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Filtros : "Sonnenberg, Victor" "2005" Limpar

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  • Trabalho de evento

    Simple method to determine the poly gate doping concentration based on poly depletion effect (2005)

    Rodrigues, Michele; Sonnenberg, Victor ; Martino, João Antonio

    Source: Proceedings v. 2005-08. Microelectronics Technology and Devices SBMICRO 2005. Conference titles: International Symposium on Microelectronics Technology and Devices SBMICRO. Unidade: EP

    Assunto: MICROELETRÔNICA

    How to cite
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    • ABNT

      RODRIGUES, Michele e SONNENBERG, Victor e MARTINO, João Antonio. Simple method to determine the poly gate doping concentration based on poly depletion effect. 2005, Anais.. Pennington: The Electrochemical Society, 2005. . Acesso em: 16 nov. 2024.

    • APA

      Rodrigues, M., Sonnenberg, V., & Martino, J. A. (2005). Simple method to determine the poly gate doping concentration based on poly depletion effect. In Proceedings v. 2005-08. Microelectronics Technology and Devices SBMICRO 2005. Pennington: The Electrochemical Society.

    • NLM

      Rodrigues M, Sonnenberg V, Martino JA. Simple method to determine the poly gate doping concentration based on poly depletion effect. Proceedings v. 2005-08. Microelectronics Technology and Devices SBMICRO 2005. 2005 ;[citado 2024 nov. 16 ]

    • Vancouver

      Rodrigues M, Sonnenberg V, Martino JA. Simple method to determine the poly gate doping concentration based on poly depletion effect. Proceedings v. 2005-08. Microelectronics Technology and Devices SBMICRO 2005. 2005 ;[citado 2024 nov. 16 ]

  • Artigo de periodico

    SOI technology characterization using SOI-MOS capacitor (2005)

    Sonnenberg, Victor ; Martino, João Antonio

    Source: Solid-State Electronics. Unidade: EP

    Assunto: CIRCUITOS INTEGRADOS MOS

    Acesso à fonteDOIHow to cite
    A citação é gerada automaticamente e pode não estar totalmente de acordo com as normas

    • ABNT

      SONNENBERG, Victor e MARTINO, João Antonio. SOI technology characterization using SOI-MOS capacitor. Solid-State Electronics, 2005Tradução . . Disponível em: https://doi.org/10.1016/j.sse.2004.06.010. Acesso em: 16 nov. 2024.

    • APA

      Sonnenberg, V., & Martino, J. A. (2005). SOI technology characterization using SOI-MOS capacitor. Solid-State Electronics. doi:10.1016/j.sse.2004.06.010

    • NLM

      Sonnenberg V, Martino JA. SOI technology characterization using SOI-MOS capacitor [Internet]. Solid-State Electronics. 2005 ;[citado 2024 nov. 16 ] Available from: https://doi.org/10.1016/j.sse.2004.06.010

    • Vancouver

      Sonnenberg V, Martino JA. SOI technology characterization using SOI-MOS capacitor [Internet]. Solid-State Electronics. 2005 ;[citado 2024 nov. 16 ] Available from: https://doi.org/10.1016/j.sse.2004.06.010
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