Trace element concentrations from Sao Francisco River - PR analyzed with PIXE technique (2006)
- Authors:
- USP affiliated authors: ADDED, NEMITALA - IF ; TABACNIKS, MANFREDO HARRI - IF
- Unidade: IF
- DOI: 10.1007/s10967-006-0422-0
- Subjects: FÍSICA NUCLEAR; DIFRAÇÃO POR RAIOS X
- Language: Inglês
- Imprenta:
- Source:
- Título: Journal of Radionalytical and Nuclear Chemistry
- ISSN: 0022-3093
- Volume/Número/Paginação/Ano: v. 269, n. 3, p. 727-731, 2006
- Este periódico é de assinatura
- Este artigo NÃO é de acesso aberto
- Cor do Acesso Aberto: closed
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ABNT
RIZZUTTO, Márcia de Almeida et al. Trace element concentrations from Sao Francisco River - PR analyzed with PIXE technique. Journal of Radionalytical and Nuclear Chemistry, v. 269, n. 3, p. 727-731, 2006Tradução . . Disponível em: https://doi.org/10.1007/s10967-006-0422-0. Acesso em: 28 dez. 2025. -
APA
Rizzutto, M. de A., Added, N., Tabacniks, M. H., Espinoza-Quinones, F. R., Palácio, S. M., Galante, R. M., et al. (2006). Trace element concentrations from Sao Francisco River - PR analyzed with PIXE technique. Journal of Radionalytical and Nuclear Chemistry, 269( 3), 727-731. doi:10.1007/s10967-006-0422-0 -
NLM
Rizzutto M de A, Added N, Tabacniks MH, Espinoza-Quinones FR, Palácio SM, Galante RM, Rossi N, Zenatti DC, Rossi FL, Welter RA, Módenes AN. Trace element concentrations from Sao Francisco River - PR analyzed with PIXE technique [Internet]. Journal of Radionalytical and Nuclear Chemistry. 2006 ; 269( 3): 727-731.[citado 2025 dez. 28 ] Available from: https://doi.org/10.1007/s10967-006-0422-0 -
Vancouver
Rizzutto M de A, Added N, Tabacniks MH, Espinoza-Quinones FR, Palácio SM, Galante RM, Rossi N, Zenatti DC, Rossi FL, Welter RA, Módenes AN. Trace element concentrations from Sao Francisco River - PR analyzed with PIXE technique [Internet]. Journal of Radionalytical and Nuclear Chemistry. 2006 ; 269( 3): 727-731.[citado 2025 dez. 28 ] Available from: https://doi.org/10.1007/s10967-006-0422-0 - A round robin characterisation of the thickness and composition of thin to ultra-thin AlNO films
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Informações sobre o DOI: 10.1007/s10967-006-0422-0 (Fonte: oaDOI API)
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