Enhanced triple-fase measurement at 'ômicron'/2-scattering geometry (2002)
- Authors:
- Autor USP: MORELHAO, SERGIO LUIZ - IF
- Unidade: IF
- Subjects: MAGNETISMO; MATERIAIS MAGNÉTICOS
- Language: Inglês
- Imprenta:
- Source:
- Título do periódico: Resumos
- Conference titles: Encontro Nacional de Física da Matéria Condensada
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ABNT
MORELHÃO, Sérgio Luiz; KYCIA, Stefan. Enhanced triple-fase measurement at 'ômicron'/2-scattering geometry. Anais.. São Paulo: SBF, 2002. -
APA
Morelhão, S. L., & Kycia, S. (2002). Enhanced triple-fase measurement at 'ômicron'/2-scattering geometry. In Resumos. São Paulo: SBF. -
NLM
Morelhão SL, Kycia S. Enhanced triple-fase measurement at 'ômicron'/2-scattering geometry. Resumos. 2002 ; -
Vancouver
Morelhão SL, Kycia S. Enhanced triple-fase measurement at 'ômicron'/2-scattering geometry. Resumos. 2002 ; - Sensitivity Bragg surface diffraction to analyze ion-implanted semiconductors
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