Critical dependencies of heavy ion-induced destructive failures in electronic devices (2019)
Source: Abstracts. Conference titles: Reunião de Trabalho sobre Física Nuclear no Brasil. Unidade: IF
Assunto: ÍONS PESADOS
ABNT
ALBERTON, Saulo Gabriel Pereira Nascimento et al. Critical dependencies of heavy ion-induced destructive failures in electronic devices. 2019, Anais.. São Paulo: Sociedade Brasileira de Física, 2019. . Acesso em: 03 out. 2024.APA
Alberton, S. G. P. N., Medina, N. H., Added, N., Aguiar, V. Â. P. de, Menegasso, R., Macchione, E. L. A., et al. (2019). Critical dependencies of heavy ion-induced destructive failures in electronic devices. In Abstracts. São Paulo: Sociedade Brasileira de Física.NLM
Alberton SGPN, Medina NH, Added N, Aguiar VÂP de, Menegasso R, Macchione ELA, Escudeiro R, Guazzelli MA, Flechas D. Critical dependencies of heavy ion-induced destructive failures in electronic devices. Abstracts. 2019 ;[citado 2024 out. 03 ]Vancouver
Alberton SGPN, Medina NH, Added N, Aguiar VÂP de, Menegasso R, Macchione ELA, Escudeiro R, Guazzelli MA, Flechas D. Critical dependencies of heavy ion-induced destructive failures in electronic devices. Abstracts. 2019 ;[citado 2024 out. 03 ]