Influence of electron scattering from morphological granularity and surface roughness on thin film electrical resistivity (2007)
- Authors:
- USP affiliated authors: CATTANI, MAURO SERGIO DORSA - IF ; TEIXEIRA, FERNANDA DE SÁ - IF ; SALVADORI, MARIA CECILIA BARBOSA DA SILVEIRA - IF
- Unidade: IF
- Assunto: FILMES FINOS
- Language: Inglês
- Imprenta:
- Source:
- Título: Surface Review and Letters
- Volume/Número/Paginação/Ano: v. 14, n. 1, p. 87-91, 2007
-
ABNT
CATTANI, Mauro Sérgio Dorsa et al. Influence of electron scattering from morphological granularity and surface roughness on thin film electrical resistivity. Surface Review and Letters, v. 14, n. 1, p. 87-91, 2007Tradução . . Disponível em: http://db.worldscinet.com/worldscientific/Files/20080117040740835290[000000@143.107.135.25]@page.pdf. Acesso em: 28 dez. 2025. -
APA
Cattani, M. S. D., Vaz, A. R., Wiederkehr, R. S., Teixeira, F. de S., Salvadori, M. C. B. da S., & Brown, I. G. (2007). Influence of electron scattering from morphological granularity and surface roughness on thin film electrical resistivity. Surface Review and Letters, 14( 1), 87-91. Recuperado de http://db.worldscinet.com/worldscientific/Files/20080117040740835290[000000@143.107.135.25]@page.pdf -
NLM
Cattani MSD, Vaz AR, Wiederkehr RS, Teixeira F de S, Salvadori MCB da S, Brown IG. Influence of electron scattering from morphological granularity and surface roughness on thin film electrical resistivity [Internet]. Surface Review and Letters. 2007 ; 14( 1): 87-91.[citado 2025 dez. 28 ] Available from: http://db.worldscinet.com/worldscientific/Files/20080117040740835290[000000@143.107.135.25]@page.pdf -
Vancouver
Cattani MSD, Vaz AR, Wiederkehr RS, Teixeira F de S, Salvadori MCB da S, Brown IG. Influence of electron scattering from morphological granularity and surface roughness on thin film electrical resistivity [Internet]. Surface Review and Letters. 2007 ; 14( 1): 87-91.[citado 2025 dez. 28 ] Available from: http://db.worldscinet.com/worldscientific/Files/20080117040740835290[000000@143.107.135.25]@page.pdf - Estudo do efeito \emph{Seebeck} para filmes finos nanométricos de Au e Pt
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