ReP USP - Resultado da busca

Parte de monografia/livro
Interdigitated capacitive sensor to verify the quality of ethanol automotive fuel (2008)
Mendonça, Lucas Gonçalves Dias; Torikai, Delson ; Ibrahim, Ricardo Cury ; Simões, Eliphas Wagner; Morimoto, Nilton Itiro
Source: Mechatronics. Unidades: EP, ICB
Subjects: SENSOR, COMBUSTÍVEIS VEICULARES
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ABNT
MENDONÇA, Lucas Gonçalves Dias et al. Interdigitated capacitive sensor to verify the quality of ethanol automotive fuel. Mechatronics. Tradução . Rio de Janeiro: ABCM, 2008. . Disponível em: https://repositorio.usp.br/directbitstream/001358c4-4af4-40dd-8fc8-074b04e74a19/Torikai-2008-Interdigitated%20Capacitive%20Sensor%20to%20Verify%20the%20Quality%20of%20Ethanol%20Automotive%20Fuel%20ok.pdf. Acesso em: 17 ago. 2024.
APA
Mendonça, L. G. D., Torikai, D., Ibrahim, R. C., Simões, E. W., & Morimoto, N. I. (2008). Interdigitated capacitive sensor to verify the quality of ethanol automotive fuel. In Mechatronics. Rio de Janeiro: ABCM. Recuperado de https://repositorio.usp.br/directbitstream/001358c4-4af4-40dd-8fc8-074b04e74a19/Torikai-2008-Interdigitated%20Capacitive%20Sensor%20to%20Verify%20the%20Quality%20of%20Ethanol%20Automotive%20Fuel%20ok.pdf
NLM
Mendonça LGD, Torikai D, Ibrahim RC, Simões EW, Morimoto NI. Interdigitated capacitive sensor to verify the quality of ethanol automotive fuel [Internet]. In: Mechatronics. Rio de Janeiro: ABCM; 2008. [citado 2024 ago. 17 ] Available from: https://repositorio.usp.br/directbitstream/001358c4-4af4-40dd-8fc8-074b04e74a19/Torikai-2008-Interdigitated%20Capacitive%20Sensor%20to%20Verify%20the%20Quality%20of%20Ethanol%20Automotive%20Fuel%20ok.pdf
Vancouver
Mendonça LGD, Torikai D, Ibrahim RC, Simões EW, Morimoto NI. Interdigitated capacitive sensor to verify the quality of ethanol automotive fuel [Internet]. In: Mechatronics. Rio de Janeiro: ABCM; 2008. [citado 2024 ago. 17 ] Available from: https://repositorio.usp.br/directbitstream/001358c4-4af4-40dd-8fc8-074b04e74a19/Torikai-2008-Interdigitated%20Capacitive%20Sensor%20to%20Verify%20the%20Quality%20of%20Ethanol%20Automotive%20Fuel%20ok.pdf
Parte de monografia/livro
Semiconductor light emitting diodes: an empirical study for use in fiber optic gyroscopes (2002)
Ferreira, Eduardo dos Santos; Morimoto, Nilton Itiro ; Carvalho, Ricardo Teixeira de
Source: Microelectronics Technology and Devices SBMICRO 2002. Conference titles: International Symposium on Microelectronics Technology and Devices SBMICRO. Unidade: EP
Assunto: MICROELETRÔNICA
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ABNT
FERREIRA, Eduardo dos Santos e MORIMOTO, Nilton Itiro e CARVALHO, Ricardo Teixeira de. Semiconductor light emitting diodes: an empirical study for use in fiber optic gyroscopes. Microelectronics Technology and Devices SBMICRO 2002. Tradução . Pennington: The Electrochemical Society, 2002. . . Acesso em: 17 ago. 2024.
APA
Ferreira, E. dos S., Morimoto, N. I., & Carvalho, R. T. de. (2002). Semiconductor light emitting diodes: an empirical study for use in fiber optic gyroscopes. In Microelectronics Technology and Devices SBMICRO 2002. Pennington: The Electrochemical Society.
NLM
Ferreira E dos S, Morimoto NI, Carvalho RT de. Semiconductor light emitting diodes: an empirical study for use in fiber optic gyroscopes. In: Microelectronics Technology and Devices SBMICRO 2002. Pennington: The Electrochemical Society; 2002. [citado 2024 ago. 17 ]
Vancouver
Ferreira E dos S, Morimoto NI, Carvalho RT de. Semiconductor light emitting diodes: an empirical study for use in fiber optic gyroscopes. In: Microelectronics Technology and Devices SBMICRO 2002. Pennington: The Electrochemical Society; 2002. [citado 2024 ago. 17 ]
Parte de monografia/livro
Implementation of an optical integrated pressure sensor and experimental results (2002)
Siarkowski, Acácio Luiz; Bulla, Douglas Anderson Pereira; Morimoto, Nilton Itiro
Source: Microelectronics Technology and Devices SBMICRO 2002. Conference titles: International Symposium on Microelectronics Technology and Devices SBMICRO. Unidade: EP
Assunto: MICROELETRÔNICA
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ABNT
SIARKOWSKI, Acácio Luiz e BULLA, Douglas Anderson Pereira e MORIMOTO, Nilton Itiro. Implementation of an optical integrated pressure sensor and experimental results. Microelectronics Technology and Devices SBMICRO 2002. Tradução . Pennington: The Electrochemical Society, 2002. . . Acesso em: 17 ago. 2024.
APA
Siarkowski, A. L., Bulla, D. A. P., & Morimoto, N. I. (2002). Implementation of an optical integrated pressure sensor and experimental results. In Microelectronics Technology and Devices SBMICRO 2002. Pennington: The Electrochemical Society.
NLM
Siarkowski AL, Bulla DAP, Morimoto NI. Implementation of an optical integrated pressure sensor and experimental results. In: Microelectronics Technology and Devices SBMICRO 2002. Pennington: The Electrochemical Society; 2002. [citado 2024 ago. 17 ]
Vancouver
Siarkowski AL, Bulla DAP, Morimoto NI. Implementation of an optical integrated pressure sensor and experimental results. In: Microelectronics Technology and Devices SBMICRO 2002. Pennington: The Electrochemical Society; 2002. [citado 2024 ago. 17 ]
Parte de monografia/livro
High density-PECVD silicon oxide deposition by TEOS and oxygen at low temperature (375 o. C) (2002)
Viana, Carlos Eduardo; Santos, J.L.R.; Morimoto, Nilton Itiro
Source: Microelectronics Technology and Devices SBMICRO 2002. Conference titles: International Symposium on Microelectronics Technology and Devices SBMICRO. Unidade: EP
Assunto: MICROELETRÔNICA
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ABNT
VIANA, Carlos Eduardo e SANTOS, J.L.R. e MORIMOTO, Nilton Itiro. High density-PECVD silicon oxide deposition by TEOS and oxygen at low temperature (375 o. C). Microelectronics Technology and Devices SBMICRO 2002. Tradução . Pennington: The Electrochemical Society, 2002. . . Acesso em: 17 ago. 2024.
APA
Viana, C. E., Santos, J. L. R., & Morimoto, N. I. (2002). High density-PECVD silicon oxide deposition by TEOS and oxygen at low temperature (375 o. C). In Microelectronics Technology and Devices SBMICRO 2002. Pennington: The Electrochemical Society.
NLM
Viana CE, Santos JLR, Morimoto NI. High density-PECVD silicon oxide deposition by TEOS and oxygen at low temperature (375 o. C). In: Microelectronics Technology and Devices SBMICRO 2002. Pennington: The Electrochemical Society; 2002. [citado 2024 ago. 17 ]
Vancouver
Viana CE, Santos JLR, Morimoto NI. High density-PECVD silicon oxide deposition by TEOS and oxygen at low temperature (375 o. C). In: Microelectronics Technology and Devices SBMICRO 2002. Pennington: The Electrochemical Society; 2002. [citado 2024 ago. 17 ]
Parte de monografia/livro
Mechanical properties of silicon oxide films deposited by PECVD-TEOS for application in MEMS structures and sensors (2002)
Gonçalves, Lucas Gonçalves Dias; Silva, Antônio Nélson Rodrigues da; Alfano, C.F.; Santos, J. C.; Morimoto, Nilton Itiro
Source: Microelectronics Technology and Devices SBMICRO 2002. Conference titles: International Symposium on Microelectronics Technology and Devices SBMICRO 2002, Porto Alegre, 2002. Unidade: EP
Assunto: MICROELETRÔNICA
A citação é gerada automaticamente e pode não estar totalmente de acordo com as normas
ABNT
GONÇALVES, Lucas Gonçalves Dias et al. Mechanical properties of silicon oxide films deposited by PECVD-TEOS for application in MEMS structures and sensors. Microelectronics Technology and Devices SBMICRO 2002. Tradução . Pennington: The Electrochemical Society, 2002. . . Acesso em: 17 ago. 2024.
APA
Gonçalves, L. G. D., Silva, A. N. R. da, Alfano, C. F., Santos, J. C., & Morimoto, N. I. (2002). Mechanical properties of silicon oxide films deposited by PECVD-TEOS for application in MEMS structures and sensors. In Microelectronics Technology and Devices SBMICRO 2002. Pennington: The Electrochemical Society.
NLM
Gonçalves LGD, Silva ANR da, Alfano CF, Santos JC, Morimoto NI. Mechanical properties of silicon oxide films deposited by PECVD-TEOS for application in MEMS structures and sensors. In: Microelectronics Technology and Devices SBMICRO 2002. Pennington: The Electrochemical Society; 2002. [citado 2024 ago. 17 ]
Vancouver
Gonçalves LGD, Silva ANR da, Alfano CF, Santos JC, Morimoto NI. Mechanical properties of silicon oxide films deposited by PECVD-TEOS for application in MEMS structures and sensors. In: Microelectronics Technology and Devices SBMICRO 2002. Pennington: The Electrochemical Society; 2002. [citado 2024 ago. 17 ]
Parte de monografia/livro
Low-pressure chemical vapor deposition of semi-insulating polycrystalline silicon (SIPOS) and its analysis: application to power diode passivation (2001)
Ferreira, Eduardo dos Santos; Morimoto, Nilton Itiro
Source: Polycristalline Semiconductors VI - Materials, Technologies, and Large Area Electronics. Conference titles: International Conference on Polycrystalline Semiconductors. Unidade: EP
Assunto: SEMICONDUTORES
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ABNT
FERREIRA, Eduardo dos Santos e MORIMOTO, Nilton Itiro. Low-pressure chemical vapor deposition of semi-insulating polycrystalline silicon (SIPOS) and its analysis: application to power diode passivation. Polycristalline Semiconductors VI - Materials, Technologies, and Large Area Electronics. Tradução . Zuerich: Scitec, 2001. . . Acesso em: 17 ago. 2024.
APA
Ferreira, E. dos S., & Morimoto, N. I. (2001). Low-pressure chemical vapor deposition of semi-insulating polycrystalline silicon (SIPOS) and its analysis: application to power diode passivation. In Polycristalline Semiconductors VI - Materials, Technologies, and Large Area Electronics. Zuerich: Scitec.
NLM
Ferreira E dos S, Morimoto NI. Low-pressure chemical vapor deposition of semi-insulating polycrystalline silicon (SIPOS) and its analysis: application to power diode passivation. In: Polycristalline Semiconductors VI - Materials, Technologies, and Large Area Electronics. Zuerich: Scitec; 2001. [citado 2024 ago. 17 ]
Vancouver
Ferreira E dos S, Morimoto NI. Low-pressure chemical vapor deposition of semi-insulating polycrystalline silicon (SIPOS) and its analysis: application to power diode passivation. In: Polycristalline Semiconductors VI - Materials, Technologies, and Large Area Electronics. Zuerich: Scitec; 2001. [citado 2024 ago. 17 ]

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