Measurement of a semiconductors passivation layer thickness (2014)
- Authors:
- USP affiliated authors: RODRIGUES, CLEBER LIMA - IF ; ADDED, NEMITALA - IF ; TABACNIKS, MANFREDO HARRI - IF ; MEDINA, NILBERTO HEDER - IF
- Unidade: IF
- Subjects: FÍSICA NUCLEAR; SEMICONDUTORES
- Language: Inglês
- Imprenta:
- Source:
- Título: SBF
- Conference titles: Reunião de Trabalho sobre Física Nuclear no Brasil
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ABNT
AGUIRRE, Fernando Rodrigues et al. Measurement of a semiconductors passivation layer thickness. 2014, Anais.. São Paulo: Instituto de Física, Universidade de São Paulo, 2014. Disponível em: http://www.sbf1.sbfisica.org.br/eventos/rtfnb/xxxvii/sys/resumos/R0096-1.pdf. Acesso em: 29 dez. 2025. -
APA
Aguirre, F. R., Silva, T. F. da, Rodrigues, C. L., Aguiar, V. Â. P. de, Added, N., Tabacniks, M. H., & Medina, N. H. (2014). Measurement of a semiconductors passivation layer thickness. In SBF. São Paulo: Instituto de Física, Universidade de São Paulo. Recuperado de http://www.sbf1.sbfisica.org.br/eventos/rtfnb/xxxvii/sys/resumos/R0096-1.pdf -
NLM
Aguirre FR, Silva TF da, Rodrigues CL, Aguiar VÂP de, Added N, Tabacniks MH, Medina NH. Measurement of a semiconductors passivation layer thickness [Internet]. SBF. 2014 ;[citado 2025 dez. 29 ] Available from: http://www.sbf1.sbfisica.org.br/eventos/rtfnb/xxxvii/sys/resumos/R0096-1.pdf -
Vancouver
Aguirre FR, Silva TF da, Rodrigues CL, Aguiar VÂP de, Added N, Tabacniks MH, Medina NH. Measurement of a semiconductors passivation layer thickness [Internet]. SBF. 2014 ;[citado 2025 dez. 29 ] Available from: http://www.sbf1.sbfisica.org.br/eventos/rtfnb/xxxvii/sys/resumos/R0096-1.pdf - Development of a system for studies on radiation effects in electronic devices
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