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Parte de monografia/livro
Combining polymers, nanomaterials and biomolecules: nanostructured films with functional properties and applications (2022)
Pereira, Andressa Ribeiro ; Melo, Antonio Francisco Arcanjo de Araújo ; Crespilho, Frank Nelson ; Oliveira Junior, Osvaldo Novais de
Fonte: Molecular architectonics and nanoarchitectonics. Unidades: IQSC, IFSC
Assuntos: SENSOR, FILMES FINOS, MATERIAIS NANOESTRUTURADOS, POLÍMEROS (MATERIAIS), BIOMATERIAIS
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ABNT
PEREIRA, Andressa Ribeiro et al. Combining polymers, nanomaterials and biomolecules: nanostructured films with functional properties and applications. Molecular architectonics and nanoarchitectonics. Tradução . Singapore: Springer, 2022. p. 548 . Disponível em: https://doi.org/10.1007/978-981-16-4189-3_19. Acesso em: 10 jul. 2024.
APA
Pereira, A. R., Melo, A. F. A. de A., Crespilho, F. N., & Oliveira Junior, O. N. de. (2022). Combining polymers, nanomaterials and biomolecules: nanostructured films with functional properties and applications. In Molecular architectonics and nanoarchitectonics (p. 548 ). Singapore: Springer. doi:10.1007/978-981-16-4189-3_19
NLM
Pereira AR, Melo AFA de A, Crespilho FN, Oliveira Junior ON de. Combining polymers, nanomaterials and biomolecules: nanostructured films with functional properties and applications [Internet]. In: Molecular architectonics and nanoarchitectonics. Singapore: Springer; 2022. p. 548 .[citado 2024 jul. 10 ] Available from: https://doi.org/10.1007/978-981-16-4189-3_19
Vancouver
Pereira AR, Melo AFA de A, Crespilho FN, Oliveira Junior ON de. Combining polymers, nanomaterials and biomolecules: nanostructured films with functional properties and applications [Internet]. In: Molecular architectonics and nanoarchitectonics. Singapore: Springer; 2022. p. 548 .[citado 2024 jul. 10 ] Available from: https://doi.org/10.1007/978-981-16-4189-3_19
Artigo de periodico
Influence of electron scattering from morphological granularity and surface roughness on thin film electrical resistivity (2007)
Cattani, Mauro Sérgio Dorsa ; Vaz, A R; Wiederkehr, Rodrigo Sérgio; Teixeira, Fernanda de Sá; Salvadori, Maria Cecília Barbosa da Silveira; Brown, I G
Fonte: Surface Review and Letters. Unidade: IF
Assunto: FILMES FINOS
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ABNT
CATTANI, Mauro Sérgio Dorsa et al. Influence of electron scattering from morphological granularity and surface roughness on thin film electrical resistivity. Surface Review and Letters, v. 14, n. 1, p. 87-91, 2007Tradução . . Disponível em: http://db.worldscinet.com/worldscientific/Files/20080117040740835290[000000@143.107.135.25]@page.pdf. Acesso em: 10 jul. 2024.
APA
Cattani, M. S. D., Vaz, A. R., Wiederkehr, R. S., Teixeira, F. de S., Salvadori, M. C. B. da S., & Brown, I. G. (2007). Influence of electron scattering from morphological granularity and surface roughness on thin film electrical resistivity. Surface Review and Letters, 14( 1), 87-91. Recuperado de http://db.worldscinet.com/worldscientific/Files/20080117040740835290[000000@143.107.135.25]@page.pdf
NLM
Cattani MSD, Vaz AR, Wiederkehr RS, Teixeira F de S, Salvadori MCB da S, Brown IG. Influence of electron scattering from morphological granularity and surface roughness on thin film electrical resistivity [Internet]. Surface Review and Letters. 2007 ; 14( 1): 87-91.[citado 2024 jul. 10 ] Available from: http://db.worldscinet.com/worldscientific/Files/20080117040740835290[000000@143.107.135.25]@page.pdf
Vancouver
Cattani MSD, Vaz AR, Wiederkehr RS, Teixeira F de S, Salvadori MCB da S, Brown IG. Influence of electron scattering from morphological granularity and surface roughness on thin film electrical resistivity [Internet]. Surface Review and Letters. 2007 ; 14( 1): 87-91.[citado 2024 jul. 10 ] Available from: http://db.worldscinet.com/worldscientific/Files/20080117040740835290[000000@143.107.135.25]@page.pdf
Artigo de periodico
Electrical resistivity of very thin metallic films with isotropic and anisotropic surfaces (2007)
Cattani, Mauro Sérgio Dorsa ; Salvadori, Maria Cecília Barbosa da Silveira; Teixeira, Fernanda Sá; Wiederkehr, R S; Brown, I G
Fonte: Surface Review and Letters. Unidade: IF
Assuntos: SUPERFÍCIE FÍSICA, FILMES FINOS
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ABNT
CATTANI, Mauro Sérgio Dorsa et al. Electrical resistivity of very thin metallic films with isotropic and anisotropic surfaces. Surface Review and Letters, v. 14, n. 3, p. 345-356, 2007Tradução . . Disponível em: http://db.worldscinet.com/worldscientific/Files/20080130013118099303[CAPES152@143.107.135.25]@page.pdf. Acesso em: 10 jul. 2024.
APA
Cattani, M. S. D., Salvadori, M. C. B. da S., Teixeira, F. S., Wiederkehr, R. S., & Brown, I. G. (2007). Electrical resistivity of very thin metallic films with isotropic and anisotropic surfaces. Surface Review and Letters, 14( 3), 345-356. Recuperado de http://db.worldscinet.com/worldscientific/Files/20080130013118099303[CAPES152@143.107.135.25]@page.pdf
NLM
Cattani MSD, Salvadori MCB da S, Teixeira FS, Wiederkehr RS, Brown IG. Electrical resistivity of very thin metallic films with isotropic and anisotropic surfaces [Internet]. Surface Review and Letters. 2007 ; 14( 3): 345-356.[citado 2024 jul. 10 ] Available from: http://db.worldscinet.com/worldscientific/Files/20080130013118099303[CAPES152@143.107.135.25]@page.pdf
Vancouver
Cattani MSD, Salvadori MCB da S, Teixeira FS, Wiederkehr RS, Brown IG. Electrical resistivity of very thin metallic films with isotropic and anisotropic surfaces [Internet]. Surface Review and Letters. 2007 ; 14( 3): 345-356.[citado 2024 jul. 10 ] Available from: http://db.worldscinet.com/worldscientific/Files/20080130013118099303[CAPES152@143.107.135.25]@page.pdf
Artigo de periodico
Kinetic surface roughening of platinum and gold thin films (2005)
Cattani, Mauro Sérgio Dorsa ; Salvadori, Maria Cecília Barbosa da Silveira
Fonte: Surface Review and Letters. Unidade: IF
Assuntos: FILMES FINOS, MICROSCOPIA ELETRÔNICA DE VARREDURA, MATERIAIS
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ABNT
CATTANI, Mauro Sérgio Dorsa e SALVADORI, Maria Cecília Barbosa da Silveira. Kinetic surface roughening of platinum and gold thin films. Surface Review and Letters, v. 12, n. 5-6, p. 675-679, 2005Tradução . . Disponível em: http://www.worldscinet.com/srl/12/preserved-docs/1205n06/S0218625X05007645.pdf. Acesso em: 10 jul. 2024.
APA
Cattani, M. S. D., & Salvadori, M. C. B. da S. (2005). Kinetic surface roughening of platinum and gold thin films. Surface Review and Letters, 12( 5-6), 675-679. Recuperado de http://www.worldscinet.com/srl/12/preserved-docs/1205n06/S0218625X05007645.pdf
NLM
Cattani MSD, Salvadori MCB da S. Kinetic surface roughening of platinum and gold thin films [Internet]. Surface Review and Letters. 2005 ; 12( 5-6): 675-679.[citado 2024 jul. 10 ] Available from: http://www.worldscinet.com/srl/12/preserved-docs/1205n06/S0218625X05007645.pdf
Vancouver
Cattani MSD, Salvadori MCB da S. Kinetic surface roughening of platinum and gold thin films [Internet]. Surface Review and Letters. 2005 ; 12( 5-6): 675-679.[citado 2024 jul. 10 ] Available from: http://www.worldscinet.com/srl/12/preserved-docs/1205n06/S0218625X05007645.pdf
Artigo de periodico
Electrical resistivity of nanostructured platinum and gold thin films (2004)
Salvadori, Maria Cecilia B da Silveira; Vaz, A R; Farias, R J C; Cattani, Mauro Sérgio Dorsa
Fonte: Surface Review and Letters. Unidade: IF
Assuntos: FILMES FINOS, NANOTECNOLOGIA
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ABNT
SALVADORI, Maria Cecilia B da Silveira et al. Electrical resistivity of nanostructured platinum and gold thin films. Surface Review and Letters, 2004Tradução . . Disponível em: http://www.worldscinet.com/srl/11/preserved-docs/1102/S0218625X04006086.pdf. Acesso em: 10 jul. 2024.
APA
Salvadori, M. C. B. da S., Vaz, A. R., Farias, R. J. C., & Cattani, M. S. D. (2004). Electrical resistivity of nanostructured platinum and gold thin films. Surface Review and Letters. Recuperado de http://www.worldscinet.com/srl/11/preserved-docs/1102/S0218625X04006086.pdf
NLM
Salvadori MCB da S, Vaz AR, Farias RJC, Cattani MSD. Electrical resistivity of nanostructured platinum and gold thin films [Internet]. Surface Review and Letters. 2004 ;[citado 2024 jul. 10 ] Available from: http://www.worldscinet.com/srl/11/preserved-docs/1102/S0218625X04006086.pdf
Vancouver
Salvadori MCB da S, Vaz AR, Farias RJC, Cattani MSD. Electrical resistivity of nanostructured platinum and gold thin films [Internet]. Surface Review and Letters. 2004 ;[citado 2024 jul. 10 ] Available from: http://www.worldscinet.com/srl/11/preserved-docs/1102/S0218625X04006086.pdf
Artigo de periodico
Contribution of the morphological grain sizes to the electrical resistivity of platinum and gold thin films (2004)
Cattani, Mauro Sérgio Dorsa ; Salvadori, Maria Cecília Barbosa da Silveira
Fonte: Surface Review and Letters. Unidade: IF
Assunto: FILMES FINOS
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ABNT
CATTANI, Mauro Sérgio Dorsa e SALVADORI, Maria Cecília Barbosa da Silveira. Contribution of the morphological grain sizes to the electrical resistivity of platinum and gold thin films. Surface Review and Letters, v. 11, n. 4-5, p. 463-467, 2004Tradução . . Disponível em: http://www.worldscinet.com/srl/11/preserved-docs/1104n05/S0218625X04006396.pdf. Acesso em: 10 jul. 2024.
APA
Cattani, M. S. D., & Salvadori, M. C. B. da S. (2004). Contribution of the morphological grain sizes to the electrical resistivity of platinum and gold thin films. Surface Review and Letters, 11( 4-5), 463-467. Recuperado de http://www.worldscinet.com/srl/11/preserved-docs/1104n05/S0218625X04006396.pdf
NLM
Cattani MSD, Salvadori MCB da S. Contribution of the morphological grain sizes to the electrical resistivity of platinum and gold thin films [Internet]. Surface Review and Letters. 2004 ; 11( 4-5): 463-467.[citado 2024 jul. 10 ] Available from: http://www.worldscinet.com/srl/11/preserved-docs/1104n05/S0218625X04006396.pdf
Vancouver
Cattani MSD, Salvadori MCB da S. Contribution of the morphological grain sizes to the electrical resistivity of platinum and gold thin films [Internet]. Surface Review and Letters. 2004 ; 11( 4-5): 463-467.[citado 2024 jul. 10 ] Available from: http://www.worldscinet.com/srl/11/preserved-docs/1104n05/S0218625X04006396.pdf
Artigo de periodico
Measurement of critical exponents of platinum thin films (2003)
Salvadori, Maria Cecília Barbosa da Silveira; Melo, L L; Cattani, Mauro Sérgio Dorsa ; Monteiro, O R; Brown, L G
Fonte: Surface Review and Letters. Unidade: IF
Assuntos: MICROSCOPIA ELETRÔNICA, FILMES FINOS, SUPERFÍCIE FÍSICA
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ABNT
SALVADORI, Maria Cecília Barbosa da Silveira et al. Measurement of critical exponents of platinum thin films. Surface Review and Letters, v. 10, n. 1, p. 1-5, 2003Tradução . . Disponível em: http://www.worldscinet.com/srl/10/preserved-docs/1001/S0218625X03004561.pdf. Acesso em: 10 jul. 2024.
APA
Salvadori, M. C. B. da S., Melo, L. L., Cattani, M. S. D., Monteiro, O. R., & Brown, L. G. (2003). Measurement of critical exponents of platinum thin films. Surface Review and Letters, 10( 1), 1-5. Recuperado de http://www.worldscinet.com/srl/10/preserved-docs/1001/S0218625X03004561.pdf
NLM
Salvadori MCB da S, Melo LL, Cattani MSD, Monteiro OR, Brown LG. Measurement of critical exponents of platinum thin films [Internet]. Surface Review and Letters. 2003 ; 10( 1): 1-5.[citado 2024 jul. 10 ] Available from: http://www.worldscinet.com/srl/10/preserved-docs/1001/S0218625X03004561.pdf
Vancouver
Salvadori MCB da S, Melo LL, Cattani MSD, Monteiro OR, Brown LG. Measurement of critical exponents of platinum thin films [Internet]. Surface Review and Letters. 2003 ; 10( 1): 1-5.[citado 2024 jul. 10 ] Available from: http://www.worldscinet.com/srl/10/preserved-docs/1001/S0218625X03004561.pdf
Artigo de periodico
Measurement of critical exponents of nanostructured gold thin films (2003)
Melo, L L; Salvadori, Maria Cecília Barbosa da Silveira; Cattani, Mauro Sérgio Dorsa
Fonte: Surface Review and Letters. Unidade: IF
Assuntos: FILMES FINOS, MICROSCOPIA ELETRÔNICA
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ABNT
MELO, L L e SALVADORI, Maria Cecília Barbosa da Silveira e CATTANI, Mauro Sérgio Dorsa. Measurement of critical exponents of nanostructured gold thin films. Surface Review and Letters, 2003Tradução . . Acesso em: 10 jul. 2024.
APA
Melo, L. L., Salvadori, M. C. B. da S., & Cattani, M. S. D. (2003). Measurement of critical exponents of nanostructured gold thin films. Surface Review and Letters.
NLM
Melo LL, Salvadori MCB da S, Cattani MSD. Measurement of critical exponents of nanostructured gold thin films. Surface Review and Letters. 2003 ;[citado 2024 jul. 10 ]
Vancouver
Melo LL, Salvadori MCB da S, Cattani MSD. Measurement of critical exponents of nanostructured gold thin films. Surface Review and Letters. 2003 ;[citado 2024 jul. 10 ]
Artigo de periodico
Nanostructured gold thin films: young modulus measurement (2003)
Salvadori, Maria Cecília Barbosa da Silveira; Vaz, A R; Melo, L L; Cattani, Mauro Sérgio Dorsa
Fonte: Surface Review and Letters. Unidade: IF
Assuntos: FILMES FINOS, MICROSCOPIA ELETRÔNICA
A citação é gerada automaticamente e pode não estar totalmente de acordo com as normas
ABNT
SALVADORI, Maria Cecília Barbosa da Silveira et al. Nanostructured gold thin films: young modulus measurement. Surface Review and Letters, 2003Tradução . . Disponível em: http://www.worldscinet.com/srl/10/preserved-docs/1004/S0218625X03005323.pdf. Acesso em: 10 jul. 2024.
APA
Salvadori, M. C. B. da S., Vaz, A. R., Melo, L. L., & Cattani, M. S. D. (2003). Nanostructured gold thin films: young modulus measurement. Surface Review and Letters. Recuperado de http://www.worldscinet.com/srl/10/preserved-docs/1004/S0218625X03005323.pdf
NLM
Salvadori MCB da S, Vaz AR, Melo LL, Cattani MSD. Nanostructured gold thin films: young modulus measurement [Internet]. Surface Review and Letters. 2003 ;[citado 2024 jul. 10 ] Available from: http://www.worldscinet.com/srl/10/preserved-docs/1004/S0218625X03005323.pdf
Vancouver
Salvadori MCB da S, Vaz AR, Melo LL, Cattani MSD. Nanostructured gold thin films: young modulus measurement [Internet]. Surface Review and Letters. 2003 ;[citado 2024 jul. 10 ] Available from: http://www.worldscinet.com/srl/10/preserved-docs/1004/S0218625X03005323.pdf
Trabalho de evento
Amorphous silicon thin film field effect transistors (1989)
Andrade, Adnei Melges de ; Sanematsu, Mário Sabro; Fonseca, Fernando Josepetti ; Andrade, Carlos Américo Morato de; Pereyra, Inés ; Martins, R F P; Fortunato, E
Fonte: Thin Films and Small Particles: Proceedings. Nome do evento: Latin-American Symposium on Surface Physics. Unidades: IEE, EP
Assuntos: FILMES FINOS, TRANSISTORES, SILÍCIO
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ABNT
ANDRADE, Adnei Melges de et al. Amorphous silicon thin film field effect transistors. 1989, Anais.. Singapore: World Scientific, 1989. . Acesso em: 10 jul. 2024.
APA
Andrade, A. M. de, Sanematsu, M. S., Fonseca, F. J., Andrade, C. A. M. de, Pereyra, I., Martins, R. F. P., & Fortunato, E. (1989). Amorphous silicon thin film field effect transistors. In Thin Films and Small Particles: Proceedings. Singapore: World Scientific.
NLM
Andrade AM de, Sanematsu MS, Fonseca FJ, Andrade CAM de, Pereyra I, Martins RFP, Fortunato E. Amorphous silicon thin film field effect transistors. Thin Films and Small Particles: Proceedings. 1989 ;[citado 2024 jul. 10 ]
Vancouver
Andrade AM de, Sanematsu MS, Fonseca FJ, Andrade CAM de, Pereyra I, Martins RFP, Fortunato E. Amorphous silicon thin film field effect transistors. Thin Films and Small Particles: Proceedings. 1989 ;[citado 2024 jul. 10 ]

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