Checking completeness of tests for finite state machines (2010)
- Authors:
- Autor USP: SIMÃO, ADENILSO DA SILVA - ICMC
- Unidade: ICMC
- Subjects: ENGENHARIA DE SOFTWARE; SISTEMAS DE INFORMAÇÃO
- Language: Inglês
- Imprenta:
- Publisher place: Los Alamitos
- Date published: 2010
- Source:
- Título: IEEE Transactions on Computers
- ISSN: 0018-9340
- Volume/Número/Paginação/Ano: v. 59, n. 8, p. 1023-1032, aug. 2010
-
ABNT
SIMÃO, Adenilso da Silva e PETRENKO, Alexandre. Checking completeness of tests for finite state machines. IEEE Transactions on Computers, v. 59, n. 8, p. 1023-1032, 2010Tradução . . Disponível em: http://ieeexplore.ieee.org/xpl/tocresult.do?isnumber=5494717. Acesso em: 25 jan. 2026. -
APA
Simão, A. da S., & Petrenko, A. (2010). Checking completeness of tests for finite state machines. IEEE Transactions on Computers, 59( 8), 1023-1032. Recuperado de http://ieeexplore.ieee.org/xpl/tocresult.do?isnumber=5494717 -
NLM
Simão A da S, Petrenko A. Checking completeness of tests for finite state machines [Internet]. IEEE Transactions on Computers. 2010 ; 59( 8): 1023-1032.[citado 2026 jan. 25 ] Available from: http://ieeexplore.ieee.org/xpl/tocresult.do?isnumber=5494717 -
Vancouver
Simão A da S, Petrenko A. Checking completeness of tests for finite state machines [Internet]. IEEE Transactions on Computers. 2010 ; 59( 8): 1023-1032.[citado 2026 jan. 25 ] Available from: http://ieeexplore.ieee.org/xpl/tocresult.do?isnumber=5494717 - Generating checking sequences for nondeterministic finite state machines
- Generation of checking sequences using identification sets
- Evaluating test suite characteristics, cost, and effectiveness of FSM-based testing methods
- Minimization of incompletely specified finite state machines based on distinction graphs
- A generalized model-based test generation method
- Fault coverage-driven incremental test generation
- Inferring finite state machines without reset using state identification sequences
- Generation of complete test suites from mealy input/output transition systems
- Generating complete and finite test suite for ioco: is it possible?
- On reducing test length for FSMs with extra states
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