X-ray production yield in standardized thick target PIXE (2003)
- Authors:
- USP affiliated authors: RIZZUTTO, MARCIA DE ALMEIDA - IF ; ADDED, NEMITALA - IF ; TABACNIKS, MANFREDO HARRI - IF
- School: IF
- Subject: REAÇÕES NUCLEARES
- Language: Inglês
- Imprenta:
- Source:
- Título do periódico: Program and Abstracts
- Conference title: Reunião de Trabalho Sobre Física Nuclear no Brasil
-
ABNT
ABURAYA, Jim Heiji; ADDED, Nemitala; TABACNIKS, Manfredo Harri; RIZZUTTO, Marcia de Almeida. X-ray production yield in standardized thick target PIXE. Anais.. São Paulo: SBF, 2003. -
APA
Aburaya, J. H., Added, N., Tabacniks, M. H., & Rizzutto, M. de A. (2003). X-ray production yield in standardized thick target PIXE. In Program and Abstracts. São Paulo: SBF. -
NLM
Aburaya JH, Added N, Tabacniks MH, Rizzutto M de A. X-ray production yield in standardized thick target PIXE. Program and Abstracts. 2003 ; -
Vancouver
Aburaya JH, Added N, Tabacniks MH, Rizzutto M de A. X-ray production yield in standardized thick target PIXE. Program and Abstracts. 2003 ; - Construction and characterization of nanostructures in ion tracks
- Non destructive nuclear analysis of art and archeological objects
- Nuclear analytical methods applied to the analysis of certified Bone reference material
- Facilities and techniques used in recent studies of GFAA-USP
- Trace element concentration in São Francisco river water using STXRF and PIXE techniques
- Trace element concentration in São Francisco river water using STXRF and PIXE techniques
- Multielemental analysis of genetically modified food using ANAA and PIXE techniques
- Uptake of Cr(III) and Cr(VI) by the aquatic macrophytes Eicchornia crassipes from test water using PIXE technique
- Recent studies of GFAA (Group for Applied Physics with Accelerators)
- Comparing analysis of nano-resistive films with nuclear and atomic techniques
How to cite
A citação é gerada automaticamente e pode não estar totalmente de acordo com as normas