X-ray production yield in standardized thick target PIXE (2006)
- Authors:
- USP affiliated authors: RIZZUTTO, MARCIA DE ALMEIDA - IF ; ADDED, NEMITALA - IF ; TABACNIKS, MANFREDO HARRI - IF
- School: IF
- DOI: 10.1016/j.nimb.2006.03.141
- Subjects: DIFRAÇÃO POR RAIOS X; ANÁLISE DE DADOS; ESPECTROMETRIA
- Language: Inglês
- Imprenta:
- Source:
- Título do periódico: Nuclear Instruments & Methods in Physics Research Section B - Beam Interactions With Materials and Atoms
- ISSN: 0168-583
- Volume/Número/Paginação/Ano: v. 249, n.1-2, p. 792-795, 2006
- Este periódico é de assinatura
- Este artigo NÃO é de acesso aberto
- Cor do Acesso Aberto: closed
-
ABNT
ABURAYA, Jim Heiji; ADDED, Nemitala; TABACNIKS, Manfredo Harri; RIZZUTTO, Marcia de Almeida; BARBOSA, Marcel Dupret Lopes. X-ray production yield in standardized thick target PIXE. Nuclear Instruments & Methods in Physics Research Section B - Beam Interactions With Materials and Atoms, Amsterdan, v. 249, n. 1-2, p. 792-795, 2006. Disponível em: < http://www.sciencedirect.com/science?_ob=MImg&_imagekey=B6TJN-4K1X5CF-8-H&_cdi=5315&_user=972067&_orig=browse&_coverDate=08%2F31%2F2006&_sk=997509998&view=c&wchp=dGLbVtz-zSkWW&md5=c53e1ddd39edb72b2ffda2cb4f363edf&ie=/sdarticle.pd > DOI: 10.1016/j.nimb.2006.03.141. -
APA
Aburaya, J. H., Added, N., Tabacniks, M. H., Rizzutto, M. de A., & Barbosa, M. D. L. (2006). X-ray production yield in standardized thick target PIXE. Nuclear Instruments & Methods in Physics Research Section B - Beam Interactions With Materials and Atoms, 249( 1-2), 792-795. doi:10.1016/j.nimb.2006.03.141 -
NLM
Aburaya JH, Added N, Tabacniks MH, Rizzutto M de A, Barbosa MDL. X-ray production yield in standardized thick target PIXE [Internet]. Nuclear Instruments & Methods in Physics Research Section B - Beam Interactions With Materials and Atoms. 2006 ; 249( 1-2): 792-795.Available from: http://www.sciencedirect.com/science?_ob=MImg&_imagekey=B6TJN-4K1X5CF-8-H&_cdi=5315&_user=972067&_orig=browse&_coverDate=08%2F31%2F2006&_sk=997509998&view=c&wchp=dGLbVtz-zSkWW&md5=c53e1ddd39edb72b2ffda2cb4f363edf&ie=/sdarticle.pd -
Vancouver
Aburaya JH, Added N, Tabacniks MH, Rizzutto M de A, Barbosa MDL. X-ray production yield in standardized thick target PIXE [Internet]. Nuclear Instruments & Methods in Physics Research Section B - Beam Interactions With Materials and Atoms. 2006 ; 249( 1-2): 792-795.Available from: http://www.sciencedirect.com/science?_ob=MImg&_imagekey=B6TJN-4K1X5CF-8-H&_cdi=5315&_user=972067&_orig=browse&_coverDate=08%2F31%2F2006&_sk=997509998&view=c&wchp=dGLbVtz-zSkWW&md5=c53e1ddd39edb72b2ffda2cb4f363edf&ie=/sdarticle.pd - Construction and characterization of nanostructures in ion tracks
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Informações sobre o DOI: 10.1016/j.nimb.2006.03.141 (Fonte: oaDOI API)
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