ReP USP - Resultado da busca

Artigo de periodico
Aquaregia and oxigen plasma treatments on fluorinated tin oxide for assembly of PLEDs devices using OC1C10-PPV as emissive polymer (2009)
Santos, Emerson Roberto; Burini Junior, Elvo Calixto ; Fonseca, Fernando Josepetti
Fonte: Sensors & Transducers Journal. Unidade: EP
Assunto: FILMES FINOS
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ABNT
SANTOS, Emerson Roberto e BURINI JUNIOR, Elvo Calixto e FONSECA, Fernando Josepetti. Aquaregia and oxigen plasma treatments on fluorinated tin oxide for assembly of PLEDs devices using OC1C10-PPV as emissive polymer. Sensors & Transducers Journal, v. 101, n. 2, 2009Tradução . . Acesso em: 15 out. 2024.
APA
Santos, E. R., Burini Junior, E. C., & Fonseca, F. J. (2009). Aquaregia and oxigen plasma treatments on fluorinated tin oxide for assembly of PLEDs devices using OC1C10-PPV as emissive polymer. Sensors & Transducers Journal, 101( 2).
NLM
Santos ER, Burini Junior EC, Fonseca FJ. Aquaregia and oxigen plasma treatments on fluorinated tin oxide for assembly of PLEDs devices using OC1C10-PPV as emissive polymer. Sensors & Transducers Journal. 2009 ;101( 2):[citado 2024 out. 15 ]
Vancouver
Santos ER, Burini Junior EC, Fonseca FJ. Aquaregia and oxigen plasma treatments on fluorinated tin oxide for assembly of PLEDs devices using OC1C10-PPV as emissive polymer. Sensors & Transducers Journal. 2009 ;101( 2):[citado 2024 out. 15 ]
Artigo de periodico
Opto-electrical properties of single layer flexible electroluminescence device with ruthenium complex (2008)
Santos, G.; Fonseca, Fernando Josepetti ; Andrade, Adnei Melges de ; Patrocinio, Antônio Otávio de Toledo; Mizoguchi, Sergio Kenji; Iha, Neyde Yukie Murakami ; Peres, M.; Simões, W.; Monteiro, T.; Pereira, L.
Fonte: Journal of Non-Crystalline Solids. Unidades: EP, IEE, IQ
Assuntos: RUTÊNIO, LUMINESCÊNCIA, FOTOCONDUTIVIDADE, FILMES FINOS
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SANTOS, G. et al. Opto-electrical properties of single layer flexible electroluminescence device with ruthenium complex. Journal of Non-Crystalline Solids, v. 354, n. 19-25, p. 2571-2574, 2008Tradução . . Disponível em: https://doi.org/10.1016/j.jnoncrysol.2007.10.064. Acesso em: 15 out. 2024.
APA
Santos, G., Fonseca, F. J., Andrade, A. M. de, Patrocinio, A. O. de T., Mizoguchi, S. K., Iha, N. Y. M., et al. (2008). Opto-electrical properties of single layer flexible electroluminescence device with ruthenium complex. Journal of Non-Crystalline Solids, 354( 19-25), 2571-2574. doi:10.1016/j.jnoncrysol.2007.10.064
NLM
Santos G, Fonseca FJ, Andrade AM de, Patrocinio AO de T, Mizoguchi SK, Iha NYM, Peres M, Simões W, Monteiro T, Pereira L. Opto-electrical properties of single layer flexible electroluminescence device with ruthenium complex [Internet]. Journal of Non-Crystalline Solids. 2008 ;354( 19-25): 2571-2574.[citado 2024 out. 15 ] Available from: https://doi.org/10.1016/j.jnoncrysol.2007.10.064
Vancouver
Santos G, Fonseca FJ, Andrade AM de, Patrocinio AO de T, Mizoguchi SK, Iha NYM, Peres M, Simões W, Monteiro T, Pereira L. Opto-electrical properties of single layer flexible electroluminescence device with ruthenium complex [Internet]. Journal of Non-Crystalline Solids. 2008 ;354( 19-25): 2571-2574.[citado 2024 out. 15 ] Available from: https://doi.org/10.1016/j.jnoncrysol.2007.10.064
Artigo de periodico
Influence of the deposition parameters on the morphology and electrical conductivity of PANI/PSS self-assembled films (2008)
Braga, Guilherme de Souza; Paterno, Leonardo Giordano ; Lima, John Paul Hempel; Fonseca, Fernando Josepetti ; Andrade, Adnei Melges de
Fonte: Materials Science and Engineering: C. Unidades: EP, IEE
Assunto: FILMES FINOS
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BRAGA, Guilherme de Souza et al. Influence of the deposition parameters on the morphology and electrical conductivity of PANI/PSS self-assembled films. Materials Science and Engineering: C, v. 28, n. 4, p. 555-562, 2008Tradução . . Disponível em: https://doi.org/10.1016/j.msec.2007.06.003. Acesso em: 15 out. 2024.
APA
Braga, G. de S., Paterno, L. G., Lima, J. P. H., Fonseca, F. J., & Andrade, A. M. de. (2008). Influence of the deposition parameters on the morphology and electrical conductivity of PANI/PSS self-assembled films. Materials Science and Engineering: C, 28( 4), 555-562. doi:10.1016/j.msec.2007.06.003
NLM
Braga G de S, Paterno LG, Lima JPH, Fonseca FJ, Andrade AM de. Influence of the deposition parameters on the morphology and electrical conductivity of PANI/PSS self-assembled films [Internet]. Materials Science and Engineering: C. 2008 ;28( 4): 555-562.[citado 2024 out. 15 ] Available from: https://doi.org/10.1016/j.msec.2007.06.003
Vancouver
Braga G de S, Paterno LG, Lima JPH, Fonseca FJ, Andrade AM de. Influence of the deposition parameters on the morphology and electrical conductivity of PANI/PSS self-assembled films [Internet]. Materials Science and Engineering: C. 2008 ;28( 4): 555-562.[citado 2024 out. 15 ] Available from: https://doi.org/10.1016/j.msec.2007.06.003
Artigo de periodico
The influence of diffusion of fluorine compounds for silicon lateral etching (2004)
Verdonck, Patrick Bernard; Goodyear, Alec; Braithwaite, Nicholas
Fonte: Thin Solid Films,. Unidade: EP
Assunto: FILMES FINOS
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ABNT
VERDONCK, Patrick Bernard e GOODYEAR, Alec e BRAITHWAITE, Nicholas. The influence of diffusion of fluorine compounds for silicon lateral etching. Thin Solid Films, v. 459, n. 1-2, p. 141-144, 2004Tradução . . Disponível em: https://doi.org/10.1016/j.tsf.2003.12.117. Acesso em: 15 out. 2024.
APA
Verdonck, P. B., Goodyear, A., & Braithwaite, N. (2004). The influence of diffusion of fluorine compounds for silicon lateral etching. Thin Solid Films,, 459( 1-2), 141-144. doi:10.1016/j.tsf.2003.12.117
NLM
Verdonck PB, Goodyear A, Braithwaite N. The influence of diffusion of fluorine compounds for silicon lateral etching [Internet]. Thin Solid Films,. 2004 ; 459( 1-2): 141-144.[citado 2024 out. 15 ] Available from: https://doi.org/10.1016/j.tsf.2003.12.117
Vancouver
Verdonck PB, Goodyear A, Braithwaite N. The influence of diffusion of fluorine compounds for silicon lateral etching [Internet]. Thin Solid Films,. 2004 ; 459( 1-2): 141-144.[citado 2024 out. 15 ] Available from: https://doi.org/10.1016/j.tsf.2003.12.117
Artigo de periodico
High-density plasma chemical vapor deposition of amorphous carbon films (2004)
Mousinho, Ana Paula; Mansano, Ronaldo Domingues ; Verdonck, Patrick Bernard
Fonte: Diamond and Related Materials,. Unidade: EP
Assunto: FILMES FINOS
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ABNT
MOUSINHO, Ana Paula e MANSANO, Ronaldo Domingues e VERDONCK, Patrick Bernard. High-density plasma chemical vapor deposition of amorphous carbon films. Diamond and Related Materials, v. 13, n. 2, p. 311-315, 2004Tradução . . Disponível em: https://doi.org/10.1016/j.diamond.2003.10.024. Acesso em: 15 out. 2024.
APA
Mousinho, A. P., Mansano, R. D., & Verdonck, P. B. (2004). High-density plasma chemical vapor deposition of amorphous carbon films. Diamond and Related Materials,, 13( 2), 311-315. doi:10.1016/j.diamond.2003.10.024
NLM
Mousinho AP, Mansano RD, Verdonck PB. High-density plasma chemical vapor deposition of amorphous carbon films [Internet]. Diamond and Related Materials,. 2004 ; 13( 2): 311-315.[citado 2024 out. 15 ] Available from: https://doi.org/10.1016/j.diamond.2003.10.024
Vancouver
Mousinho AP, Mansano RD, Verdonck PB. High-density plasma chemical vapor deposition of amorphous carbon films [Internet]. Diamond and Related Materials,. 2004 ; 13( 2): 311-315.[citado 2024 out. 15 ] Available from: https://doi.org/10.1016/j.diamond.2003.10.024
Artigo de periodico
Correlation between mechanical and electrical properties of silicon oxide deposited by PECVD-TEOS at low temperature (2004)
Gonçalves, Lucas Gonçalves Dias; Viana, Carlos Eduardo; Santos, J. C.; Morimoto, Nilton Itiro
Fonte: Surface & Coatings Technology,. Unidade: EP
Assunto: FILMES FINOS
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GONÇALVES, Lucas Gonçalves Dias et al. Correlation between mechanical and electrical properties of silicon oxide deposited by PECVD-TEOS at low temperature. Surface & Coatings Technology, v. 180-181, p. 275-279, 2004Tradução . . Disponível em: https://doi.org/10.1016/s0257-8972(03)01212-x. Acesso em: 15 out. 2024.
APA
Gonçalves, L. G. D., Viana, C. E., Santos, J. C., & Morimoto, N. I. (2004). Correlation between mechanical and electrical properties of silicon oxide deposited by PECVD-TEOS at low temperature. Surface & Coatings Technology,, 180-181, 275-279. doi:10.1016/s0257-8972(03)01212-x
NLM
Gonçalves LGD, Viana CE, Santos JC, Morimoto NI. Correlation between mechanical and electrical properties of silicon oxide deposited by PECVD-TEOS at low temperature [Internet]. Surface & Coatings Technology,. 2004 ;180-181 275-279.[citado 2024 out. 15 ] Available from: https://doi.org/10.1016/s0257-8972(03)01212-x
Vancouver
Gonçalves LGD, Viana CE, Santos JC, Morimoto NI. Correlation between mechanical and electrical properties of silicon oxide deposited by PECVD-TEOS at low temperature [Internet]. Surface & Coatings Technology,. 2004 ;180-181 275-279.[citado 2024 out. 15 ] Available from: https://doi.org/10.1016/s0257-8972(03)01212-x
Artigo de periodico
Nanostructured films of perylene derivatives: high performance materials for taste sensor applications (2004)
Constantino, Carlos José Leopoldo; Antunes, P. A.; Venâncio, Everaldo Carlos; Consolin, N.; Fonseca, Fernando Josepetti ; Mattoso, Luiz Henrique Capparelli; Aroca, Ricardo F.; Oliveira Junior, Osvaldo Novais de ; Riul Junior, Antonio
Fonte: Sensor Letters. Unidades: EP, IFSC
Assunto: FILMES FINOS
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ABNT
CONSTANTINO, Carlos José Leopoldo et al. Nanostructured films of perylene derivatives: high performance materials for taste sensor applications. Sensor Letters, v. 2, n. 2, p. 95-101, 2004Tradução . . Acesso em: 15 out. 2024.
APA
Constantino, C. J. L., Antunes, P. A., Venâncio, E. C., Consolin, N., Fonseca, F. J., Mattoso, L. H. C., et al. (2004). Nanostructured films of perylene derivatives: high performance materials for taste sensor applications. Sensor Letters, 2( 2), 95-101.
NLM
Constantino CJL, Antunes PA, Venâncio EC, Consolin N, Fonseca FJ, Mattoso LHC, Aroca RF, Oliveira Junior ON de, Riul Junior A. Nanostructured films of perylene derivatives: high performance materials for taste sensor applications. Sensor Letters. 2004 ; 2( 2): 95-101.[citado 2024 out. 15 ]
Vancouver
Constantino CJL, Antunes PA, Venâncio EC, Consolin N, Fonseca FJ, Mattoso LHC, Aroca RF, Oliveira Junior ON de, Riul Junior A. Nanostructured films of perylene derivatives: high performance materials for taste sensor applications. Sensor Letters. 2004 ; 2( 2): 95-101.[citado 2024 out. 15 ]
Artigo de periodico
The influence of nitrogen on the dielectric constant and surface hardness in diamond-like carbon (DLC) films (2004)
Guerino, M.; Massi, Marcos; Maciel, Homero Santiago; Otani, C.; Mansano, Ronaldo Domingues ; Verdonck, Patrick Bernard; Libardi, J.
Fonte: Diamond and Related Materials,. Unidade: EP
Assunto: FILMES FINOS
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ABNT
GUERINO, M. et al. The influence of nitrogen on the dielectric constant and surface hardness in diamond-like carbon (DLC) films. Diamond and Related Materials, v. 13, n. 2, p. 316-319, 2004Tradução . . Disponível em: https://doi.org/10.1016/j.diamond.2003.10.016. Acesso em: 15 out. 2024.
APA
Guerino, M., Massi, M., Maciel, H. S., Otani, C., Mansano, R. D., Verdonck, P. B., & Libardi, J. (2004). The influence of nitrogen on the dielectric constant and surface hardness in diamond-like carbon (DLC) films. Diamond and Related Materials,, 13( 2), 316-319. doi:10.1016/j.diamond.2003.10.016
NLM
Guerino M, Massi M, Maciel HS, Otani C, Mansano RD, Verdonck PB, Libardi J. The influence of nitrogen on the dielectric constant and surface hardness in diamond-like carbon (DLC) films [Internet]. Diamond and Related Materials,. 2004 ; 13( 2): 316-319.[citado 2024 out. 15 ] Available from: https://doi.org/10.1016/j.diamond.2003.10.016
Vancouver
Guerino M, Massi M, Maciel HS, Otani C, Mansano RD, Verdonck PB, Libardi J. The influence of nitrogen on the dielectric constant and surface hardness in diamond-like carbon (DLC) films [Internet]. Diamond and Related Materials,. 2004 ; 13( 2): 316-319.[citado 2024 out. 15 ] Available from: https://doi.org/10.1016/j.diamond.2003.10.016
Artigo de periodico
Low-temperature PECVD deposition of highly conductive microcrystalline silicon thin films (2003)
Nardes, Alexandre Mantovani; Andrade, Adnei Melges de ; Fonseca, Fernando Josepetti ; Dirani, Ely Antonio Tadeu ; Muccillo, Reginaldo ; Muccillo, Eliana Navarro dos Santos
Fonte: Journal of Materials Science: materials in electronics. Unidade: EP
Assunto: FILMES FINOS
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NARDES, Alexandre Mantovani et al. Low-temperature PECVD deposition of highly conductive microcrystalline silicon thin films. Journal of Materials Science: materials in electronics, v. 14, n. 5-7, p. 407-411, 2003Tradução . . Acesso em: 15 out. 2024.
APA
Nardes, A. M., Andrade, A. M. de, Fonseca, F. J., Dirani, E. A. T., Muccillo, R., & Muccillo, E. N. dos S. (2003). Low-temperature PECVD deposition of highly conductive microcrystalline silicon thin films. Journal of Materials Science: materials in electronics, 14( 5-7), 407-411.
NLM
Nardes AM, Andrade AM de, Fonseca FJ, Dirani EAT, Muccillo R, Muccillo EN dos S. Low-temperature PECVD deposition of highly conductive microcrystalline silicon thin films. Journal of Materials Science: materials in electronics. 2003 ;14( 5-7): 407-411.[citado 2024 out. 15 ]
Vancouver
Nardes AM, Andrade AM de, Fonseca FJ, Dirani EAT, Muccillo R, Muccillo EN dos S. Low-temperature PECVD deposition of highly conductive microcrystalline silicon thin films. Journal of Materials Science: materials in electronics. 2003 ;14( 5-7): 407-411.[citado 2024 out. 15 ]
Artigo de periodico
An artificial taste sensor based on conducting polymers (2003)
Riul Junior, Antonio; Malmegrim, Roger R; Fonseca, Fernando Josepetti ; Mattoso, Luiz Henrique Capparelli
Fonte: Biosensors and Bioelectronics. Unidade: EP
Assuntos: SENSORES BIOMÉDICOS, POLÍMEROS (MATERIAIS), FILMES FINOS
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ABNT
RIUL JUNIOR, Antonio et al. An artificial taste sensor based on conducting polymers. Biosensors and Bioelectronics, v. 18, n. 11, p. 1365-1369, 2003Tradução . . Disponível em: https://doi.org/10.1016/s0956-5663(03)00069-1. Acesso em: 15 out. 2024.
APA
Riul Junior, A., Malmegrim, R. R., Fonseca, F. J., & Mattoso, L. H. C. (2003). An artificial taste sensor based on conducting polymers. Biosensors and Bioelectronics, 18( 11), 1365-1369. doi:10.1016/s0956-5663(03)00069-1
NLM
Riul Junior A, Malmegrim RR, Fonseca FJ, Mattoso LHC. An artificial taste sensor based on conducting polymers [Internet]. Biosensors and Bioelectronics. 2003 ; 18( 11): 1365-1369.[citado 2024 out. 15 ] Available from: https://doi.org/10.1016/s0956-5663(03)00069-1
Vancouver
Riul Junior A, Malmegrim RR, Fonseca FJ, Mattoso LHC. An artificial taste sensor based on conducting polymers [Internet]. Biosensors and Bioelectronics. 2003 ; 18( 11): 1365-1369.[citado 2024 out. 15 ] Available from: https://doi.org/10.1016/s0956-5663(03)00069-1
Artigo de periodico
Extraction of the oxide charge density at front and back interfaces of SOI nMOSFETs devices (2002)
Nicolett, Aparecido Sirley; Martino, João Antonio ; Simoen, Eddy ; Claeys, Cor
Fonte: Solid-State Electronics. Unidade: EP
Assunto: FILMES FINOS
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NICOLETT, Aparecido Sirley et al. Extraction of the oxide charge density at front and back interfaces of SOI nMOSFETs devices. Solid-State Electronics, n. 9, p. 1381-1387, 2002Tradução . . Disponível em: https://doi.org/10.1016/s0038-1101(02)00067-9. Acesso em: 15 out. 2024.
APA
Nicolett, A. S., Martino, J. A., Simoen, E., & Claeys, C. (2002). Extraction of the oxide charge density at front and back interfaces of SOI nMOSFETs devices. Solid-State Electronics, ( 9), 1381-1387. doi:10.1016/s0038-1101(02)00067-9
NLM
Nicolett AS, Martino JA, Simoen E, Claeys C. Extraction of the oxide charge density at front and back interfaces of SOI nMOSFETs devices [Internet]. Solid-State Electronics. 2002 ;( 9): 1381-1387.[citado 2024 out. 15 ] Available from: https://doi.org/10.1016/s0038-1101(02)00067-9
Vancouver
Nicolett AS, Martino JA, Simoen E, Claeys C. Extraction of the oxide charge density at front and back interfaces of SOI nMOSFETs devices [Internet]. Solid-State Electronics. 2002 ;( 9): 1381-1387.[citado 2024 out. 15 ] Available from: https://doi.org/10.1016/s0038-1101(02)00067-9
Artigo de periodico
Electrical and structural characterization of DLC films deposited by magnetron sputtering (2001)
Massi, Marcos; Maciel, Homero Santiago; Otani, C.; Mansano, Ronaldo Domingues ; Verdonck, Patrick Bernard
Fonte: Journal of Materials Science: Materials in Electronics. Unidade: EP
Assunto: FILMES FINOS
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ABNT
MASSI, Marcos et al. Electrical and structural characterization of DLC films deposited by magnetron sputtering. Journal of Materials Science: Materials in Electronics, v. 12, p. 343-346, 2001Tradução . . Acesso em: 15 out. 2024.
APA
Massi, M., Maciel, H. S., Otani, C., Mansano, R. D., & Verdonck, P. B. (2001). Electrical and structural characterization of DLC films deposited by magnetron sputtering. Journal of Materials Science: Materials in Electronics, 12, 343-346.
NLM
Massi M, Maciel HS, Otani C, Mansano RD, Verdonck PB. Electrical and structural characterization of DLC films deposited by magnetron sputtering. Journal of Materials Science: Materials in Electronics. 2001 ; 12 343-346.[citado 2024 out. 15 ]
Vancouver
Massi M, Maciel HS, Otani C, Mansano RD, Verdonck PB. Electrical and structural characterization of DLC films deposited by magnetron sputtering. Journal of Materials Science: Materials in Electronics. 2001 ; 12 343-346.[citado 2024 out. 15 ]

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