X-ray production yield in standardized thick target PIXE (2003)
- Authors:
- USP affiliated authors: RIZZUTTO, MARCIA DE ALMEIDA - IF ; ADDED, NEMITALA - IF ; TABACNIKS, MANFREDO HARRI - IF
- Unidade: IF
- Assunto: REAÇÕES NUCLEARES
- Language: Inglês
- Imprenta:
- Source:
- Título: Program and Abstracts
- Conference titles: Reunião de Trabalho Sobre Física Nuclear no Brasil
-
ABNT
ABURAYA, Jim Heiji et al. X-ray production yield in standardized thick target PIXE. 2003, Anais.. São Paulo: SBF, 2003. . Acesso em: 28 dez. 2025. -
APA
Aburaya, J. H., Rizzutto, M. de A., Added, N., & Tabacniks, M. H. (2003). X-ray production yield in standardized thick target PIXE. In Program and Abstracts. São Paulo: SBF. -
NLM
Aburaya JH, Rizzutto M de A, Added N, Tabacniks MH. X-ray production yield in standardized thick target PIXE. Program and Abstracts. 2003 ;[citado 2025 dez. 28 ] -
Vancouver
Aburaya JH, Rizzutto M de A, Added N, Tabacniks MH. X-ray production yield in standardized thick target PIXE. Program and Abstracts. 2003 ;[citado 2025 dez. 28 ] - Facilities and techniques used in recent studies of GFAA-USP
- Non destructive nuclear analysis of art and archeological objects
- Construction and characterization of nanostructures in ion tracks
- An optimized external beam setup for archaeological and arteometry research
- Thin target PIXE calibration using thick target yields
- Thin target PIXE calibration using thick target yield
- Analysis and discuss of trace elements in teeth of different animal species
- Sup-ppb analysis of water samples by PIXE and TXRF
- Polymers damages with heavy ions
- Automatic energy calibration for an RBS setup
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