An x-ray diffractometer for accurate structural invariant phase determination (2003)
- Autores:
- Autor USP: MORELHAO, SERGIO LUIZ - IF
- Unidade: IF
- Assuntos: CRISTALOGRAFIA FÍSICA; DIFRAÇÃO POR RAIOS X
- Idioma: Inglês
- Imprenta:
- Local: Copenhagen
- Data de publicação: 2003
- Fonte:
- Título do periódico: Journal of Synchroton Radiation
- ISSN: 0909-0495
- Volume/Número/Paginação/Ano: v. 10 pt. 3, p. 236-241, 2003
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ABNT
MORELHAO, Sergio Luiz e MORELHÃO, Sérgio Luiz. An x-ray diffractometer for accurate structural invariant phase determination. Journal of Synchroton Radiation, v. 10 pt. 3, p. 236-241, 2003Tradução . . Disponível em: http://journals.iucr.org/s/issues/2003/03/00/he0303/he0303.pdf. Acesso em: 19 set. 2024. -
APA
Morelhao, S. L., & Morelhão, S. L. (2003). An x-ray diffractometer for accurate structural invariant phase determination. Journal of Synchroton Radiation, 10 pt. 3, 236-241. Recuperado de http://journals.iucr.org/s/issues/2003/03/00/he0303/he0303.pdf -
NLM
Morelhao SL, Morelhão SL. An x-ray diffractometer for accurate structural invariant phase determination [Internet]. Journal of Synchroton Radiation. 2003 ; 10 pt. 3 236-241.[citado 2024 set. 19 ] Available from: http://journals.iucr.org/s/issues/2003/03/00/he0303/he0303.pdf -
Vancouver
Morelhao SL, Morelhão SL. An x-ray diffractometer for accurate structural invariant phase determination [Internet]. Journal of Synchroton Radiation. 2003 ; 10 pt. 3 236-241.[citado 2024 set. 19 ] Available from: http://journals.iucr.org/s/issues/2003/03/00/he0303/he0303.pdf - High-resolution synchrotron radiation Renninger scan to examine hybrid reflections in InGaP/GaAs(001)
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