Source: Microelectronics technology and devices, SBMicro. Conference titles: International Symposium on Microelectronics Technology and Devices. Unidade: EP
Assunto: MICROELETRÔNICA
ABNT
CAÑO DE ANDRADE, Maria Glória et al. Analog performance at room and low temperature of triple-gate devices: Bulk, DTMOS, BOI and SOI. 2012, Anais.. Pennington: Escola Politécnica, Universidade de São Paulo, 2012. Disponível em: https://doi.org/10.1149/04901.0111ecst. Acesso em: 30 ago. 2024.APA
Caño de Andrade, M. G., Martino, J. A., Simoen, E., & Claeys, C. (2012). Analog performance at room and low temperature of triple-gate devices: Bulk, DTMOS, BOI and SOI. In Microelectronics technology and devices, SBMicro. Pennington: Escola Politécnica, Universidade de São Paulo. doi:10.1149/04901.0111ecstNLM
Caño de Andrade MG, Martino JA, Simoen E, Claeys C. Analog performance at room and low temperature of triple-gate devices: Bulk, DTMOS, BOI and SOI [Internet]. Microelectronics technology and devices, SBMicro. 2012 ;[citado 2024 ago. 30 ] Available from: https://doi.org/10.1149/04901.0111ecstVancouver
Caño de Andrade MG, Martino JA, Simoen E, Claeys C. Analog performance at room and low temperature of triple-gate devices: Bulk, DTMOS, BOI and SOI [Internet]. Microelectronics technology and devices, SBMicro. 2012 ;[citado 2024 ago. 30 ] Available from: https://doi.org/10.1149/04901.0111ecst