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Artigo de periodico
Implications of size dispersion on X-ray scattering of crystalline nanoparticles: CeO2 as a case study (2024)
Valério, Adriana ; Trindade, Fabiane de Jesus ; Penacchio, Rafaela Felix da Silva ; Cisi, Bria; Damasceno, Sergio; Estradiote, Maurício Bastos ; Rodella, Cristiane Barbieri ; Ferlauto, Andre Santarosa ; Kycia, Stefan W ; Morelhão, Sergio Luiz
Source: Journal of Applied Crystallography. Unidade: IF
Subjects: ESPALHAMENTO DE RAIOS X A BAIXOS ÂNGULOS, NANOPARTÍCULAS
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ABNT
VALÉRIO, Adriana et al. Implications of size dispersion on X-ray scattering of crystalline nanoparticles: CeO2 as a case study. Journal of Applied Crystallography, v. 57, p. 793-807, 2024Tradução . . Disponível em: https://doi.org/10.1107/S1600576724003108. Acesso em: 18 out. 2024.
APA
Valério, A., Trindade, F. de J., Penacchio, R. F. da S., Cisi, B., Damasceno, S., Estradiote, M. B., et al. (2024). Implications of size dispersion on X-ray scattering of crystalline nanoparticles: CeO2 as a case study. Journal of Applied Crystallography, 57, 793-807. doi:10.1107/S1600576724003108
NLM
Valério A, Trindade F de J, Penacchio RF da S, Cisi B, Damasceno S, Estradiote MB, Rodella CB, Ferlauto AS, Kycia SW, Morelhão SL. Implications of size dispersion on X-ray scattering of crystalline nanoparticles: CeO2 as a case study [Internet]. Journal of Applied Crystallography. 2024 ; 57 793-807.[citado 2024 out. 18 ] Available from: https://doi.org/10.1107/S1600576724003108
Vancouver
Valério A, Trindade F de J, Penacchio RF da S, Cisi B, Damasceno S, Estradiote MB, Rodella CB, Ferlauto AS, Kycia SW, Morelhão SL. Implications of size dispersion on X-ray scattering of crystalline nanoparticles: CeO2 as a case study [Internet]. Journal of Applied Crystallography. 2024 ; 57 793-807.[citado 2024 out. 18 ] Available from: https://doi.org/10.1107/S1600576724003108
Relatorio tecnico
Proper usage of scherrer’s and guinier’s formulas in X-ray analysis of size distribution in systems of monocrystalline 'CE''O'IND.2' nanoparticles (2022)
Valério, Adriana ; Penacchio, Rafaela Felix da Silva ; Estradiote, Maurício Bastos ; Morelhão, Sergio Luiz
Unidade: IF
Subjects: NANOPARTÍCULAS, RAIOS X
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ABNT
VALÉRIO, Adriana et al. Proper usage of scherrer’s and guinier’s formulas in X-ray analysis of size distribution in systems of monocrystalline 'CE''O'IND.2' nanoparticles. . São Paulo: Instituto de Física, Universidade de São Paulo. Disponível em: https://arxiv.org/pdf/2203.00866.pdf. Acesso em: 18 out. 2024. , 2022
APA
Valério, A., Penacchio, R. F. da S., Estradiote, M. B., & Morelhão, S. L. (2022). Proper usage of scherrer’s and guinier’s formulas in X-ray analysis of size distribution in systems of monocrystalline 'CE''O'IND.2' nanoparticles. São Paulo: Instituto de Física, Universidade de São Paulo. Recuperado de https://arxiv.org/pdf/2203.00866.pdf
NLM
Valério A, Penacchio RF da S, Estradiote MB, Morelhão SL. Proper usage of scherrer’s and guinier’s formulas in X-ray analysis of size distribution in systems of monocrystalline 'CE''O'IND.2' nanoparticles [Internet]. 2022 ;[citado 2024 out. 18 ] Available from: https://arxiv.org/pdf/2203.00866.pdf
Vancouver
Valério A, Penacchio RF da S, Estradiote MB, Morelhão SL. Proper usage of scherrer’s and guinier’s formulas in X-ray analysis of size distribution in systems of monocrystalline 'CE''O'IND.2' nanoparticles [Internet]. 2022 ;[citado 2024 out. 18 ] Available from: https://arxiv.org/pdf/2203.00866.pdf
Artigo de periodico
A simple formula for determining nanoparticle size distribution by combining small-angle X-ray scattering and diffraction results (2022)
Sergio L. Morelhão ; Kycia, Stefan
Source: Acta Crystallographica Section A: Foundations and Advances. Unidade: IF
Subjects: FÍSICO-QUÍMICA, CRISTALOGRAFIA DE RAIOS X, NANOPARTÍCULAS, ESPALHAMENTO DE RAIOS X A BAIXOS ÂNGULOS, MATERIAIS NANOESTRUTURADOS
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ABNT
SERGIO L. MORELHÃO, e KYCIA, Stefan. A simple formula for determining nanoparticle size distribution by combining small-angle X-ray scattering and diffraction results. Acta Crystallographica Section A: Foundations and Advances, v. 78, n. 1, p. 459-462, 2022Tradução . . Disponível em: https://doi.org/10.1107/S2053273322007215. Acesso em: 18 out. 2024.
APA
Sergio L. Morelhão,, & Kycia, S. (2022). A simple formula for determining nanoparticle size distribution by combining small-angle X-ray scattering and diffraction results. Acta Crystallographica Section A: Foundations and Advances, 78( 1), 459-462. doi:10.1107/S2053273322007215
NLM
Sergio L. Morelhão, Kycia S. A simple formula for determining nanoparticle size distribution by combining small-angle X-ray scattering and diffraction results [Internet]. Acta Crystallographica Section A: Foundations and Advances. 2022 ; 78( 1): 459-462.[citado 2024 out. 18 ] Available from: https://doi.org/10.1107/S2053273322007215
Vancouver
Sergio L. Morelhão, Kycia S. A simple formula for determining nanoparticle size distribution by combining small-angle X-ray scattering and diffraction results [Internet]. Acta Crystallographica Section A: Foundations and Advances. 2022 ; 78( 1): 459-462.[citado 2024 out. 18 ] Available from: https://doi.org/10.1107/S2053273322007215
Relatorio tecnico
Intrinsic spatial resolution limit of the analyzer-based X-ray phase contrast imaging technique (2020)
Hönnicke, Marcelo G.; Morelhão, Sergio Luiz
Unidade: IF
Subjects: CRISTALOGRAFIA DE RAIOS X, RADIAÇÃO SINCROTRON, MATERIAIS NANOESTRUTURADOS, NANOPARTÍCULAS
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ABNT
HÖNNICKE, Marcelo G. e MORELHÃO, Sergio Luiz. Intrinsic spatial resolution limit of the analyzer-based X-ray phase contrast imaging technique. . São Paulo: Instituto de Física, Universidade de São Paulo. Disponível em: https://doi.org/10.1016/j.radphyschem.2019.04.023. Acesso em: 18 out. 2024. , 2020
APA
Hönnicke, M. G., & Morelhão, S. L. (2020). Intrinsic spatial resolution limit of the analyzer-based X-ray phase contrast imaging technique. São Paulo: Instituto de Física, Universidade de São Paulo. doi:10.1016/j.radphyschem.2019.04.023
NLM
Hönnicke MG, Morelhão SL. Intrinsic spatial resolution limit of the analyzer-based X-ray phase contrast imaging technique [Internet]. 2020 ;[citado 2024 out. 18 ] Available from: https://doi.org/10.1016/j.radphyschem.2019.04.023
Vancouver
Hönnicke MG, Morelhão SL. Intrinsic spatial resolution limit of the analyzer-based X-ray phase contrast imaging technique [Internet]. 2020 ;[citado 2024 out. 18 ] Available from: https://doi.org/10.1016/j.radphyschem.2019.04.023
Artigo de periodico
Intrinsic spatial resolution limit of the analyzer-based X-ray phase contrast imaging technique (2020)
Hönnicke, Marcelo G.; Morelhão, Sérgio L.
Source: Radiation Physics and Chemistry. Unidade: IF
Subjects: CRISTALOGRAFIA DE RAIOS X, RADIAÇÃO SINCROTRON, MATERIAIS NANOESTRUTURADOS, NANOPARTÍCULAS
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ABNT
HÖNNICKE, Marcelo G. e MORELHÃO, Sérgio L. Intrinsic spatial resolution limit of the analyzer-based X-ray phase contrast imaging technique. Radiation Physics and Chemistry, v. 167, 2020Tradução . . Disponível em: https://doi.org/10.1016/j.radphyschem.2019.04.023. Acesso em: 18 out. 2024.
APA
Hönnicke, M. G., & Morelhão, S. L. (2020). Intrinsic spatial resolution limit of the analyzer-based X-ray phase contrast imaging technique. Radiation Physics and Chemistry, 167. doi:10.1016/j.radphyschem.2019.04.023
NLM
Hönnicke MG, Morelhão SL. Intrinsic spatial resolution limit of the analyzer-based X-ray phase contrast imaging technique [Internet]. Radiation Physics and Chemistry. 2020 ; 167[citado 2024 out. 18 ] Available from: https://doi.org/10.1016/j.radphyschem.2019.04.023
Vancouver
Hönnicke MG, Morelhão SL. Intrinsic spatial resolution limit of the analyzer-based X-ray phase contrast imaging technique [Internet]. Radiation Physics and Chemistry. 2020 ; 167[citado 2024 out. 18 ] Available from: https://doi.org/10.1016/j.radphyschem.2019.04.023
Artigo de periodico
Controlled Formation and Growth Kinetics of Phase-Pure, Crystalline BiFeO3 Nanoparticles (2020)
Cabral, Alex J Freitas; Valerio, Adriana; Morelhão, Sergio Luiz ; Checca, Noemi R; Soares, Marcio M; Remedios, Claudio M R
Source: Crystal Growth Design. Unidade: IF
Assunto: NANOPARTÍCULAS
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ABNT
CABRAL, Alex J Freitas et al. Controlled Formation and Growth Kinetics of Phase-Pure, Crystalline BiFeO3 Nanoparticles. Crystal Growth Design, v. 20, p. 600−607, 2020Tradução . . Disponível em: https://doi.org/10.1021/acs.cgd.9b00896. Acesso em: 18 out. 2024.
APA
Cabral, A. J. F., Valerio, A., Morelhão, S. L., Checca, N. R., Soares, M. M., & Remedios, C. M. R. (2020). Controlled Formation and Growth Kinetics of Phase-Pure, Crystalline BiFeO3 Nanoparticles. Crystal Growth Design, 20, 600−607. doi:10.1021/acs.cgd.9b00896
NLM
Cabral AJF, Valerio A, Morelhão SL, Checca NR, Soares MM, Remedios CMR. Controlled Formation and Growth Kinetics of Phase-Pure, Crystalline BiFeO3 Nanoparticles [Internet]. Crystal Growth Design. 2020 ; 20 600−607.[citado 2024 out. 18 ] Available from: https://doi.org/10.1021/acs.cgd.9b00896
Vancouver
Cabral AJF, Valerio A, Morelhão SL, Checca NR, Soares MM, Remedios CMR. Controlled Formation and Growth Kinetics of Phase-Pure, Crystalline BiFeO3 Nanoparticles [Internet]. Crystal Growth Design. 2020 ; 20 600−607.[citado 2024 out. 18 ] Available from: https://doi.org/10.1021/acs.cgd.9b00896
Relatorio tecnico
Usage of scherrer's formula in X-ray di raction analysis of size distribution in systems of monocrystalline nanoparticles (2019)
Valério, Adriana; Morelhão, Sergio Luiz
Unidade: IF
Subjects: NANOPARTÍCULAS, RAIOS X
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ABNT
VALÉRIO, Adriana e MORELHÃO, Sergio Luiz. Usage of scherrer's formula in X-ray di raction analysis of size distribution in systems of monocrystalline nanoparticles. . São Paulo: Instituto de Física, Universidade de São Paulo. Disponível em: https://arxiv.org/abs/1911.00701. Acesso em: 18 out. 2024. , 2019
APA
Valério, A., & Morelhão, S. L. (2019). Usage of scherrer's formula in X-ray di raction analysis of size distribution in systems of monocrystalline nanoparticles. São Paulo: Instituto de Física, Universidade de São Paulo. Recuperado de https://arxiv.org/abs/1911.00701
NLM
Valério A, Morelhão SL. Usage of scherrer's formula in X-ray di raction analysis of size distribution in systems of monocrystalline nanoparticles [Internet]. 2019 ;[citado 2024 out. 18 ] Available from: https://arxiv.org/abs/1911.00701
Vancouver
Valério A, Morelhão SL. Usage of scherrer's formula in X-ray di raction analysis of size distribution in systems of monocrystalline nanoparticles [Internet]. 2019 ;[citado 2024 out. 18 ] Available from: https://arxiv.org/abs/1911.00701
Relatorio tecnico
Lateral lattice coherence lengths in thin lms of bismuth telluride topological insulators, with overview on polarization factors for X-ray dynamical di raction in monochromator crystals (2019)
Morelhão, Sergio Luiz ; Kycia, Stefan; Netzke, Samuel; Fornari, Celso I.; Rappl, Paulo H. O.
Unidade: IF
Subjects: NANOPARTÍCULAS, RAIOS X
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ABNT
MORELHÃO, Sergio Luiz et al. Lateral lattice coherence lengths in thin lms of bismuth telluride topological insulators, with overview on polarization factors for X-ray dynamical di raction in monochromator crystals. . São Paulo: Instituto de Física, Universidade de São Paulo. Disponível em: https://arxiv.org/abs/1911.00396. Acesso em: 18 out. 2024. , 2019
APA
Morelhão, S. L., Kycia, S., Netzke, S., Fornari, C. I., & Rappl, P. H. O. (2019). Lateral lattice coherence lengths in thin lms of bismuth telluride topological insulators, with overview on polarization factors for X-ray dynamical di raction in monochromator crystals. São Paulo: Instituto de Física, Universidade de São Paulo. Recuperado de https://arxiv.org/abs/1911.00396
NLM
Morelhão SL, Kycia S, Netzke S, Fornari CI, Rappl PHO. Lateral lattice coherence lengths in thin lms of bismuth telluride topological insulators, with overview on polarization factors for X-ray dynamical di raction in monochromator crystals [Internet]. 2019 ;[citado 2024 out. 18 ] Available from: https://arxiv.org/abs/1911.00396
Vancouver
Morelhão SL, Kycia S, Netzke S, Fornari CI, Rappl PHO. Lateral lattice coherence lengths in thin lms of bismuth telluride topological insulators, with overview on polarization factors for X-ray dynamical di raction in monochromator crystals [Internet]. 2019 ;[citado 2024 out. 18 ] Available from: https://arxiv.org/abs/1911.00396
Artigo de periodico
Strain effects on the magnetic order of epitaxial 'FE''RH' thin films (2018)
Kumar, H.; Kycia, S.; Montellano, I. M.; Alvarez, N. R.; Alejandro, G.; Butera, A.; Cornejo, Daniel Reinaldo; Morelhao, Sergio Luiz
Source: Journal of Applied Physics. Unidade: IF
Subjects: SUPERCONDUTIVIDADE, FERROMAGNETISMO, NANOPARTÍCULAS
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ABNT
KUMAR, H. et al. Strain effects on the magnetic order of epitaxial 'FE''RH' thin films. Journal of Applied Physics, v. 124, n. 8, p. 085306, 2018Tradução . . Disponível em: https://aip.scitation.org/doi/10.1063/1.5020160. Acesso em: 18 out. 2024.
APA
Kumar, H., Kycia, S., Montellano, I. M., Alvarez, N. R., Alejandro, G., Butera, A., et al. (2018). Strain effects on the magnetic order of epitaxial 'FE''RH' thin films. Journal of Applied Physics, 124( 8), 085306. doi:10.1063/1.5020160
NLM
Kumar H, Kycia S, Montellano IM, Alvarez NR, Alejandro G, Butera A, Cornejo DR, Morelhao SL. Strain effects on the magnetic order of epitaxial 'FE''RH' thin films [Internet]. Journal of Applied Physics. 2018 ; 124( 8): 085306.[citado 2024 out. 18 ] Available from: https://aip.scitation.org/doi/10.1063/1.5020160
Vancouver
Kumar H, Kycia S, Montellano IM, Alvarez NR, Alejandro G, Butera A, Cornejo DR, Morelhao SL. Strain effects on the magnetic order of epitaxial 'FE''RH' thin films [Internet]. Journal of Applied Physics. 2018 ; 124( 8): 085306.[citado 2024 out. 18 ] Available from: https://aip.scitation.org/doi/10.1063/1.5020160
Trabalho de evento-resumo
How phase measurements can change X-ray crystallography (2014)
Morelhão, Sérgio Luiz; Remedios, C.; Guzzo, C; Amirkhanyan, Z.
Source: Book of Abstracts. Conference titles: (Congress and General Assembly of the International Union of Crystallography. Unidade: IF
Subjects: NANOPARTÍCULAS, CRISTALOGRAFIA
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ABNT
MORELHÃO, Sérgio Luiz et al. How phase measurements can change X-ray crystallography. 2014, Anais.. Montreal: Instituto de Física, Universidade de São Paulo, 2014. Disponível em: http://asp-us.secure-zone.net/v2/144/235/1343/IUCr-2014-Book-of-Abstracts.pdf. Acesso em: 18 out. 2024.
APA
Morelhão, S. L., Remedios, C., Guzzo, C., & Amirkhanyan, Z. (2014). How phase measurements can change X-ray crystallography. In Book of Abstracts. Montreal: Instituto de Física, Universidade de São Paulo. Recuperado de http://asp-us.secure-zone.net/v2/144/235/1343/IUCr-2014-Book-of-Abstracts.pdf
NLM
Morelhão SL, Remedios C, Guzzo C, Amirkhanyan Z. How phase measurements can change X-ray crystallography [Internet]. Book of Abstracts. 2014 ;[citado 2024 out. 18 ] Available from: http://asp-us.secure-zone.net/v2/144/235/1343/IUCr-2014-Book-of-Abstracts.pdf
Vancouver
Morelhão SL, Remedios C, Guzzo C, Amirkhanyan Z. How phase measurements can change X-ray crystallography [Internet]. Book of Abstracts. 2014 ;[citado 2024 out. 18 ] Available from: http://asp-us.secure-zone.net/v2/144/235/1343/IUCr-2014-Book-of-Abstracts.pdf

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