Near-exact two-dimensional mathematical model for pipe diffusion along dislocations (1995)
- Autor:
- Autor USP: BRAGA, NELSON LIEBENTRITT DE ALMEIDA - EP
- Unidade: EP
- Assunto: CIRCUITOS INTEGRADOS
- Language: Inglês
- Imprenta:
- Source:
- Título: Journal of Solid-State Devices and Circuits
- Volume/Número/Paginação/Ano: v.3 , n.1 , p.10-3, jul. 1995
-
ABNT
BRAGA, Nelson Liebentritt de Almeida. Near-exact two-dimensional mathematical model for pipe diffusion along dislocations. Journal of Solid-State Devices and Circuits, v. 3 , n. 1 , p. 10-3, 1995Tradução . . Acesso em: 23 jan. 2026. -
APA
Braga, N. L. de A. (1995). Near-exact two-dimensional mathematical model for pipe diffusion along dislocations. Journal of Solid-State Devices and Circuits, 3 ( 1 ), 10-3. -
NLM
Braga NL de A. Near-exact two-dimensional mathematical model for pipe diffusion along dislocations. Journal of Solid-State Devices and Circuits. 1995 ;3 ( 1 ): 10-3.[citado 2026 jan. 23 ] -
Vancouver
Braga NL de A. Near-exact two-dimensional mathematical model for pipe diffusion along dislocations. Journal of Solid-State Devices and Circuits. 1995 ;3 ( 1 ): 10-3.[citado 2026 jan. 23 ] - Enchanced diffusion of arsenic along misfit dislocation in epitaxial 'SI' / 'SI' (Ge )
- Dopant pipe diffusion along misfit dislocations in epitaxial 'SI' / 'SI' (Ge)
- Estudo teórico-experimental do efeito tiristor parasitário (Latch-up) em estruturas CMOS
- Analysis of process parameters in "Smart cut" SOI structure fabrication
- Formation of cylindrical n/p junction diodes by arsenic enhanced diffusion along interfacial misfit dislocations in p-type epitaxial Si/Si(Ge)
- Lattice heating and energy balance consideration on the I-V characteristics of submicrometer thin-film fully depleted SOI NMOS devices
- Regras de projeto para tecnologia CMOS
- On` the measurement of stripe temperatures during electromigration characterization by BEM. (em CD-Rom)
- Simulated and measured I-V characteristics of FD SOI-NMOS transistors modified by the self-heating effect. (em CD-Rom)
- Quantitative analysis of 'AS' and 'SB' pipe diffusion along misfit dislocation in epitaxial 'SI' / 'SI' (ge)
How to cite
A citação é gerada automaticamente e pode não estar totalmente de acordo com as normas