A round robin characterisation of the thickness and composition of thin to ultra-thin AlNO films (2004)
- Authors:
- USP affiliated authors: ADDED, NEMITALA - IF ; TABACNIKS, MANFREDO HARRI - IF
- Unidade: IF
- DOI: 10.1016/j.nimb.2004.08.021
- Subjects: FÍSICA NUCLEAR; INSTRUMENTAÇÃO (FÍSICA)
- Language: Inglês
- Imprenta:
- Source:
- Título: Nuclear Instruments & Methods in Physics B
- ISSN: 0168-583X
- Volume/Número/Paginação/Ano: v. 227, n. 3, p. 397-419, 2004
- Este periódico é de acesso aberto
- Este artigo NÃO é de acesso aberto
-
ABNT
BARRADAS, N P e ADDED, Nemitala e TABACNIKS, Manfredo Harri. A round robin characterisation of the thickness and composition of thin to ultra-thin AlNO films. Nuclear Instruments & Methods in Physics B, v. 227, n. 3, p. 397-419, 2004Tradução . . Disponível em: https://doi.org/10.1016/j.nimb.2004.08.021. Acesso em: 13 fev. 2026. -
APA
Barradas, N. P., Added, N., & Tabacniks, M. H. (2004). A round robin characterisation of the thickness and composition of thin to ultra-thin AlNO films. Nuclear Instruments & Methods in Physics B, 227( 3), 397-419. doi:10.1016/j.nimb.2004.08.021 -
NLM
Barradas NP, Added N, Tabacniks MH. A round robin characterisation of the thickness and composition of thin to ultra-thin AlNO films [Internet]. Nuclear Instruments & Methods in Physics B. 2004 ; 227( 3): 397-419.[citado 2026 fev. 13 ] Available from: https://doi.org/10.1016/j.nimb.2004.08.021 -
Vancouver
Barradas NP, Added N, Tabacniks MH. A round robin characterisation of the thickness and composition of thin to ultra-thin AlNO films [Internet]. Nuclear Instruments & Methods in Physics B. 2004 ; 227( 3): 397-419.[citado 2026 fev. 13 ] Available from: https://doi.org/10.1016/j.nimb.2004.08.021 - Trace element concentrations from Sao Francisco River - PR analyzed with PIXE technique
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Informações sobre o DOI: 10.1016/j.nimb.2004.08.021 (Fonte: oaDOI API)
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