Thin target PIXE calibration using thick target yield (2011)
- Authors:
- USP affiliated authors: RIZZUTTO, MARCIA DE ALMEIDA - IF ; ADDED, NEMITALA - IF ; TABACNIKS, MANFREDO HARRI - IF
- Unidade: IF
- Assunto: RAIOS X
- Language: Inglês
- Imprenta:
- Publisher: SBF
- Publisher place: Foz do Iguaçu
- Date published: 2011
- Source:
- Título: Resumo
- Conference titles: Econtro de Física
-
ABNT
AGUIRRE, Fernando Rodrigues et al. Thin target PIXE calibration using thick target yield. 2011, Anais.. Foz do Iguaçu: SBF, 2011. Disponível em: http://www.sbf1.sbfisica.org.br/eventos/enf/2011/sys/resumos/R0565-1.pdf. Acesso em: 27 dez. 2025. -
APA
Aguirre, F. R., Rizzutto, M. de A., Added, N., & Tabacniks, M. H. (2011). Thin target PIXE calibration using thick target yield. In Resumo. Foz do Iguaçu: SBF. Recuperado de http://www.sbf1.sbfisica.org.br/eventos/enf/2011/sys/resumos/R0565-1.pdf -
NLM
Aguirre FR, Rizzutto M de A, Added N, Tabacniks MH. Thin target PIXE calibration using thick target yield [Internet]. Resumo. 2011 ;[citado 2025 dez. 27 ] Available from: http://www.sbf1.sbfisica.org.br/eventos/enf/2011/sys/resumos/R0565-1.pdf -
Vancouver
Aguirre FR, Rizzutto M de A, Added N, Tabacniks MH. Thin target PIXE calibration using thick target yield [Internet]. Resumo. 2011 ;[citado 2025 dez. 27 ] Available from: http://www.sbf1.sbfisica.org.br/eventos/enf/2011/sys/resumos/R0565-1.pdf - Facilities and techniques used in recent studies of GFAA-USP
- Non destructive nuclear analysis of art and archeological objects
- X-ray production yield in standardized thick target PIXE
- Construction and characterization of nanostructures in ion tracks
- An optimized external beam setup for archaeological and arteometry research
- Thin target PIXE calibration using thick target yields
- Analysis and discuss of trace elements in teeth of different animal species
- Sup-ppb analysis of water samples by PIXE and TXRF
- X-ray production yield in standardized thick target PIXE
- Polymers damages with heavy ions
How to cite
A citação é gerada automaticamente e pode não estar totalmente de acordo com as normas
