The IFUSP facilities for material modification induced by ion beams (2011)
- Authors:
- USP affiliated authors: ADDED, NEMITALA - IF ; RIZZUTTO, MARCIA DE ALMEIDA - IF ; TABACNIKS, MANFREDO HARRI - IF
- Unidade: IF
- Assunto: ÍONS PESADOS
- Language: Inglês
- Imprenta:
- Source:
- Título: Resumo
- Conference titles: International Conference on Ion Beam Analysis
-
ABNT
SILVA, Tiago Fiorini da et al. The IFUSP facilities for material modification induced by ion beams. 2011, Anais.. Itapema: IBA, 2011. Disponível em: http://www.if.ufrgs.br/iba2011/program/144.pdf. Acesso em: 28 fev. 2026. -
APA
Silva, T. F. da, Tabacniks, M. H., Rizzutto, M. de A., Added, N., Barbosa, M. D. L., & Delgado, A. (2011). The IFUSP facilities for material modification induced by ion beams. In Resumo. Itapema: IBA. Recuperado de http://www.if.ufrgs.br/iba2011/program/144.pdf -
NLM
Silva TF da, Tabacniks MH, Rizzutto M de A, Added N, Barbosa MDL, Delgado A. The IFUSP facilities for material modification induced by ion beams [Internet]. Resumo. 2011 ;[citado 2026 fev. 28 ] Available from: http://www.if.ufrgs.br/iba2011/program/144.pdf -
Vancouver
Silva TF da, Tabacniks MH, Rizzutto M de A, Added N, Barbosa MDL, Delgado A. The IFUSP facilities for material modification induced by ion beams [Internet]. Resumo. 2011 ;[citado 2026 fev. 28 ] Available from: http://www.if.ufrgs.br/iba2011/program/144.pdf - High sensitivity boron quantification in bulk silicon using the 11B(p,α0)8Be nuclear reaction
- Recent studies of GFAA (Group for Applied Physics with Accelerators)
- Construction and characterization of nanostructures in ion tracks
- X-ray production yield in standardized thick target PIXE
- An optimized external beam setup for archaeological and arteometry research
- Thin target PIXE calibration using thick target yields
- Thin target PIXE calibration using thick target yield
- Non destructive nuclear analysis of art and archeological objects
- Analysis and discuss of trace elements in teeth of different animal species
- Sup-ppb analysis of water samples by PIXE and TXRF
How to cite
A citação é gerada automaticamente e pode não estar totalmente de acordo com as normas
