Experimental Comparison Between Trigate p-TFET and p-FinFET Analog Performance as a Function of Temperature (2013)
- Authors:
- USP affiliated authors: MARTINO, JOÃO ANTONIO - EP ; AGOPIAN, PAULA GHEDINI DER - EP
- Unidade: EP
- DOI: 10.1109/ted.2013.2267614
- Subjects: AVALIAÇÃO DE DESEMPENHO; TRANSISTORES
- Language: Inglês
- Source:
- Título: IEEE Transactions on Electron Devices
- Volume/Número/Paginação/Ano: v. 60, n. 8, p. 2493-2497, Aug. 2013
- Este artigo NÃO possui versão em acesso aberto
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Status: Nenhuma versão em acesso aberto identificada -
ABNT
AGOPIAN, Paula Ghedini Der et al. Experimental Comparison Between Trigate p-TFET and p-FinFET Analog Performance as a Function of Temperature. IEEE Transactions on Electron Devices, v. 60, n. 8, p. 2493-2497, 2013Tradução . . Disponível em: https://doi.org/10.1109/ted.2013.2267614. Acesso em: 11 mar. 2026. -
APA
Agopian, P. G. D., Simoen, E., Vandooren, A., Rooyackers, R., & Martino, J. A. (2013). Experimental Comparison Between Trigate p-TFET and p-FinFET Analog Performance as a Function of Temperature. IEEE Transactions on Electron Devices, 60( 8), 2493-2497. doi:10.1109/ted.2013.2267614 -
NLM
Agopian PGD, Simoen E, Vandooren A, Rooyackers R, Martino JA. Experimental Comparison Between Trigate p-TFET and p-FinFET Analog Performance as a Function of Temperature [Internet]. IEEE Transactions on Electron Devices. 2013 ; 60( 8): 2493-2497.[citado 2026 mar. 11 ] Available from: https://doi.org/10.1109/ted.2013.2267614 -
Vancouver
Agopian PGD, Simoen E, Vandooren A, Rooyackers R, Martino JA. Experimental Comparison Between Trigate p-TFET and p-FinFET Analog Performance as a Function of Temperature [Internet]. IEEE Transactions on Electron Devices. 2013 ; 60( 8): 2493-2497.[citado 2026 mar. 11 ] Available from: https://doi.org/10.1109/ted.2013.2267614 - Stress engineering and proton radiation influence on off-state leakage current in triple-gate SOI devices
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