Highly oriented NiSi2@Si thin-nanocomposite produced by solid state diffusion: Morphological and crystallographic characterization (2022)
- Authors:
- Autor USP: CRAIEVICH, ALDO FELIX - IF
- Unidade: IF
- DOI: 10.1016/j.surfin.2022.101763
- Subjects: CRISTALOGRAFIA FÍSICA; MATERIAIS NANOESTRUTURADOS; ESPALHAMENTO DE RAIOS X A BAIXOS ÂNGULOS
- Keywords: NiSi2@Si; Nanoplates; Nanoparticles; GISAXS; TEM
- Agências de fomento:
- Language: Inglês
- Imprenta:
- Source:
- Título: Surfaces and Interfaces
- ISSN: 2468-0230
- Volume/Número/Paginação/Ano: v. 29, abril de 2022, número do artigo: 101763
- Este periódico é de acesso aberto
- Este artigo NÃO é de acesso aberto
-
ABNT
COSTA, Daniel da Silva et al. Highly oriented NiSi2@Si thin-nanocomposite produced by solid state diffusion: Morphological and crystallographic characterization. Surfaces and Interfaces, v. 29, 2022Tradução . . Disponível em: https://doi.org/10.1016/j.surfin.2022.101763. Acesso em: 25 fev. 2026. -
APA
Costa, D. da S., Kellermann, G., Craievich, A. F., Montoro, L. A., Oliveira, C. K. B. Q. M., Afonso, C. R. M., et al. (2022). Highly oriented NiSi2@Si thin-nanocomposite produced by solid state diffusion: Morphological and crystallographic characterization. Surfaces and Interfaces, 29. doi:10.1016/j.surfin.2022.101763 -
NLM
Costa D da S, Kellermann G, Craievich AF, Montoro LA, Oliveira CKBQM, Afonso CRM, Huck-Iriart C, Lisando J. Giovanetti, Requejo FG, Zanella IG, Mazzaro I, Szameitat ES, Cardoso RP. Highly oriented NiSi2@Si thin-nanocomposite produced by solid state diffusion: Morphological and crystallographic characterization [Internet]. Surfaces and Interfaces. 2022 ; 29[citado 2026 fev. 25 ] Available from: https://doi.org/10.1016/j.surfin.2022.101763 -
Vancouver
Costa D da S, Kellermann G, Craievich AF, Montoro LA, Oliveira CKBQM, Afonso CRM, Huck-Iriart C, Lisando J. Giovanetti, Requejo FG, Zanella IG, Mazzaro I, Szameitat ES, Cardoso RP. Highly oriented NiSi2@Si thin-nanocomposite produced by solid state diffusion: Morphological and crystallographic characterization [Internet]. Surfaces and Interfaces. 2022 ; 29[citado 2026 fev. 25 ] Available from: https://doi.org/10.1016/j.surfin.2022.101763 - Investigaciones de nanomateriales meidante XRD, XAFS y SAXS con luz de síncrotron
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Informações sobre o DOI: 10.1016/j.surfin.2022.101763 (Fonte: oaDOI API)
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