Thermoluminescense and photoluminescence characterization of silicate glasses exposed to ionizing radiation (2012)
- Authors:
- USP affiliated authors: CHUBACI, JOSE FERNANDO DINIZ - IF ; MATSUOKA, MASAO - IF ; WATANABE, SHIGUEO - IF
- Unidade: IF
- Subjects: FÍSICA DA MATÉRIA CONDENSADA; FOTOLUMINESCÊNCIA
- Language: Inglês
- Imprenta:
- Publisher: SBF
- Publisher place: Águas de Lindóia
- Date published: 2012
- Source:
- Título do periódico: Resumo
- Conference titles: XXXV Encontro Nacional de Física da Matéria Condensada
-
ABNT
SOUZA, Pedro O. De; ROSA, Raffaela De; GUIMARÃES, Renato S.; et al. Thermoluminescense and photoluminescence characterization of silicate glasses exposed to ionizing radiation. Anais.. Águas de Lindóia: SBF, 2012. -
APA
Souza, P. O. D., Rosa, R. D., Guimarães, R. S., Chubaci, J. F. D., Gennari, R. F., Matsuoka, M., & Watanabe, S. (2012). Thermoluminescense and photoluminescence characterization of silicate glasses exposed to ionizing radiation. In Resumo. Águas de Lindóia: SBF. -
NLM
Souza POD, Rosa RD, Guimarães RS, Chubaci JFD, Gennari RF, Matsuoka M, Watanabe S. Thermoluminescense and photoluminescence characterization of silicate glasses exposed to ionizing radiation. Resumo. 2012 ; -
Vancouver
Souza POD, Rosa RD, Guimarães RS, Chubaci JFD, Gennari RF, Matsuoka M, Watanabe S. Thermoluminescense and photoluminescence characterization of silicate glasses exposed to ionizing radiation. Resumo. 2012 ; - Electrical and optical properties of aluminum oxide thin films produced by IBAD
- Production and photoluminescence characterization of silicate glasses exposed to ionizing radiation.
- Study and characterization of thin films of CeOx produced by ion beam assited deposition
- The end of Moore’s Law: alumina thin films produced by ion beam assisted deposition as gate oxide
- Thin film oxides produced by IBAD (ion beam assisted deposition)
- Bulk properties of InN films determined by experiments and theory
- Filmes finos de oxidos(HfO2, CeO2, TiO2) para dispositivos eletrônicos fabricados por IBAD (Ions Beam Assisted for Deposition)
- Production and characterization of high dieletric constant oxide thin films
- Caracterização de filmes finos de nitreto de índio para fabricação de sensores que operam na região do IR
- Formação de filmes finos de óxidos metálicos pela técnica IBAD (Ions Beam Assisted for Deposition)
How to cite
A citação é gerada automaticamente e pode não estar totalmente de acordo com as normas
