A low-cost portable system for elemental mapping by XRF aiming in situ analyses (2019)
- Authors:
- USP affiliated authors: RIZZUTTO, MARCIA DE ALMEIDA - IF ; TABACNIKS, MANFREDO HARRI - IF ; ADDED, NEMITALA - IF ; SILVA, TIAGO FIORINI DA - IF ; RODRIGUES, CLEBER LIMA - IF ; LEITE, ALISSON RODOLFO - IF ; ASSIS, RENAN FERREIRA DE - IF ; CAMPOS, PEDRO HERZILIO OTTONI VIVIANI DE - IF ; SANTOS, HELLEN CRISTINE DOS - IF
- Unidade: IF
- DOI: 10.1016/j.apradiso.2019.06.018
- Assunto: DETETORES
- Agências de fomento:
- Language: Inglês
- Imprenta:
- Source:
- Título: Applied Radiation and Isotopes
- Volume/Número/Paginação/Ano: v. 152, p. 78–85, 2019
- Este periódico é de assinatura
- Este artigo NÃO é de acesso aberto
- Cor do Acesso Aberto: closed
-
ABNT
CAMPOS, Pedro Herzilio Ottoni Viviani de et al. A low-cost portable system for elemental mapping by XRF aiming in situ analyses. Applied Radiation and Isotopes, v. 152, p. 78–85, 2019Tradução . . Disponível em: https://doi.org/10.1016/j.apradiso.2019.06.018. Acesso em: 29 dez. 2025. -
APA
Campos, P. H. O. V. de, Appoloni, C. R., Rizzutto, M. de A., Leite, A. R., Assis, R. F., Santos, H. C., et al. (2019). A low-cost portable system for elemental mapping by XRF aiming in situ analyses. Applied Radiation and Isotopes, 152, 78–85. doi:10.1016/j.apradiso.2019.06.018 -
NLM
Campos PHOV de, Appoloni CR, Rizzutto M de A, Leite AR, Assis RF, Santos HC, Silva TF da, Rodrigues CL, Tabacniks MH, Added N. A low-cost portable system for elemental mapping by XRF aiming in situ analyses [Internet]. Applied Radiation and Isotopes. 2019 ; 152 78–85.[citado 2025 dez. 29 ] Available from: https://doi.org/10.1016/j.apradiso.2019.06.018 -
Vancouver
Campos PHOV de, Appoloni CR, Rizzutto M de A, Leite AR, Assis RF, Santos HC, Silva TF da, Rodrigues CL, Tabacniks MH, Added N. A low-cost portable system for elemental mapping by XRF aiming in situ analyses [Internet]. Applied Radiation and Isotopes. 2019 ; 152 78–85.[citado 2025 dez. 29 ] Available from: https://doi.org/10.1016/j.apradiso.2019.06.018 - Characterization of a system that combines energy dispersive X-ray diffraction with X-ray fluorescence and its potential applications in archeometry
- Characterization of a system that combines EDXRD with EDXRF and its potential applications in archaeometry
- Elemental mapping of large samples by external ion beam analysis with sub-millimeter resolution and its applications
- Studying total dose irradiation on a power transistor
- Study of sputtering processes, on metallic thin films, due to low energy ion implantation
- Hydrogen loss of high dose ion beam irradiated polycarbonate foils
- In-air RBS measurements at the LAMFI external beam setup
- Self-consistent ion beam analysis: an approach by multi-objective optimization
- Elemental thin film depth profiles by using self-consistent ion beam analysis – MultiSIMNRA: a new computational tool
- Self-consistent ion beam analysis: An approach by multi-objective optimization
Informações sobre o DOI: 10.1016/j.apradiso.2019.06.018 (Fonte: oaDOI API)
Download do texto completo
| Tipo | Nome | Link | |
|---|---|---|---|
 |
1-s2.0-S096980431930212X-... |
How to cite
A citação é gerada automaticamente e pode não estar totalmente de acordo com as normas
