Electrical characterization of thin nickel films obtained from electroless plating onto aluminum gate of MOS capacitors (2000)
- Authors:
- USP affiliated authors: SANTOS FILHO, SEBASTIÃO GOMES DOS - EP ; MARTINO, JOÃO ANTONIO - EP
- Unidade: EP
- Assunto: CIRCUITOS INTEGRADOS
- Language: Inglês
- Imprenta:
- Publisher: SBMicro/UA/UFRGS/UNICAMP/USP
- Publisher place: Manaus
- Date published: 2000
- Source:
- Título: SBMicro 2000 : proceedings
- Conference titles: International Conference on Microelectronics and Packaging
-
ABNT
NAVIA, Alan Rodrigo et al. Electrical characterization of thin nickel films obtained from electroless plating onto aluminum gate of MOS capacitors. 2000, Anais.. Manaus: SBMicro/UA/UFRGS/UNICAMP/USP, 2000. . Acesso em: 28 jan. 2026. -
APA
Navia, A. R., Sonnenberg, V., Marques, A. E. B., Santos Filho, S. G. dos, & Martino, J. A. (2000). Electrical characterization of thin nickel films obtained from electroless plating onto aluminum gate of MOS capacitors. In SBMicro 2000 : proceedings. Manaus: SBMicro/UA/UFRGS/UNICAMP/USP. -
NLM
Navia AR, Sonnenberg V, Marques AEB, Santos Filho SG dos, Martino JA. Electrical characterization of thin nickel films obtained from electroless plating onto aluminum gate of MOS capacitors. SBMicro 2000 : proceedings. 2000 ;[citado 2026 jan. 28 ] -
Vancouver
Navia AR, Sonnenberg V, Marques AEB, Santos Filho SG dos, Martino JA. Electrical characterization of thin nickel films obtained from electroless plating onto aluminum gate of MOS capacitors. SBMicro 2000 : proceedings. 2000 ;[citado 2026 jan. 28 ] - Physical and electrical characterization of thin nickel films obtained from electroless plating onto aluminum
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