Artigo de periodico

Elemental mapping of large samples by external ion beam analysis with sub-millimeter resolution and its applications (2018)

• Authors:
  • Silva, Tiago Fiorini da
  • Rodrigues, Cleber Lima
  • Added, Nemitala
  • Rizzutto, Márcia de Almeida
  • Tabacniks, Manfredo Harri
  • Mangiarotti, Alessio
  • Curado, Jessica Fleury
  • Aguirre, Fernando Rodrigues
  • Aguero, Natasha Fioretto
  • Allegro, Paula Rangel Pestana
  • Campos, Pedro Herzilio Ottoni Viviani de
  • Restrepo Arteta, Juan Manuel
  • Trindade, Gustavo Ferraz
  • Rodrigues, Antonio Marcos
  • Assis, Renan Ferreira de
  • Leite, Alisson Rodolfo
• USP affiliated authors: SILVA, TIAGO FIORINI DA - IF ; RODRIGUES, CLEBER LIMA - IF ; ADDED, NEMITALA - IF ; RIZZUTTO, MARCIA DE ALMEIDA - IF ; TABACNIKS, MANFREDO HARRI - IF ; ASSIS, RENAN FERREIRA DE - IF ; LEITE, ALISSON RODOLFO - IF
• Unidade: IF
• DOI: 10.1016/j.nimb.2018.03.006
• Subjects: FEIXES; LABORATÓRIOS; FÍSICA EXPERIMENTAL
• Keywords: ELEMENTAL MAPPING; ION BEAM ANALYSIS; EXTERNAL BEAM; LARGE AREA; LAMFI-USP; MAPEAMENTO ELEMENTAR; ANALISE DE FEIXES DE ÍONS
• Agências de fomento:
  • The authors acknowledge support by the Brazilian funding agencies FAPESP (Process number: 2012/00202-0), CNPq and CAPES. P.R.P.Allegro also acknowledge support by given by FAPESP (Processnumber: 2013/19976-8)
• Language: Inglês
• Imprenta:
  • Publisher place: Amsterdam
  • Date published: 2018
• Source:
  • Título: Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms
  • ISSN: 0168-583X
  • Volume/Número/Paginação/Ano: v.422, p. 68-77,2018


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• ABNT

  SILVA, Tiago Fiorini da et al. Elemental mapping of large samples by external ion beam analysis with sub-millimeter resolution and its applications. Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms, v. 422, p. 68-77, 2018Tradução . . Disponível em: https://doi.org/10.1016/j.nimb.2018.03.006. Acesso em: 01 abr. 2026.

• APA

  Silva, T. F. da, Rodrigues, C. L., Added, N., Rizzutto, M. de A., Tabacniks, M. H., Mangiarotti, A., et al. (2018). Elemental mapping of large samples by external ion beam analysis with sub-millimeter resolution and its applications. Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms, 422, 68-77. doi:10.1016/j.nimb.2018.03.006

• NLM

  Silva TF da, Rodrigues CL, Added N, Rizzutto M de A, Tabacniks MH, Mangiarotti A, Curado JF, Aguirre FR, Aguero NF, Allegro PRP, Campos PHOV de, Restrepo Arteta JM, Trindade GF, Rodrigues AM, Assis RF de, Leite AR. Elemental mapping of large samples by external ion beam analysis with sub-millimeter resolution and its applications [Internet]. Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms. 2018 ;422 68-77.[citado 2026 abr. 01 ] Available from: https://doi.org/10.1016/j.nimb.2018.03.006

• Vancouver

  Silva TF da, Rodrigues CL, Added N, Rizzutto M de A, Tabacniks MH, Mangiarotti A, Curado JF, Aguirre FR, Aguero NF, Allegro PRP, Campos PHOV de, Restrepo Arteta JM, Trindade GF, Rodrigues AM, Assis RF de, Leite AR. Elemental mapping of large samples by external ion beam analysis with sub-millimeter resolution and its applications [Internet]. Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms. 2018 ;422 68-77.[citado 2026 abr. 01 ] Available from: https://doi.org/10.1016/j.nimb.2018.03.006

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