Menu

Filtros : "Journal of Integrated Circuits and Systems" "MARTINO, JOAO ANTONIO" Limpar

Filtros

Refine with date range

  • 1

1 - 2 (2 records)

  • Artigo de periodico

    Impact of selective epitaxial growth and uniaxial/biaxial strain on DIBL effect using triple gate FinFETs (2010)

    Santos, Sara Dereste dos; Martino, João Antonio ; Simoen, Eddy ; Claeys, Cor

    Source: Journal of Integrated Circuits and Systems. Unidade: EP

    Assunto: TRANSISTORES

    Acesso à fonteDOIHow to cite
    A citação é gerada automaticamente e pode não estar totalmente de acordo com as normas

    • ABNT

      SANTOS, Sara Dereste dos et al. Impact of selective epitaxial growth and uniaxial/biaxial strain on DIBL effect using triple gate FinFETs. Journal of Integrated Circuits and Systems, v. 5, n. 2, p. 154-159, 2010Tradução . . Disponível em: https://doi.org/10.29292/jics.v5i2.322. Acesso em: 15 nov. 2025.

    • APA

      Santos, S. D. dos, Martino, J. A., Simoen, E., & Claeys, C. (2010). Impact of selective epitaxial growth and uniaxial/biaxial strain on DIBL effect using triple gate FinFETs. Journal of Integrated Circuits and Systems, 5( 2), 154-159. doi:10.29292/jics.v5i2.322

    • NLM

      Santos SD dos, Martino JA, Simoen E, Claeys C. Impact of selective epitaxial growth and uniaxial/biaxial strain on DIBL effect using triple gate FinFETs [Internet]. Journal of Integrated Circuits and Systems. 2010 ;5( 2): 154-159.[citado 2025 nov. 15 ] Available from: https://doi.org/10.29292/jics.v5i2.322

    • Vancouver

      Santos SD dos, Martino JA, Simoen E, Claeys C. Impact of selective epitaxial growth and uniaxial/biaxial strain on DIBL effect using triple gate FinFETs [Internet]. Journal of Integrated Circuits and Systems. 2010 ;5( 2): 154-159.[citado 2025 nov. 15 ] Available from: https://doi.org/10.29292/jics.v5i2.322

  • Artigo de periodico

    Performance of source follower buffers implemented with standard and strained triple-gate nFinFETs (2010)

    Pavanello, Marcelo Antonio ; Martino, João Antonio ; Simoen, Eddy ; Claeys, Cor ; Rooyackers, Rita; Collaert, Nadine

    Source: Journal of Integrated Circuits and Systems. Unidade: EP

    Assunto: TRANSISTORES

    Acesso à fonteDOIHow to cite
    A citação é gerada automaticamente e pode não estar totalmente de acordo com as normas

    • ABNT

      PAVANELLO, Marcelo Antonio et al. Performance of source follower buffers implemented with standard and strained triple-gate nFinFETs. Journal of Integrated Circuits and Systems, v. 5, n. 2, p. 168-173, 2010Tradução . . Disponível em: https://doi.org/10.29292/jics.v5i2.324. Acesso em: 15 nov. 2025.

    • APA

      Pavanello, M. A., Martino, J. A., Simoen, E., Claeys, C., Rooyackers, R., & Collaert, N. (2010). Performance of source follower buffers implemented with standard and strained triple-gate nFinFETs. Journal of Integrated Circuits and Systems, 5( 2), 168-173. doi:10.29292/jics.v5i2.324

    • NLM

      Pavanello MA, Martino JA, Simoen E, Claeys C, Rooyackers R, Collaert N. Performance of source follower buffers implemented with standard and strained triple-gate nFinFETs [Internet]. Journal of Integrated Circuits and Systems. 2010 ;5( 2): 168-173.[citado 2025 nov. 15 ] Available from: https://doi.org/10.29292/jics.v5i2.324

    • Vancouver

      Pavanello MA, Martino JA, Simoen E, Claeys C, Rooyackers R, Collaert N. Performance of source follower buffers implemented with standard and strained triple-gate nFinFETs [Internet]. Journal of Integrated Circuits and Systems. 2010 ;5( 2): 168-173.[citado 2025 nov. 15 ] Available from: https://doi.org/10.29292/jics.v5i2.324
  • 1

1 - 2 (2 records)

Digital Library of Intellectual Production of Universidade de São Paulo     2012 - 2025