Source: Proceedings. Conference titles: Conference of the Brazilian Microelectronics Society. Unidade: EP
Subjects: CIRCUITOS INTEGRADOS, SEMICONDUTORES
ABNT
BRUNETTI, Cláudia e BRAGA, Nelson Liebentritt de Almeida e ZASNICOFF, Luiz Sergio. Simulated and measured I-V characteristic of FD SOI-NMOS transistors modified by the self-heating effect. (em CD-Rom). 1997, Anais.. Itajubá: SBMICRO/EFEI, 1997. . Acesso em: 18 out. 2024.APA
Brunetti, C., Braga, N. L. de A., & Zasnicoff, L. S. (1997). Simulated and measured I-V characteristic of FD SOI-NMOS transistors modified by the self-heating effect. (em CD-Rom). In Proceedings. Itajubá: SBMICRO/EFEI.NLM
Brunetti C, Braga NL de A, Zasnicoff LS. Simulated and measured I-V characteristic of FD SOI-NMOS transistors modified by the self-heating effect. (em CD-Rom). Proceedings. 1997 ;[citado 2024 out. 18 ]Vancouver
Brunetti C, Braga NL de A, Zasnicoff LS. Simulated and measured I-V characteristic of FD SOI-NMOS transistors modified by the self-heating effect. (em CD-Rom). Proceedings. 1997 ;[citado 2024 out. 18 ]