Metal-induced crystallization of Ni-doped amorphous si films (2005)
- Authors:
- Autor USP: ZANATTA, ANTONIO RICARDO - IFSC
- Unidade: IFSC
- Subjects: SEMICONDUTORES; FILMES FINOS
- Language: Inglês
- Imprenta:
- Source:
- Título: Books of Abstracts
- Conference titles: International Conference on Amorphous and Nanocrystalline Semiconductors
-
ABNT
FERRI, F. A. e CHAMBOULEYRON, I e ZANATTA, Antonio Ricardo. Metal-induced crystallization of Ni-doped amorphous si films. 2005, Anais.. Lisboa: Instituto de Física de São Carlos, Universidade de São Paulo, 2005. . Acesso em: 22 jan. 2026. -
APA
Ferri, F. A., Chambouleyron, I., & Zanatta, A. R. (2005). Metal-induced crystallization of Ni-doped amorphous si films. In Books of Abstracts. Lisboa: Instituto de Física de São Carlos, Universidade de São Paulo. -
NLM
Ferri FA, Chambouleyron I, Zanatta AR. Metal-induced crystallization of Ni-doped amorphous si films. Books of Abstracts. 2005 ;[citado 2026 jan. 22 ] -
Vancouver
Ferri FA, Chambouleyron I, Zanatta AR. Metal-induced crystallization of Ni-doped amorphous si films. Books of Abstracts. 2005 ;[citado 2026 jan. 22 ] - Erbium luminescence in a-Si : H
- Temperature-dependent Raman scattering of the Ge + GeOx system and its potential as an optical thermometer
- Influence of Ni concentration on the crystallization of amorphous Si films and on the development of different Ni-silicide phases
- Gradual and selective achievement of Rutile-TiO2 by thermal annealing amorphous TixOyNz films
- Influence of the Anatase and Rutile phases on the luminescent properties of rare-earth-doped TiO2 films
- A sensitive temperature probe based on Er3+-doped GeOx films
- Optical and micro-Raman characterizations of Co3O4 films aiming photovoltaic and photocatalytic applications
- A fast-reliable methodology to estimate the concentration of rutile or anatase phases of TiO2
- Self-organized nickel nanoparticles on nanostructured silicon substrate intermediated by a titanium oxynitride (TiNxOy) interface
- Assessing the amount of the anatase and rutile phases of TiO2 by optical reflectance measurements
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