Calculation of two-dimensional scattering patterns for oriented systems (2018)
- Authors:
- Autor USP: QUIVY, ALAIN ANDRE - IF
- Unidade: IF
- Subjects: FÍSICA; SEMICONDUTORES
- Agências de fomento:
- Language: Inglês
- Imprenta:
- Source:
- Título: Resumos
- Conference titles: Encontro de Outono
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ABNT
POÇAS, Luiz Carlos et al. Calculation of two-dimensional scattering patterns for oriented systems. 2018, Anais.. São Paulo: SBF, 2018. Disponível em: https://sec.sbfisica.org.br/eventos/enfmc/xli/sys/resumos/R0692-1.pdf. Acesso em: 22 jan. 2026. -
APA
Poças, L. C., Souza, M. R. de, Laureto, E., Fernandes, R. V., Daldin, M., Quivy, A. A., et al. (2018). Calculation of two-dimensional scattering patterns for oriented systems. In Resumos. São Paulo: SBF. Recuperado de https://sec.sbfisica.org.br/eventos/enfmc/xli/sys/resumos/R0692-1.pdf -
NLM
Poças LC, Souza MR de, Laureto E, Fernandes RV, Daldin M, Quivy AA, Lourenco SA, Silva SA. Calculation of two-dimensional scattering patterns for oriented systems [Internet]. Resumos. 2018 ;[citado 2026 jan. 22 ] Available from: https://sec.sbfisica.org.br/eventos/enfmc/xli/sys/resumos/R0692-1.pdf -
Vancouver
Poças LC, Souza MR de, Laureto E, Fernandes RV, Daldin M, Quivy AA, Lourenco SA, Silva SA. Calculation of two-dimensional scattering patterns for oriented systems [Internet]. Resumos. 2018 ;[citado 2026 jan. 22 ] Available from: https://sec.sbfisica.org.br/eventos/enfmc/xli/sys/resumos/R0692-1.pdf - Effect of electric field non-uniformity on the differences between I-V characteristics of QWIP devices fabricated on the same wafer
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