Measurement of critical exponents of platinum thin films (2003)
- Authors:
- USP affiliated authors: SALVADORI, MARIA CECILIA BARBOSA DA SILVEIRA - IF ; CATTANI, MAURO SERGIO DORSA - IF
- Unidade: IF
- Subjects: MICROSCOPIA ELETRÔNICA; FILMES FINOS; SUPERFÍCIE FÍSICA
- Language: Inglês
- Imprenta:
- Source:
- Título do periódico: Surface Review and Letters
- ISSN: 0218-625X
- Volume/Número/Paginação/Ano: v. 10, n. 1, p. 1-5, 2003
-
ABNT
SALVADORI, Maria Cecília Barbosa da Silveira et al. Measurement of critical exponents of platinum thin films. Surface Review and Letters, v. 10, n. 1, p. 1-5, 2003Tradução . . Disponível em: http://www.worldscinet.com/srl/10/preserved-docs/1001/S0218625X03004561.pdf. Acesso em: 19 abr. 2024. -
APA
Salvadori, M. C. B. da S., Melo, L. L., Cattani, M. S. D., Monteiro, O. R., & Brown, L. G. (2003). Measurement of critical exponents of platinum thin films. Surface Review and Letters, 10( 1), 1-5. Recuperado de http://www.worldscinet.com/srl/10/preserved-docs/1001/S0218625X03004561.pdf -
NLM
Salvadori MCB da S, Melo LL, Cattani MSD, Monteiro OR, Brown LG. Measurement of critical exponents of platinum thin films [Internet]. Surface Review and Letters. 2003 ; 10( 1): 1-5.[citado 2024 abr. 19 ] Available from: http://www.worldscinet.com/srl/10/preserved-docs/1001/S0218625X03004561.pdf -
Vancouver
Salvadori MCB da S, Melo LL, Cattani MSD, Monteiro OR, Brown LG. Measurement of critical exponents of platinum thin films [Internet]. Surface Review and Letters. 2003 ; 10( 1): 1-5.[citado 2024 abr. 19 ] Available from: http://www.worldscinet.com/srl/10/preserved-docs/1001/S0218625X03004561.pdf - Critical exponent measurement of poor quality diamond films
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