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Artigo de periodico
A simple technique to reduce the influence of the series resistance on the BULK and SOI MOSFET parameter extraction (1997)
Nicolett, Aparecido Sirley; Martino, João Antonio
Source: Journal of Solid-State Devices and Circuits. Unidade: EP
Assunto: CIRCUITOS INTEGRADOS
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ABNT
NICOLETT, Aparecido Sirley e MARTINO, João Antonio. A simple technique to reduce the influence of the series resistance on the BULK and SOI MOSFET parameter extraction. Journal of Solid-State Devices and Circuits, v. 5, n. 1, p. 5-8, 1997Tradução . . Acesso em: 06 nov. 2024.
APA
Nicolett, A. S., & Martino, J. A. (1997). A simple technique to reduce the influence of the series resistance on the BULK and SOI MOSFET parameter extraction. Journal of Solid-State Devices and Circuits, 5( 1), 5-8.
NLM
Nicolett AS, Martino JA. A simple technique to reduce the influence of the series resistance on the BULK and SOI MOSFET parameter extraction. Journal of Solid-State Devices and Circuits. 1997 ;5( 1): 5-8.[citado 2024 nov. 06 ]
Vancouver
Nicolett AS, Martino JA. A simple technique to reduce the influence of the series resistance on the BULK and SOI MOSFET parameter extraction. Journal of Solid-State Devices and Circuits. 1997 ;5( 1): 5-8.[citado 2024 nov. 06 ]
Artigo de periodico
Finite element analysis of the skin-effect in damper bars of a synchronous machine (1997)
Nabeta, Silvio Ikuyo ; Foggia, Albert; Coulomb, Jean-Louis; Reyne, Gilbert
Source: IEEE Transactions on Magnetics. Unidade: EP
Assunto: MÁQUINAS SÍNCRONAS
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ABNT
NABETA, Silvio Ikuyo et al. Finite element analysis of the skin-effect in damper bars of a synchronous machine. IEEE Transactions on Magnetics, v. 33, n. 2, p. 2065-2068, 1997Tradução . . Disponível em: https://doi.org/10.1109/20.582722. Acesso em: 06 nov. 2024.
APA
Nabeta, S. I., Foggia, A., Coulomb, J. -L., & Reyne, G. (1997). Finite element analysis of the skin-effect in damper bars of a synchronous machine. IEEE Transactions on Magnetics, 33( 2), 2065-2068. doi:10.1109/20.582722
NLM
Nabeta SI, Foggia A, Coulomb J-L, Reyne G. Finite element analysis of the skin-effect in damper bars of a synchronous machine [Internet]. IEEE Transactions on Magnetics. 1997 ; 33( 2): 2065-2068.[citado 2024 nov. 06 ] Available from: https://doi.org/10.1109/20.582722
Vancouver
Nabeta SI, Foggia A, Coulomb J-L, Reyne G. Finite element analysis of the skin-effect in damper bars of a synchronous machine [Internet]. IEEE Transactions on Magnetics. 1997 ; 33( 2): 2065-2068.[citado 2024 nov. 06 ] Available from: https://doi.org/10.1109/20.582722
Artigo de periodico
Analytical modeling of the substrate effect on accumulation-mode SOI pMOSFETs at room temperature and at 77k (1997)
Pavanello, Marcelo Antonio ; Martino, João Antonio ; Colinge, Jean-Pierre
Source: Microelectronic Engineering. Unidade: EP
Assunto: MICROELETRÔNICA
A citação é gerada automaticamente e pode não estar totalmente de acordo com as normas
ABNT
PAVANELLO, Marcelo Antonio e MARTINO, João Antonio e COLINGE, Jean-Pierre. Analytical modeling of the substrate effect on accumulation-mode SOI pMOSFETs at room temperature and at 77k. Microelectronic Engineering, v. 36, n. 1-4, p. 375-378, 1997Tradução . . Disponível em: https://doi.org/10.1016/s0167-9317(97)00083-x. Acesso em: 06 nov. 2024.
APA
Pavanello, M. A., Martino, J. A., & Colinge, J. -P. (1997). Analytical modeling of the substrate effect on accumulation-mode SOI pMOSFETs at room temperature and at 77k. Microelectronic Engineering, 36( 1-4), 375-378. doi:10.1016/s0167-9317(97)00083-x
NLM
Pavanello MA, Martino JA, Colinge J-P. Analytical modeling of the substrate effect on accumulation-mode SOI pMOSFETs at room temperature and at 77k [Internet]. Microelectronic Engineering. 1997 ; 36( 1-4): 375-378.[citado 2024 nov. 06 ] Available from: https://doi.org/10.1016/s0167-9317(97)00083-x
Vancouver
Pavanello MA, Martino JA, Colinge J-P. Analytical modeling of the substrate effect on accumulation-mode SOI pMOSFETs at room temperature and at 77k [Internet]. Microelectronic Engineering. 1997 ; 36( 1-4): 375-378.[citado 2024 nov. 06 ] Available from: https://doi.org/10.1016/s0167-9317(97)00083-x
Artigo de periodico
Quadratic optimal control for discrete-time infinite-dimensional stochastic bilinear systems (1997)
Costa, Oswaldo Luiz do Valle ; Kubrusly, C. S.
Source: IMA Journal of Mathematical Control & Information. Unidade: EP
Subjects: SISTEMAS DISCRETOS, TEORIA DE SISTEMAS E CONTROLE
A citação é gerada automaticamente e pode não estar totalmente de acordo com as normas
ABNT
COSTA, Oswaldo Luiz do Valle e KUBRUSLY, C. S. Quadratic optimal control for discrete-time infinite-dimensional stochastic bilinear systems. IMA Journal of Mathematical Control & Information, v. 14, n. 4, p. 385-399, 1997Tradução . . Disponível em: https://doi.org/10.1093/imamci/14.4.385. Acesso em: 06 nov. 2024.
APA
Costa, O. L. do V., & Kubrusly, C. S. (1997). Quadratic optimal control for discrete-time infinite-dimensional stochastic bilinear systems. IMA Journal of Mathematical Control & Information, 14( 4), 385-399. doi:10.1093/imamci/14.4.385
NLM
Costa OL do V, Kubrusly CS. Quadratic optimal control for discrete-time infinite-dimensional stochastic bilinear systems [Internet]. IMA Journal of Mathematical Control & Information. 1997 ; 14( 4): 385-399.[citado 2024 nov. 06 ] Available from: https://doi.org/10.1093/imamci/14.4.385
Vancouver
Costa OL do V, Kubrusly CS. Quadratic optimal control for discrete-time infinite-dimensional stochastic bilinear systems [Internet]. IMA Journal of Mathematical Control & Information. 1997 ; 14( 4): 385-399.[citado 2024 nov. 06 ] Available from: https://doi.org/10.1093/imamci/14.4.385
Artigo de periodico
Mechanisms of surface roughness induced in silicon by fluorine containing plasmas (1997)
Mansano, Ronaldo Domingues ; Verdonck, Patrick Bernard; Maciel, Homero Santiago
Source: Vaccum. Unidade: EP
Assunto: CIRCUITOS INTEGRADOS
A citação é gerada automaticamente e pode não estar totalmente de acordo com as normas
ABNT
MANSANO, Ronaldo Domingues e VERDONCK, Patrick Bernard e MACIEL, Homero Santiago. Mechanisms of surface roughness induced in silicon by fluorine containing plasmas. Vaccum, v. 48, n. 7-9, p. 677-679, 1997Tradução . . Disponível em: https://doi.org/10.1016/s0042-207x(97)00067-5. Acesso em: 06 nov. 2024.
APA
Mansano, R. D., Verdonck, P. B., & Maciel, H. S. (1997). Mechanisms of surface roughness induced in silicon by fluorine containing plasmas. Vaccum, 48( 7-9), 677-679. doi:10.1016/s0042-207x(97)00067-5
NLM
Mansano RD, Verdonck PB, Maciel HS. Mechanisms of surface roughness induced in silicon by fluorine containing plasmas [Internet]. Vaccum. 1997 ; 48( 7-9): 677-679.[citado 2024 nov. 06 ] Available from: https://doi.org/10.1016/s0042-207x(97)00067-5
Vancouver
Mansano RD, Verdonck PB, Maciel HS. Mechanisms of surface roughness induced in silicon by fluorine containing plasmas [Internet]. Vaccum. 1997 ; 48( 7-9): 677-679.[citado 2024 nov. 06 ] Available from: https://doi.org/10.1016/s0042-207x(97)00067-5

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