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Artigo de periodico
Photoreflectance spectra from GaAs HEMT structures reinvestigated: solution of an old controversy (1998)
Soares, J A N T; Enderlein, R; Beliaev, D; Leite, J. R.; Saito, M
Source: Semiconductor Science and Technology. Unidade: IF
Subjects: ENGENHARIA MECÂNICA, MATÉRIA CONDENSADA, MATÉRIA CONDENSADA
A citação é gerada automaticamente e pode não estar totalmente de acordo com as normas
ABNT
SOARES, J A N T et al. Photoreflectance spectra from GaAs HEMT structures reinvestigated: solution of an old controversy. Semiconductor Science and Technology, v. 13, n. 12, p. 1418-1425, 1998Tradução . . Disponível em: https://doi.org/10.1088/0268-1242/13/12/015. Acesso em: 11 nov. 2024.
APA
Soares, J. A. N. T., Enderlein, R., Beliaev, D., Leite, J. R., & Saito, M. (1998). Photoreflectance spectra from GaAs HEMT structures reinvestigated: solution of an old controversy. Semiconductor Science and Technology, 13( 12), 1418-1425. doi:10.1088/0268-1242/13/12/015
NLM
Soares JANT, Enderlein R, Beliaev D, Leite JR, Saito M. Photoreflectance spectra from GaAs HEMT structures reinvestigated: solution of an old controversy [Internet]. Semiconductor Science and Technology. 1998 ; 13( 12): 1418-1425.[citado 2024 nov. 11 ] Available from: https://doi.org/10.1088/0268-1242/13/12/015
Vancouver
Soares JANT, Enderlein R, Beliaev D, Leite JR, Saito M. Photoreflectance spectra from GaAs HEMT structures reinvestigated: solution of an old controversy [Internet]. Semiconductor Science and Technology. 1998 ; 13( 12): 1418-1425.[citado 2024 nov. 11 ] Available from: https://doi.org/10.1088/0268-1242/13/12/015
Artigo de periodico
Photoreflectance investigations of semiconductor device structures (1995)
Soares, J A N T; Beliaev, D; Enderlein, R; Scolfaro, L M R; Saito, M; Leite, J. R.
Source: Materials Science & Engineering B. Unidade: IF
Assunto: MATÉRIA CONDENSADA
A citação é gerada automaticamente e pode não estar totalmente de acordo com as normas
ABNT
SOARES, J A N T et al. Photoreflectance investigations of semiconductor device structures. Materials Science & Engineering B, v. 35, p. 267-72, 1995Tradução . . Disponível em: https://doi.org/10.1016/0921-5107(95)01340-7. Acesso em: 11 nov. 2024.
APA
Soares, J. A. N. T., Beliaev, D., Enderlein, R., Scolfaro, L. M. R., Saito, M., & Leite, J. R. (1995). Photoreflectance investigations of semiconductor device structures. Materials Science & Engineering B, 35, 267-72. doi:10.1016/0921-5107(95)01340-7
NLM
Soares JANT, Beliaev D, Enderlein R, Scolfaro LMR, Saito M, Leite JR. Photoreflectance investigations of semiconductor device structures [Internet]. Materials Science & Engineering B. 1995 ;35 267-72.[citado 2024 nov. 11 ] Available from: https://doi.org/10.1016/0921-5107(95)01340-7
Vancouver
Soares JANT, Beliaev D, Enderlein R, Scolfaro LMR, Saito M, Leite JR. Photoreflectance investigations of semiconductor device structures [Internet]. Materials Science & Engineering B. 1995 ;35 267-72.[citado 2024 nov. 11 ] Available from: https://doi.org/10.1016/0921-5107(95)01340-7
Trabalho de evento-resumo periodico
Photoreflectance investigations of semiconductor device structutres (1995)
Soares, J A N T; Beliaev, D; Enderlein, R; Scolfaro, L M R; Leite, J. R.
Source: Materials Science and Engeneering B. Conference titles: International Conference on Low Dimensional Structures and Devices. Unidade: IF
Assunto: MATÉRIA CONDENSADA
A citação é gerada automaticamente e pode não estar totalmente de acordo com as normas
ABNT
SOARES, J A N T et al. Photoreflectance investigations of semiconductor device structutres. Materials Science and Engeneering B. Cingapura: Instituto de Física, Universidade de São Paulo. . Acesso em: 11 nov. 2024. , 1995
APA
Soares, J. A. N. T., Beliaev, D., Enderlein, R., Scolfaro, L. M. R., & Leite, J. R. (1995). Photoreflectance investigations of semiconductor device structutres. Materials Science and Engeneering B. Cingapura: Instituto de Física, Universidade de São Paulo.
NLM
Soares JANT, Beliaev D, Enderlein R, Scolfaro LMR, Leite JR. Photoreflectance investigations of semiconductor device structutres. Materials Science and Engeneering B. 1995 ;35 267-72.[citado 2024 nov. 11 ]
Vancouver
Soares JANT, Beliaev D, Enderlein R, Scolfaro LMR, Leite JR. Photoreflectance investigations of semiconductor device structutres. Materials Science and Engeneering B. 1995 ;35 267-72.[citado 2024 nov. 11 ]
Artigo de periodico
Method for calculating photo - and electroreflectance spectra from semiconductor heterostructures (1995)
Enderlein, R; Beliaev, D; Soares, J A N T; Scolfaro, L M R; Leite, J. R.
Source: Physical Review B. Unidade: IF
Assunto: MATÉRIA CONDENSADA
A citação é gerada automaticamente e pode não estar totalmente de acordo com as normas
ABNT
ENDERLEIN, R et al. Method for calculating photo - and electroreflectance spectra from semiconductor heterostructures. Physical Review B, v. 52, p. 2814-22, 1995Tradução . . Disponível em: https://doi.org/10.1103/physrevb.52.2814. Acesso em: 11 nov. 2024.
APA
Enderlein, R., Beliaev, D., Soares, J. A. N. T., Scolfaro, L. M. R., & Leite, J. R. (1995). Method for calculating photo - and electroreflectance spectra from semiconductor heterostructures. Physical Review B, 52, 2814-22. doi:10.1103/physrevb.52.2814
NLM
Enderlein R, Beliaev D, Soares JANT, Scolfaro LMR, Leite JR. Method for calculating photo - and electroreflectance spectra from semiconductor heterostructures [Internet]. Physical Review B. 1995 ;52 2814-22.[citado 2024 nov. 11 ] Available from: https://doi.org/10.1103/physrevb.52.2814
Vancouver
Enderlein R, Beliaev D, Soares JANT, Scolfaro LMR, Leite JR. Method for calculating photo - and electroreflectance spectra from semiconductor heterostructures [Internet]. Physical Review B. 1995 ;52 2814-22.[citado 2024 nov. 11 ] Available from: https://doi.org/10.1103/physrevb.52.2814
Artigo de periodico
Photo and electroreflectance spectra from spatially inhomogeneous heterostructures calculated by means of a new method (1994)
Beliaev, D; Enderlein, R; Soares, J A N T; Scolfaro, L M R; Ceschin, A M; Quivy, A. A.; Leite, J. R.
Source: Superlattices and Microstructures. Unidade: IF
Assunto: MATÉRIA CONDENSADA
A citação é gerada automaticamente e pode não estar totalmente de acordo com as normas
ABNT
BELIAEV, D et al. Photo and electroreflectance spectra from spatially inhomogeneous heterostructures calculated by means of a new method. Superlattices and Microstructures, v. 15, n. 3 , p. 339-43, 1994Tradução . . Disponível em: https://doi.org/10.1006/spmi.1994.1066. Acesso em: 11 nov. 2024.
APA
Beliaev, D., Enderlein, R., Soares, J. A. N. T., Scolfaro, L. M. R., Ceschin, A. M., Quivy, A. A., & Leite, J. R. (1994). Photo and electroreflectance spectra from spatially inhomogeneous heterostructures calculated by means of a new method. Superlattices and Microstructures, 15( 3 ), 339-43. doi:10.1006/spmi.1994.1066
NLM
Beliaev D, Enderlein R, Soares JANT, Scolfaro LMR, Ceschin AM, Quivy AA, Leite JR. Photo and electroreflectance spectra from spatially inhomogeneous heterostructures calculated by means of a new method [Internet]. Superlattices and Microstructures. 1994 ;15( 3 ): 339-43.[citado 2024 nov. 11 ] Available from: https://doi.org/10.1006/spmi.1994.1066
Vancouver
Beliaev D, Enderlein R, Soares JANT, Scolfaro LMR, Ceschin AM, Quivy AA, Leite JR. Photo and electroreflectance spectra from spatially inhomogeneous heterostructures calculated by means of a new method [Internet]. Superlattices and Microstructures. 1994 ;15( 3 ): 339-43.[citado 2024 nov. 11 ] Available from: https://doi.org/10.1006/spmi.1994.1066

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