Morphological characterization of electroless nickel films onto aluminum surfaces (2000)
- Authors:
- Autor USP: SANTOS FILHO, SEBASTIÃO GOMES DOS - EP
- Unidade: EP
- Assunto: CIRCUITOS INTEGRADOS
- Language: Inglês
- Imprenta:
- Publisher: SBMicro/UA/UFRGS/UNICAMP/USP
- Publisher place: Manaus
- Date published: 2000
- Source:
- Título: SBMicro 2000 : proceedings
- Conference titles: International Conference on Microelectronics and Packaging
-
ABNT
MARQUES, Angelo Eduardo Battistini e SANTOS FILHO, Sebastião Gomes dos. Morphological characterization of electroless nickel films onto aluminum surfaces. 2000, Anais.. Manaus: SBMicro/UA/UFRGS/UNICAMP/USP, 2000. . Acesso em: 28 dez. 2025. -
APA
Marques, A. E. B., & Santos Filho, S. G. dos. (2000). Morphological characterization of electroless nickel films onto aluminum surfaces. In SBMicro 2000 : proceedings. Manaus: SBMicro/UA/UFRGS/UNICAMP/USP. -
NLM
Marques AEB, Santos Filho SG dos. Morphological characterization of electroless nickel films onto aluminum surfaces. SBMicro 2000 : proceedings. 2000 ;[citado 2025 dez. 28 ] -
Vancouver
Marques AEB, Santos Filho SG dos. Morphological characterization of electroless nickel films onto aluminum surfaces. SBMicro 2000 : proceedings. 2000 ;[citado 2025 dez. 28 ] - Formation and stability of Ni(Pt)Si/Poly-Si layered structure
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