Dopant pipe diffusion along misfit dislocations in epitaxial 'SI' / 'SI' (Ge) (1994)
- Authors:
- Autor USP: BRAGA, NELSON LIEBENTRITT DE ALMEIDA - EP
- Unidade: EP
- Assunto: SEMICONDUTORES
- Language: Inglês
- Imprenta:
- Publisher: Sbmicro/Ufrj
- Publisher place: Rio de Janeiro
- Date published: 1994
- Source:
- Título: Anais
- Conference titles: Congresso da Sociedade Brasileira de Microeletronica
-
ABNT
BRAGA, Nelson Liebentritt de Almeida e ROZOGONYI, G A. Dopant pipe diffusion along misfit dislocations in epitaxial 'SI' / 'SI' (Ge). 1994, Anais.. Rio de Janeiro: Sbmicro/Ufrj, 1994. . Acesso em: 23 jan. 2026. -
APA
Braga, N. L. de A., & Rozogonyi, G. A. (1994). Dopant pipe diffusion along misfit dislocations in epitaxial 'SI' / 'SI' (Ge). In Anais. Rio de Janeiro: Sbmicro/Ufrj. -
NLM
Braga NL de A, Rozogonyi GA. Dopant pipe diffusion along misfit dislocations in epitaxial 'SI' / 'SI' (Ge). Anais. 1994 ;[citado 2026 jan. 23 ] -
Vancouver
Braga NL de A, Rozogonyi GA. Dopant pipe diffusion along misfit dislocations in epitaxial 'SI' / 'SI' (Ge). Anais. 1994 ;[citado 2026 jan. 23 ] - Near-exact two-dimensional mathematical model for pipe diffusion along dislocations
- Enchanced diffusion of arsenic along misfit dislocation in epitaxial 'SI' / 'SI' (Ge )
- Estudo teórico-experimental do efeito tiristor parasitário (Latch-up) em estruturas CMOS
- Analysis of process parameters in "Smart cut" SOI structure fabrication
- Formation of cylindrical n/p junction diodes by arsenic enhanced diffusion along interfacial misfit dislocations in p-type epitaxial Si/Si(Ge)
- Lattice heating and energy balance consideration on the I-V characteristics of submicrometer thin-film fully depleted SOI NMOS devices
- Regras de projeto para tecnologia CMOS
- On` the measurement of stripe temperatures during electromigration characterization by BEM. (em CD-Rom)
- Simulated and measured I-V characteristics of FD SOI-NMOS transistors modified by the self-heating effect. (em CD-Rom)
- Quantitative analysis of 'AS' and 'SB' pipe diffusion along misfit dislocation in epitaxial 'SI' / 'SI' (ge)
How to cite
A citação é gerada automaticamente e pode não estar totalmente de acordo com as normas