A generalized model-based test generation method (2008)
- Authors:
- Autor USP: SIMÃO, ADENILSO DA SILVA - ICMC
- Unidade: ICMC
- Subjects: ENGENHARIA DE SOFTWARE; SISTEMAS DE INFORMAÇÃO
- Language: Inglês
- Imprenta:
- Publisher: IEEE Computer Society
- Publisher place: Los Alamitos
- Date published: 2008
- Source:
- Título: Proceedings
- Conference titles: IEEE International Conference on Software Engineering and Formal Methods
-
ABNT
BONIFÁCIO, Adilson Luiz e MOURA, Arnaldo Vieira e SIMÃO, Adenilso da Silva. A generalized model-based test generation method. 2008, Anais.. Los Alamitos: IEEE Computer Society, 2008. Disponível em: http://ieeexplore.ieee.org/xpl/tocresult.do?isnumber=4685779&isYear=2008'. Acesso em: 25 jan. 2026. -
APA
Bonifácio, A. L., Moura, A. V., & Simão, A. da S. (2008). A generalized model-based test generation method. In Proceedings. Los Alamitos: IEEE Computer Society. Recuperado de http://ieeexplore.ieee.org/xpl/tocresult.do?isnumber=4685779&isYear=2008' -
NLM
Bonifácio AL, Moura AV, Simão A da S. A generalized model-based test generation method [Internet]. Proceedings. 2008 ;[citado 2026 jan. 25 ] Available from: http://ieeexplore.ieee.org/xpl/tocresult.do?isnumber=4685779&isYear=2008' -
Vancouver
Bonifácio AL, Moura AV, Simão A da S. A generalized model-based test generation method [Internet]. Proceedings. 2008 ;[citado 2026 jan. 25 ] Available from: http://ieeexplore.ieee.org/xpl/tocresult.do?isnumber=4685779&isYear=2008' - Generating checking sequences for nondeterministic finite state machines
- Generation of checking sequences using identification sets
- Evaluating test suite characteristics, cost, and effectiveness of FSM-based testing methods
- Checking completeness of tests for finite state machines
- Minimization of incompletely specified finite state machines based on distinction graphs
- Fault coverage-driven incremental test generation
- Inferring finite state machines without reset using state identification sequences
- Generation of complete test suites from mealy input/output transition systems
- Generating complete and finite test suite for ioco: is it possible?
- On reducing test length for FSMs with extra states
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