Raman scattering spectroscopy of micrometer-sized carbon serpentines (2024)
- Authors:
- Autor USP: ZANATTA, ANTONIO RICARDO - IFSC
- Unidade: IFSC
- DOI: 10.1016/j.matchemphys.2024.129343
- Subjects: ESPECTROSCOPIA RAMAN; FILMES FINOS
- Keywords: Carbon films; Raman spectroscopy; Micro patterning
- Agências de fomento:
- Language: Inglês
- Imprenta:
- Source:
- Título: Materials Chemistry and Physics
- ISSN: 0254-0584
- Volume/Número/Paginação/Ano: v. 319, p. 129343-1-129343-6 + supplementary data, June 2024
- Este periódico é de assinatura
- Este artigo NÃO é de acesso aberto
- Cor do Acesso Aberto: closed
-
ABNT
ZANATTA, Antonio Ricardo e OLIVEIRA JÚNIOR, Myriano Henriques de e MARQUES, Francisco das Chagas. Raman scattering spectroscopy of micrometer-sized carbon serpentines. Materials Chemistry and Physics, v. 319, p. 129343-1-129343-6 + supplementary data, 2024Tradução . . Disponível em: https://doi.org/10.1016/j.matchemphys.2024.129343. Acesso em: 18 maio 2025. -
APA
Zanatta, A. R., Oliveira Júnior, M. H. de, & Marques, F. das C. (2024). Raman scattering spectroscopy of micrometer-sized carbon serpentines. Materials Chemistry and Physics, 319, 129343-1-129343-6 + supplementary data. doi:10.1016/j.matchemphys.2024.129343 -
NLM
Zanatta AR, Oliveira Júnior MH de, Marques F das C. Raman scattering spectroscopy of micrometer-sized carbon serpentines [Internet]. Materials Chemistry and Physics. 2024 ; 319 129343-1-129343-6 + supplementary data.[citado 2025 maio 18 ] Available from: https://doi.org/10.1016/j.matchemphys.2024.129343 -
Vancouver
Zanatta AR, Oliveira Júnior MH de, Marques F das C. Raman scattering spectroscopy of micrometer-sized carbon serpentines [Internet]. Materials Chemistry and Physics. 2024 ; 319 129343-1-129343-6 + supplementary data.[citado 2025 maio 18 ] Available from: https://doi.org/10.1016/j.matchemphys.2024.129343 - Photoluminescence and structural study of Sm and Tb-doped TiOx thin films
- Optical analysis of cobalt oxide thin films deposited by reactive sputtering
- The metal-induced crystallization of amorphous Si and Ge thin films: fundamentals and advancements
- Defect-mediated excitation of Yb ions in amorphous SiN films
- A critical review on the conversion degree of resin monomers by direct analyses
- The mechanisms behind the enhancement of the near-infrared light emission due to Er+Yb ions in an optical microcavity
- Influence of nickel concentration on the metal-induced crystallization of amorphous silicon thin films
- On the structural and optical properties of rare-earth-doped SiOx films deposited by sputtering
- Laser-induced generation of micrometer-sized luminescent patterns on rare-earth-doped amorphous films
- Técnicas de espectroscopia óptica 1: espalhamento Raman
Informações sobre o DOI: 10.1016/j.matchemphys.2024.129343 (Fonte: oaDOI API)
Download do texto completo
Tipo | Nome | Link | |
---|---|---|---|
3193293.pdf |
How to cite
A citação é gerada automaticamente e pode não estar totalmente de acordo com as normas