Filtros : "IFSC031" "Suiça" Removido: "Dagli, Maria Lúcia Zaidan" Limpar

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  • Source: Materials Chemistry and Physics. Unidade: IFSC

    Subjects: ESPECTROSCOPIA RAMAN, FILMES FINOS

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    • ABNT

      ZANATTA, Antonio Ricardo e OLIVEIRA JÚNIOR, Myriano Henriques de e MARQUES, Francisco das Chagas. Raman scattering spectroscopy of micrometer-sized carbon serpentines. Materials Chemistry and Physics, v. 319, p. 129343-1-129343-6 + supplementary data, 2024Tradução . . Disponível em: https://doi.org/10.1016/j.matchemphys.2024.129343. Acesso em: 15 nov. 2024.
    • APA

      Zanatta, A. R., Oliveira Júnior, M. H. de, & Marques, F. das C. (2024). Raman scattering spectroscopy of micrometer-sized carbon serpentines. Materials Chemistry and Physics, 319, 129343-1-129343-6 + supplementary data. doi:10.1016/j.matchemphys.2024.129343
    • NLM

      Zanatta AR, Oliveira Júnior MH de, Marques F das C. Raman scattering spectroscopy of micrometer-sized carbon serpentines [Internet]. Materials Chemistry and Physics. 2024 ; 319 129343-1-129343-6 + supplementary data.[citado 2024 nov. 15 ] Available from: https://doi.org/10.1016/j.matchemphys.2024.129343
    • Vancouver

      Zanatta AR, Oliveira Júnior MH de, Marques F das C. Raman scattering spectroscopy of micrometer-sized carbon serpentines [Internet]. Materials Chemistry and Physics. 2024 ; 319 129343-1-129343-6 + supplementary data.[citado 2024 nov. 15 ] Available from: https://doi.org/10.1016/j.matchemphys.2024.129343
  • Source: Thin Solid Films. Unidade: IFSC

    Subjects: FILMES FINOS, DIFRAÇÃO POR RAIOS X

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      AZEVEDO NETO, Nilton Francelosi et al. The role of the substrate on the structure of reactive sputtered Co3O4: from polycrystalline to highly oriented films. Thin Solid Films, v. 782, p. 140040-1-140040-7, 2023Tradução . . Disponível em: https://doi.org/10.1016/j.tsf.2023.140040. Acesso em: 15 nov. 2024.
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      Azevedo Neto, N. F., Calligaris, G. A., Affonço, L. J., Zanatta, A. R., Soares, M. M., & Silva, J. H. D. da. (2023). The role of the substrate on the structure of reactive sputtered Co3O4: from polycrystalline to highly oriented films. Thin Solid Films, 782, 140040-1-140040-7. doi:10.1016/j.tsf.2023.140040
    • NLM

      Azevedo Neto NF, Calligaris GA, Affonço LJ, Zanatta AR, Soares MM, Silva JHD da. The role of the substrate on the structure of reactive sputtered Co3O4: from polycrystalline to highly oriented films [Internet]. Thin Solid Films. 2023 ; 782 140040-1-140040-7.[citado 2024 nov. 15 ] Available from: https://doi.org/10.1016/j.tsf.2023.140040
    • Vancouver

      Azevedo Neto NF, Calligaris GA, Affonço LJ, Zanatta AR, Soares MM, Silva JHD da. The role of the substrate on the structure of reactive sputtered Co3O4: from polycrystalline to highly oriented films [Internet]. Thin Solid Films. 2023 ; 782 140040-1-140040-7.[citado 2024 nov. 15 ] Available from: https://doi.org/10.1016/j.tsf.2023.140040
  • Source: Materials Chemistry and Physics. Unidade: IFSC

    Subjects: GERMÂNIO, ESPECTROSCOPIA RAMAN, SEMICONDUTORES

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      ZANATTA, Antonio Ricardo. The role of tin atoms on the crystallization of amorphous germanium films. Materials Chemistry and Physics, v. 306, p. 128045-1-128045-7 + supplementary data, 2023Tradução . . Disponível em: https://doi.org/10.1016/j.matchemphys.2023.128045. Acesso em: 15 nov. 2024.
    • APA

      Zanatta, A. R. (2023). The role of tin atoms on the crystallization of amorphous germanium films. Materials Chemistry and Physics, 306, 128045-1-128045-7 + supplementary data. doi:10.1016/j.matchemphys.2023.128045
    • NLM

      Zanatta AR. The role of tin atoms on the crystallization of amorphous germanium films [Internet]. Materials Chemistry and Physics. 2023 ; 306 128045-1-128045-7 + supplementary data.[citado 2024 nov. 15 ] Available from: https://doi.org/10.1016/j.matchemphys.2023.128045
    • Vancouver

      Zanatta AR. The role of tin atoms on the crystallization of amorphous germanium films [Internet]. Materials Chemistry and Physics. 2023 ; 306 128045-1-128045-7 + supplementary data.[citado 2024 nov. 15 ] Available from: https://doi.org/10.1016/j.matchemphys.2023.128045
  • Source: Journal of Materials Processing Technology. Unidade: IFSC

    Subjects: FILMES FINOS, FERROMAGNETISMO, DIELÉTRICOS (PROPRIEDADES), BÁRIO, TITÂNIO, CÁLCIO, NANOTECNOLOGIA

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    • ABNT

      ANTONELLI, Eduardo et al. Electrophoretic deposition of 'Ba IND.0.77''Ca IND.0.23'Ti'O IND.3' nanopowders. Journal of Materials Processing Technology, v. 203, n. 1-3, p. 526-531, 2008Tradução . . Acesso em: 15 nov. 2024.
    • APA

      Antonelli, E., Silva, R. S., De Vicente, F. S., Zanatta, A. R., & Hernandes, A. C. (2008). Electrophoretic deposition of 'Ba IND.0.77''Ca IND.0.23'Ti'O IND.3' nanopowders. Journal of Materials Processing Technology, 203( 1-3), 526-531.
    • NLM

      Antonelli E, Silva RS, De Vicente FS, Zanatta AR, Hernandes AC. Electrophoretic deposition of 'Ba IND.0.77''Ca IND.0.23'Ti'O IND.3' nanopowders. Journal of Materials Processing Technology. 2008 ; 203( 1-3): 526-531.[citado 2024 nov. 15 ]
    • Vancouver

      Antonelli E, Silva RS, De Vicente FS, Zanatta AR, Hernandes AC. Electrophoretic deposition of 'Ba IND.0.77''Ca IND.0.23'Ti'O IND.3' nanopowders. Journal of Materials Processing Technology. 2008 ; 203( 1-3): 526-531.[citado 2024 nov. 15 ]
  • Source: Defect and Diffusion Forum. Unidades: EESC, IFSC

    Subjects: SILICONE, ESPECTROSCOPIA RAMAN, MUDANÇA DE FASE

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    • ABNT

      PIZANI, Paulo Sérgio e JASINEVICIUS, Renato Goulart e ZANATTA, Ricardo Antonio. Non-hydrostatic pressure induced structural phase transitions of silicon analyzed by Raman scattering. Defect and Diffusion Forum, v. 258-260, p. 276-281, 2006Tradução . . Acesso em: 15 nov. 2024.
    • APA

      Pizani, P. S., Jasinevicius, R. G., & Zanatta, R. A. (2006). Non-hydrostatic pressure induced structural phase transitions of silicon analyzed by Raman scattering. Defect and Diffusion Forum, 258-260, 276-281.
    • NLM

      Pizani PS, Jasinevicius RG, Zanatta RA. Non-hydrostatic pressure induced structural phase transitions of silicon analyzed by Raman scattering. Defect and Diffusion Forum. 2006 ; 258-260 276-281.[citado 2024 nov. 15 ]
    • Vancouver

      Pizani PS, Jasinevicius RG, Zanatta RA. Non-hydrostatic pressure induced structural phase transitions of silicon analyzed by Raman scattering. Defect and Diffusion Forum. 2006 ; 258-260 276-281.[citado 2024 nov. 15 ]

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