Acta Crystallographica A. 2005 ; 61 C343.[citado 2024 jul. 15 ] Available from: https://doi.org/10.1107/S0108767305085399
    • Vancouver

      Fernández D, Vega D, Ellena J. Factors determining polymorphhism of leflunomide [Internet]. Acta Crystallographica A. 2005 ; 61 C343.[citado 2024 jul. 15 ] Available from: https://doi.org/10.1107/S0108767305085399
  • Source: Acta Crystallographica A. Conference titles: Congress and General Assembly of the International Union of Crystallography - IUCr. Unidade: IFSC

    Subjects: COBRE, DIFRAÇÃO POR RAIOS X

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      RODRIGUES, Bernardo e ELLENA, Javier e CASTELLANO, Eduardo Ernesto. Experimental electron density of ['Cu(phen) IND.2'Cl](N'O IND.3')('H IND.2'O). Acta Crystallographica A. Copenhagen: Blackwell Munksgaard. Disponível em: https://doi.org/10.1107/S0108767305082085. Acesso em: 15 jul. 2024. , 2005
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      Rodrigues, B., Ellena, J., & Castellano, E. E. (2005). Experimental electron density of ['Cu(phen) IND.2'Cl](N'O IND.3')('H IND.2'O). Acta Crystallographica A. Copenhagen: Blackwell Munksgaard. doi:10.1107/S0108767305082085
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      Rodrigues B, Ellena J, Castellano EE. Experimental electron density of ['Cu(phen) IND.2'Cl](N'O IND.3')('H IND.2'O) [Internet]. Acta Crystallographica A. 2005 ; 61 C425.[citado 2024 jul. 15 ] Available from: https://doi.org/10.1107/S0108767305082085
    • Vancouver

      Rodrigues B, Ellena J, Castellano EE. Experimental electron density of ['Cu(phen) IND.2'Cl](N'O IND.3')('H IND.2'O) [Internet]. Acta Crystallographica A. 2005 ; 61 C425.[citado 2024 jul. 15 ] Available from: https://doi.org/10.1107/S0108767305082085
  • Source: Acta Crystallographica A. Conference titles: Congress and General Assembly of the International Union of Crystallography - IUCr. Unidade: IFSC

    Subjects: RESSONÂNCIA MAGNÉTICA NUCLEAR, DIFRAÇÃO POR RAIOS X, CRISTALOGRAFIA

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      PIMENTA JUNIOR, Alécio A. et al. Structure by 2D NMR and X-ray crystalography of a triterpene from M. imbricante. Acta Crystallographica A. Copenhagen: Blackwell Munksgaard. Disponível em: https://doi.org/10.1107/S0108767305087593. Acesso em: 15 jul. 2024. , 2005
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      Pimenta Junior, A. A., Ellena, J., Dorigueto, A. C., Silva, S. R. de S. e, Silva, G. D. de F., & Barbosa, L. C. de A. (2005). Structure by 2D NMR and X-ray crystalography of a triterpene from M. imbricante. Acta Crystallographica A. Copenhagen: Blackwell Munksgaard. doi:10.1107/S0108767305087593
    • NLM

      Pimenta Junior AA, Ellena J, Dorigueto AC, Silva SR de S e, Silva GD de F, Barbosa LC de A. Structure by 2D NMR and X-ray crystalography of a triterpene from M. imbricante [Internet]. Acta Crystallographica A. 2005 ; 61 C291.[citado 2024 jul. 15 ] Available from: https://doi.org/10.1107/S0108767305087593
    • Vancouver

      Pimenta Junior AA, Ellena J, Dorigueto AC, Silva SR de S e, Silva GD de F, Barbosa LC de A. Structure by 2D NMR and X-ray crystalography of a triterpene from M. imbricante [Internet]. Acta Crystallographica A. 2005 ; 61 C291.[citado 2024 jul. 15 ] Available from: https://doi.org/10.1107/S0108767305087593
  • Source: Journal of Applied Crystallography. Unidade: IF

    Subjects: CRISTALOGRAFIA, DIFRAÇÃO POR RAIOS X

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      CHIAVACCI, L A et al. Small-angle X-ray scattering and X-ray absortpion near-edge structure study of iron-doped siloxane-polyoxyethylene nanocomposites. Journal of Applied Crystallography, 2003Tradução . . Disponível em: https://doi.org/10.1107/s0021889803000517. Acesso em: 15 jul. 2024.
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      Chiavacci, L. A., Dahmouche, K., Briois, V., Santilli, C. V., Zea Bermudez, V. de, Carlos, L. D., et al. (2003). Small-angle X-ray scattering and X-ray absortpion near-edge structure study of iron-doped siloxane-polyoxyethylene nanocomposites. Journal of Applied Crystallography. doi:10.1107/s0021889803000517
    • NLM

      Chiavacci LA, Dahmouche K, Briois V, Santilli CV, Zea Bermudez V de, Carlos LD, Jolivet JP, Pulcinelli SH, Craievich AF. Small-angle X-ray scattering and X-ray absortpion near-edge structure study of iron-doped siloxane-polyoxyethylene nanocomposites [Internet]. Journal of Applied Crystallography. 2003 ;[citado 2024 jul. 15 ] Available from: https://doi.org/10.1107/s0021889803000517
    • Vancouver

      Chiavacci LA, Dahmouche K, Briois V, Santilli CV, Zea Bermudez V de, Carlos LD, Jolivet JP, Pulcinelli SH, Craievich AF. Small-angle X-ray scattering and X-ray absortpion near-edge structure study of iron-doped siloxane-polyoxyethylene nanocomposites [Internet]. Journal of Applied Crystallography. 2003 ;[citado 2024 jul. 15 ] Available from: https://doi.org/10.1107/s0021889803000517
  • Source: Journal of Synchrotron Radiation. Unidade: IF

    Subjects: DIFRAÇÃO POR RAIOS X, CRISTALOGRAFIA

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      MORELHÃO, Sérgio Luiz. An x-ray diffractometer for accurate structural invariant phase determination. Journal of Synchrotron Radiation, v. 10, p. 236-241, 2003Tradução . . Disponível em: https://doi.org/10.1107/s0909049503003789. Acesso em: 15 jul. 2024.
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      Morelhão, S. L. (2003). An x-ray diffractometer for accurate structural invariant phase determination. Journal of Synchrotron Radiation, 10, 236-241. doi:10.1107/s0909049503003789
    • NLM

      Morelhão SL. An x-ray diffractometer for accurate structural invariant phase determination [Internet]. Journal of Synchrotron Radiation. 2003 ; 10 236-241.[citado 2024 jul. 15 ] Available from: https://doi.org/10.1107/s0909049503003789
    • Vancouver

      Morelhão SL. An x-ray diffractometer for accurate structural invariant phase determination [Internet]. Journal of Synchrotron Radiation. 2003 ; 10 236-241.[citado 2024 jul. 15 ] Available from: https://doi.org/10.1107/s0909049503003789
  • Source: Journal of Applied Crystallography. Unidade: IF

    Subjects: DIFRAÇÃO POR RAIOS X, POLÍMEROS (MATERIAIS)

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      CHAKER, Juliano Alexandre et al. Gelation and drying of weakly bonded silica-PPO nanocomposites. Journal of Applied Crystallography, 2003Tradução . . Disponível em: https://doi.org/10.1107/s0021889803005089. Acesso em: 15 jul. 2024.
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      Chaker, J. A., Dahmouche, K., Santilli, V., Pulcinelli, S. H., & Craievich, A. F. (2003). Gelation and drying of weakly bonded silica-PPO nanocomposites. Journal of Applied Crystallography. doi:10.1107/s0021889803005089
    • NLM

      Chaker JA, Dahmouche K, Santilli V, Pulcinelli SH, Craievich AF. Gelation and drying of weakly bonded silica-PPO nanocomposites [Internet]. Journal of Applied Crystallography. 2003 ;[citado 2024 jul. 15 ] Available from: https://doi.org/10.1107/s0021889803005089
    • Vancouver

      Chaker JA, Dahmouche K, Santilli V, Pulcinelli SH, Craievich AF. Gelation and drying of weakly bonded silica-PPO nanocomposites [Internet]. Journal of Applied Crystallography. 2003 ;[citado 2024 jul. 15 ] Available from: https://doi.org/10.1107/s0021889803005089
  • Source: Journal of Applied Crystallography. Unidade: IF

    Subjects: CRISTALOGRAFIA, DIFRAÇÃO POR RAIOS X, COMPOSTOS ALICÍCLICOS

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      SARMENTO, V H V et al. Small-angle X-ray and nuclear-magnetic resonance study of siloxane-PMMA hybrids prepared by the sol-gel process. Journal of Applied Crystallography, 2003Tradução . . Disponível em: https://doi.org/10.1107/s0021889803000384. Acesso em: 15 jul. 2024.
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      Sarmento, V. H. V., Dahmouche, K., Santilli, C. V., Pulcinelli, S. H., & Craievich, A. F. (2003). Small-angle X-ray and nuclear-magnetic resonance study of siloxane-PMMA hybrids prepared by the sol-gel process. Journal of Applied Crystallography. doi:10.1107/s0021889803000384
    • NLM

      Sarmento VHV, Dahmouche K, Santilli CV, Pulcinelli SH, Craievich AF. Small-angle X-ray and nuclear-magnetic resonance study of siloxane-PMMA hybrids prepared by the sol-gel process [Internet]. Journal of Applied Crystallography. 2003 ;[citado 2024 jul. 15 ] Available from: https://doi.org/10.1107/s0021889803000384
    • Vancouver

      Sarmento VHV, Dahmouche K, Santilli CV, Pulcinelli SH, Craievich AF. Small-angle X-ray and nuclear-magnetic resonance study of siloxane-PMMA hybrids prepared by the sol-gel process [Internet]. Journal of Applied Crystallography. 2003 ;[citado 2024 jul. 15 ] Available from: https://doi.org/10.1107/s0021889803000384
  • Source: Journal of Synchroton Radiation. Unidade: IF

    Subjects: CRISTALOGRAFIA FÍSICA, DIFRAÇÃO POR RAIOS X

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      MORELHAO, Sergio Luiz e MORELHÃO, Sérgio Luiz. An x-ray diffractometer for accurate structural invariant phase determination. Journal of Synchroton Radiation, v. 10 pt. 3, p. 236-241, 2003Tradução . . Disponível em: http://journals.iucr.org/s/issues/2003/03/00/he0303/he0303.pdf. Acesso em: 15 jul. 2024.
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      Morelhao, S. L., & Morelhão, S. L. (2003). An x-ray diffractometer for accurate structural invariant phase determination. Journal of Synchroton Radiation, 10 pt. 3, 236-241. Recuperado de http://journals.iucr.org/s/issues/2003/03/00/he0303/he0303.pdf
    • NLM

      Morelhao SL, Morelhão SL. An x-ray diffractometer for accurate structural invariant phase determination [Internet]. Journal of Synchroton Radiation. 2003 ; 10 pt. 3 236-241.[citado 2024 jul. 15 ] Available from: http://journals.iucr.org/s/issues/2003/03/00/he0303/he0303.pdf
    • Vancouver

      Morelhao SL, Morelhão SL. An x-ray diffractometer for accurate structural invariant phase determination [Internet]. Journal of Synchroton Radiation. 2003 ; 10 pt. 3 236-241.[citado 2024 jul. 15 ] Available from: http://journals.iucr.org/s/issues/2003/03/00/he0303/he0303.pdf
  • Source: Journal of Applied Crystallography. Unidade: IF

    Subjects: CRISTALOGRAFIA, DIFRAÇÃO POR RAIOS X

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      KANEKO, E Y et al. Characterization of the porosity developed in a new titania-alumina catalyst support prepared by the sol gel route. Journal of Applied Crystallography, 2003Tradução . . Disponível em: https://doi.org/10.1107/s0021889803003819. Acesso em: 15 jul. 2024.
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      Kaneko, E. Y., Pulcinelli, S. H., Santilli, C. V., Craievich, A. F., & Chiaro, S. S. X. (2003). Characterization of the porosity developed in a new titania-alumina catalyst support prepared by the sol gel route. Journal of Applied Crystallography. doi:10.1107/s0021889803003819
    • NLM

      Kaneko EY, Pulcinelli SH, Santilli CV, Craievich AF, Chiaro SSX. Characterization of the porosity developed in a new titania-alumina catalyst support prepared by the sol gel route [Internet]. Journal of Applied Crystallography. 2003 ;[citado 2024 jul. 15 ] Available from: https://doi.org/10.1107/s0021889803003819
    • Vancouver

      Kaneko EY, Pulcinelli SH, Santilli CV, Craievich AF, Chiaro SSX. Characterization of the porosity developed in a new titania-alumina catalyst support prepared by the sol gel route [Internet]. Journal of Applied Crystallography. 2003 ;[citado 2024 jul. 15 ] Available from: https://doi.org/10.1107/s0021889803003819
  • Source: Journal of Applied Crystalography. Unidade: IF

    Subjects: DIFRAÇÃO POR RAIOS X, NANOTECNOLOGIA, MATERIAIS MAGNÉTICOS, ESTRUTURA DA MATÉRIA (QUÍMICA TEÓRICA)

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      SILVA, N J O et al. Structure of magnetic poly(axyethylene)-siloxane nanohybrids doped with 'Fe POT. II' and 'Fe POT.III 1'. Journal of Applied Crystalography, 2003Tradução . . Disponível em: http://journals.iucr.org/j/issues/2003/04/00/issconts.html. Acesso em: 15 jul. 2024.
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      Silva, N. J. O., Dahmouche, K., Santilli, C. V., Amaral, V. S., Carlos, L. D., Zea Bermudez, V. de, & Craievich, A. F. (2003). Structure of magnetic poly(axyethylene)-siloxane nanohybrids doped with 'Fe POT. II' and 'Fe POT.III 1'. Journal of Applied Crystalography. Recuperado de http://journals.iucr.org/j/issues/2003/04/00/issconts.html
    • NLM

      Silva NJO, Dahmouche K, Santilli CV, Amaral VS, Carlos LD, Zea Bermudez V de, Craievich AF. Structure of magnetic poly(axyethylene)-siloxane nanohybrids doped with 'Fe POT. II' and 'Fe POT.III 1' [Internet]. Journal of Applied Crystalography. 2003 ;[citado 2024 jul. 15 ] Available from: http://journals.iucr.org/j/issues/2003/04/00/issconts.html
    • Vancouver

      Silva NJO, Dahmouche K, Santilli CV, Amaral VS, Carlos LD, Zea Bermudez V de, Craievich AF. Structure of magnetic poly(axyethylene)-siloxane nanohybrids doped with 'Fe POT. II' and 'Fe POT.III 1' [Internet]. Journal of Applied Crystalography. 2003 ;[citado 2024 jul. 15 ] Available from: http://journals.iucr.org/j/issues/2003/04/00/issconts.html
  • Source: Journal of Applied Crystallography. Unidade: IF

    Subjects: DIFRAÇÃO POR RAIOS X, CRISTALOGRAFIA FÍSICA

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      MORELHÃO, Sérgio Luiz et al. Two-dimensional intensity profiles of effective satellites. Journal of Applied Crystallography, v. 35, p. 69-74, 2002Tradução . . Disponível em: https://doi.org/10.1107/s0021889801018921. Acesso em: 15 jul. 2024.
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      Morelhão, S. L., Avanci, L. H., Quivy, A. A., & Abramog, E. (2002). Two-dimensional intensity profiles of effective satellites. Journal of Applied Crystallography, 35, 69-74. doi:10.1107/s0021889801018921
    • NLM

      Morelhão SL, Avanci LH, Quivy AA, Abramog E. Two-dimensional intensity profiles of effective satellites [Internet]. Journal of Applied Crystallography. 2002 ; 35 69-74.[citado 2024 jul. 15 ] Available from: https://doi.org/10.1107/s0021889801018921
    • Vancouver

      Morelhão SL, Avanci LH, Quivy AA, Abramog E. Two-dimensional intensity profiles of effective satellites [Internet]. Journal of Applied Crystallography. 2002 ; 35 69-74.[citado 2024 jul. 15 ] Available from: https://doi.org/10.1107/s0021889801018921
  • Source: Acta Crystallographica Section A. Unidade: IF

    Subjects: SEMICONDUTORES, DIFRAÇÃO POR RAIOS X, ÓPTICA ELETRÔNICA

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      MORELHÃO, Sérgio Luiz e AVANCI, L H. Strength tuning of multiple waves in crystals. Acta Crystallographica Section A, v. 57, p. 192-196, 2001Tradução . . Disponível em: https://doi.org/10.1107/s0108767300015774. Acesso em: 15 jul. 2024.
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      Morelhão, S. L., & Avanci, L. H. (2001). Strength tuning of multiple waves in crystals. Acta Crystallographica Section A, 57, 192-196. doi:10.1107/s0108767300015774
    • NLM

      Morelhão SL, Avanci LH. Strength tuning of multiple waves in crystals [Internet]. Acta Crystallographica Section A. 2001 ; 57 192-196.[citado 2024 jul. 15 ] Available from: https://doi.org/10.1107/s0108767300015774
    • Vancouver

      Morelhão SL, Avanci LH. Strength tuning of multiple waves in crystals [Internet]. Acta Crystallographica Section A. 2001 ; 57 192-196.[citado 2024 jul. 15 ] Available from: https://doi.org/10.1107/s0108767300015774
  • Source: Journal of Applied Crystallography. Unidade: IF

    Assunto: DIFRAÇÃO POR RAIOS X

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      AMARAL, L Q. Characterization of nematic lyomesophases by x-ray diffraction. Journal of Applied Crystallography, v. 22, n. 6 , p. 519-22, 1989Tradução . . Disponível em: https://doi.org/10.1107/s0021889889005273. Acesso em: 15 jul. 2024.
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      Amaral, L. Q. (1989). Characterization of nematic lyomesophases by x-ray diffraction. Journal of Applied Crystallography, 22( 6 ), 519-22. doi:10.1107/s0021889889005273
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      Amaral LQ. Characterization of nematic lyomesophases by x-ray diffraction [Internet]. Journal of Applied Crystallography. 1989 ;22( 6 ): 519-22.[citado 2024 jul. 15 ] Available from: https://doi.org/10.1107/s0021889889005273
    • Vancouver

      Amaral LQ. Characterization of nematic lyomesophases by x-ray diffraction [Internet]. Journal of Applied Crystallography. 1989 ;22( 6 ): 519-22.[citado 2024 jul. 15 ] Available from: https://doi.org/10.1107/s0021889889005273

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