Line shape analysis of photoreflectance spectra from 'DELTA'-doped structures (1992)
- Authors:
- USP affiliated authors: LEITE, JOSE ROBERTO - IF ; MARTINS, JOSE MANUEL DE VASCONCELOS - IF ; SCOLFARO, LUISA MARIA RIBEIRO - IF
- Unidade: IF
- Assunto: MATÉRIA CONDENSADA
- Language: Inglês
- Imprenta:
- Source:
- Título: Superlattices and Microstructures
- Volume/Número/Paginação/Ano: v.12, n.2 , p.175-9, 1992
-
ABNT
ENDERLEIN, R et al. Line shape analysis of photoreflectance spectra from 'DELTA'-doped structures. Superlattices and Microstructures, v. 12, n. 2 , p. 175-9, 1992Tradução . . Acesso em: 11 mar. 2026. -
APA
Enderlein, R., Scolfaro, L. M. R., Martins, J. M. de V., & Leite, J. R. (1992). Line shape analysis of photoreflectance spectra from 'DELTA'-doped structures. Superlattices and Microstructures, 12( 2 ), 175-9. -
NLM
Enderlein R, Scolfaro LMR, Martins JM de V, Leite JR. Line shape analysis of photoreflectance spectra from 'DELTA'-doped structures. Superlattices and Microstructures. 1992 ;12( 2 ): 175-9.[citado 2026 mar. 11 ] -
Vancouver
Enderlein R, Scolfaro LMR, Martins JM de V, Leite JR. Line shape analysis of photoreflectance spectra from 'DELTA'-doped structures. Superlattices and Microstructures. 1992 ;12( 2 ): 175-9.[citado 2026 mar. 11 ] - Influence of electric fields in the 'SI' delta-doped 'GA''AS' self-consistent potential profile
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