Simple method to extract the length dependent mobility degradation factor at 77 K (1997)
Nicolett, Aparecido Sirley; Martino, João Antonio 
; Simoen, Eddy ; Claeys, Cor
Source: 4. Symposium on Low Temperature Electronics and High Temperature Superconductivity: proceedings. Conference titles: Symposium Low Temperature Electronics and High Temperature Superconductivity. Unidade: EP
Subjects: CIRCUITOS INTEGRADOS, MICROELETRÔNICA
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NICOLETT, Aparecido Sirley et al. Simple method to extract the length dependent mobility degradation factor at 77 K. 4. Symposium on Low Temperature Electronics and High Temperature Superconductivity: proceedings. Tradução . Pennington: The Electrochemical Society, 1997. . . Acesso em: 13 set. 2024.APA
Nicolett, A. S., Martino, J. A., Simoen, E., & Claeys, C. (1997). Simple method to extract the length dependent mobility degradation factor at 77 K. In 4. Symposium on Low Temperature Electronics and High Temperature Superconductivity: proceedings. Pennington: The Electrochemical Society.NLM
Nicolett AS, Martino JA, Simoen E, Claeys C. Simple method to extract the length dependent mobility degradation factor at 77 K. In: 4. Symposium on Low Temperature Electronics and High Temperature Superconductivity: proceedings. Pennington: The Electrochemical Society; 1997. [citado 2024 set. 13 ]Vancouver
Nicolett AS, Martino JA, Simoen E, Claeys C. Simple method to extract the length dependent mobility degradation factor at 77 K. In: 4. Symposium on Low Temperature Electronics and High Temperature Superconductivity: proceedings. Pennington: The Electrochemical Society; 1997. [citado 2024 set. 13 ]
