An x-ray diffractometer for accurate structural invariant phase determination (2003)
- Authors:
- Autor USP: MORELHAO, SERGIO LUIZ - IF
- Unidade: IF
- Subjects: CRISTALOGRAFIA FÍSICA; DIFRAÇÃO POR RAIOS X
- Language: Inglês
- Imprenta:
- Publisher place: Copenhagen
- Date published: 2003
- Source:
- Título do periódico: Journal of Synchroton Radiation
- ISSN: 0909-0495
- Volume/Número/Paginação/Ano: v. 10 pt. 3, p. 236-241, 2003
-
ABNT
MORELHAO, Sergio Luiz e MORELHÃO, Sérgio Luiz. An x-ray diffractometer for accurate structural invariant phase determination. Journal of Synchroton Radiation, v. 10 pt. 3, p. 236-241, 2003Tradução . . Disponível em: http://journals.iucr.org/s/issues/2003/03/00/he0303/he0303.pdf. Acesso em: 28 mar. 2023. -
APA
Morelhao, S. L., & Morelhão, S. L. (2003). An x-ray diffractometer for accurate structural invariant phase determination. Journal of Synchroton Radiation, 10 pt. 3, 236-241. Recuperado de http://journals.iucr.org/s/issues/2003/03/00/he0303/he0303.pdf -
NLM
Morelhao SL, Morelhão SL. An x-ray diffractometer for accurate structural invariant phase determination [Internet]. Journal of Synchroton Radiation. 2003 ; 10 pt. 3 236-241.[citado 2023 mar. 28 ] Available from: http://journals.iucr.org/s/issues/2003/03/00/he0303/he0303.pdf -
Vancouver
Morelhao SL, Morelhão SL. An x-ray diffractometer for accurate structural invariant phase determination [Internet]. Journal of Synchroton Radiation. 2003 ; 10 pt. 3 236-241.[citado 2023 mar. 28 ] Available from: http://journals.iucr.org/s/issues/2003/03/00/he0303/he0303.pdf - Invariant phase determination by genetic algorithm
- Structure refinement of in pure and doped single crystals by synchrotron X-ray Renninger scanning
- Hybrid reciprocal lattice: application to layer stress appointment in 'GA''AL''N'/'GA''N'(0001) systems with patterned substrates
- O Professor Sergio Morelhão fala sobre "Física Quântica e Neurociência" [Palestra]
- General recursive solution for one-dimensional quantum potentials: a simple tool for applied physics
- Enhanced triple-fase measurement at 'ômicron'/2-scattering geometry
- Characterization of erbium oxide sol-gel films and devices by grazing incidence X-ray reflectivity
- High-resolution synchrotron radiation Renninger scan to examine hybrid reflections in InGaP/GaAs(001)
- Enhanced X-ray phase determination by three-beam diffraction
- An x-ray topography study of the dendritic web silicon growth process
How to cite
A citação é gerada automaticamente e pode não estar totalmente de acordo com as normas
