Synchrotron radiation in Brazil. Past, present and future (2020)
- Autor:
- Autor USP: CRAIEVICH, ALDO FELIX - IF
- Unidade: IF
- DOI: 10.1016/j.radphyschem.2019.04.003
- Subjects: FÍSICA DO ESTADO SÓLIDO; CRISTALOGRAFIA; NANOPARTÍCULAS; MATERIAIS NANOESTRUTURADOS
- Agências de fomento:
- Language: Inglês
- Imprenta:
- Source:
- Título: Radiation Physics and Chemistry
- ISSN: 0969-806X
- Volume/Número/Paginação/Ano: v. 167, fevereiro, 2020, número do artigo: 108253
- Este periódico é de acesso aberto
- Este artigo NÃO é de acesso aberto
-
ABNT
CRAIEVICH, Aldo Felix. Synchrotron radiation in Brazil. Past, present and future. Radiation Physics and Chemistry, v. 167, 2020Tradução . . Disponível em: https://doi.org/10.1016/j.radphyschem.2019.04.003. Acesso em: 08 fev. 2026. -
APA
Craievich, A. F. (2020). Synchrotron radiation in Brazil. Past, present and future. Radiation Physics and Chemistry, 167. doi:10.1016/j.radphyschem.2019.04.003 -
NLM
Craievich AF. Synchrotron radiation in Brazil. Past, present and future [Internet]. Radiation Physics and Chemistry. 2020 ; 167[citado 2026 fev. 08 ] Available from: https://doi.org/10.1016/j.radphyschem.2019.04.003 -
Vancouver
Craievich AF. Synchrotron radiation in Brazil. Past, present and future [Internet]. Radiation Physics and Chemistry. 2020 ; 167[citado 2026 fev. 08 ] Available from: https://doi.org/10.1016/j.radphyschem.2019.04.003 - Investigaciones de nanomateriales meidante XRD, XAFS y SAXS con luz de síncrotron
- Efeito da adição de Metiltrietoxisilano (MTES) sobre a estrutura de materiais híbridos Sílica-Polipropilenoglicol preparados pelo processo Sol-Gel
- Structural characterization of undoped and Sb-doped Sn'O IND. 2' thin films fired at different temperatures
- Molecular packing in a semi-fluorinated alkane film transferred from water surface onto solid substrates
- Controlled growth of extended arrays of 'CO''SI' IND. 2' hexagonal nanoplatelets buried in 'SI'(001), 'SI'(011) and 'SI'(111) wafers
- Two-step GISAXS characterization of NiSi2 nanoplates and Ni nanocrystals embedded in a silicon wafer covered with a silica thin film
- In situ study of the process of formation of hexagonal NiSi2 nanoplates and spherical Ni nanoparticles embedded in a Si(001) wafer covered by a Ni-doped SiO2 thin film
- Highly oriented NiSi2@Si thin-nanocomposite produced by solid state diffusion: Morphological and crystallographic characterization
- Formation of an extended CoSi2 thin nanohexagons array coherently buried in silicon single crystal
- Synchrotron radiation applied to real-time studies of the kinetics of growth of aluminum nitride thin multilayers
Informações sobre o DOI: 10.1016/j.radphyschem.2019.04.003 (Fonte: oaDOI API)
Download do texto completo
| Tipo | Nome | Link | |
|---|---|---|---|
 |
1-s2.0-S0969806X18311733-... | Direct link |
How to cite
A citação é gerada automaticamente e pode não estar totalmente de acordo com as normas
