Determination of the melting temperature of spherical nanoparticles in dilute solution as a function of their radius by exclusively using the small-angle X-ray scattering technique (2020)
- Authors:
- Autor USP: CRAIEVICH, ALDO FELIX - IF
- Unidade: IF
- DOI: 10.1107/S1600576720002101
- Subjects: RADIAÇÃO SINCROTRON; CRISTALOGRAFIA DE RAIOS X; NANOPARTÍCULAS; TERMODINÂMICA; ESPALHAMENTO DE RAIOS X A BAIXOS ÂNGULOS
- Keywords: small-angle X-ray scattering; SAXS; melting; nanoparticles; thermal expansion; size-dependent contraction.
- Agências de fomento:
- Language: Inglês
- Imprenta:
- Source:
- Título: Journal of Applied Crystallography
- ISSN: 1600-5767
- Volume/Número/Paginação/Ano: v. 53, n. 2, p. 455-463, abril, 2020
- Este periódico é de acesso aberto
- Este artigo NÃO é de acesso aberto
-
ABNT
KELLERMANN, G. e PEREIRA, F. L. C. e CRAIEVICH, Aldo Felix. Determination of the melting temperature of spherical nanoparticles in dilute solution as a function of their radius by exclusively using the small-angle X-ray scattering technique. Journal of Applied Crystallography, v. 53, n. 2, p. 455-463, 2020Tradução . . Disponível em: https://doi.org/10.1107/S1600576720002101. Acesso em: 24 fev. 2026. -
APA
Kellermann, G., Pereira, F. L. C., & Craievich, A. F. (2020). Determination of the melting temperature of spherical nanoparticles in dilute solution as a function of their radius by exclusively using the small-angle X-ray scattering technique. Journal of Applied Crystallography, 53( 2), 455-463. doi:10.1107/S1600576720002101 -
NLM
Kellermann G, Pereira FLC, Craievich AF. Determination of the melting temperature of spherical nanoparticles in dilute solution as a function of their radius by exclusively using the small-angle X-ray scattering technique [Internet]. Journal of Applied Crystallography. 2020 ; 53( 2): 455-463.[citado 2026 fev. 24 ] Available from: https://doi.org/10.1107/S1600576720002101 -
Vancouver
Kellermann G, Pereira FLC, Craievich AF. Determination of the melting temperature of spherical nanoparticles in dilute solution as a function of their radius by exclusively using the small-angle X-ray scattering technique [Internet]. Journal of Applied Crystallography. 2020 ; 53( 2): 455-463.[citado 2026 fev. 24 ] Available from: https://doi.org/10.1107/S1600576720002101 - Investigaciones de nanomateriales meidante XRD, XAFS y SAXS con luz de síncrotron
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Informações sobre o DOI: 10.1107/S1600576720002101 (Fonte: oaDOI API)
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