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Filtros : "IEEE Transactions on Electron Devices" "2013" Limpar

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  • Artigo de periodico

    On the Variability of the Front-/Back-Channel LF Noise in UTBOX SOI nMOSFETs (2013)

    Santos, Sara Dereste dos; Nicoletti, Talitha; Martino, João Antonio ; Aoulaiche, Marc; Veloso, Anabela; Jurczak, Malgorzata; Simoen, Eddy ; Claeys, Cor

    Source: IEEE Transactions on Electron Devices. Unidade: EP

    Subjects: SILÍCIO, FILMES FINOS, AVALIAÇÃO DE DESEMPENHO, TRANSISTORES

    Acesso à fonteDOIHow to cite
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    • ABNT

      SANTOS, Sara Dereste dos et al. On the Variability of the Front-/Back-Channel LF Noise in UTBOX SOI nMOSFETs. IEEE Transactions on Electron Devices, v. 60, n. 1, p. 444-450, 2013Tradução . . Disponível em: https://doi.org/10.1109/ted.2012.2227749. Acesso em: 19 nov. 2025.

    • APA

      Santos, S. D. dos, Nicoletti, T., Martino, J. A., Aoulaiche, M., Veloso, A., Jurczak, M., et al. (2013). On the Variability of the Front-/Back-Channel LF Noise in UTBOX SOI nMOSFETs. IEEE Transactions on Electron Devices, 60( 1), 444-450. doi:10.1109/ted.2012.2227749

    • NLM

      Santos SD dos, Nicoletti T, Martino JA, Aoulaiche M, Veloso A, Jurczak M, Simoen E, Claeys C. On the Variability of the Front-/Back-Channel LF Noise in UTBOX SOI nMOSFETs [Internet]. IEEE Transactions on Electron Devices. 2013 ; 60( 1): 444-450.[citado 2025 nov. 19 ] Available from: https://doi.org/10.1109/ted.2012.2227749

    • Vancouver

      Santos SD dos, Nicoletti T, Martino JA, Aoulaiche M, Veloso A, Jurczak M, Simoen E, Claeys C. On the Variability of the Front-/Back-Channel LF Noise in UTBOX SOI nMOSFETs [Internet]. IEEE Transactions on Electron Devices. 2013 ; 60( 1): 444-450.[citado 2025 nov. 19 ] Available from: https://doi.org/10.1109/ted.2012.2227749

  • Artigo de periodico

    Experimental Comparison Between Trigate p-TFET and p-FinFET Analog Performance as a Function of Temperature (2013)

    Agopian, Paula Ghedini Der ; Simoen, Eddy ; Vandooren, A; Rooyackers, Rita; Martino, João Antonio

    Source: IEEE Transactions on Electron Devices. Unidade: EP

    Subjects: AVALIAÇÃO DE DESEMPENHO, TRANSISTORES

    Acesso à fonteDOIHow to cite
    A citação é gerada automaticamente e pode não estar totalmente de acordo com as normas

    • ABNT

      AGOPIAN, Paula Ghedini Der et al. Experimental Comparison Between Trigate p-TFET and p-FinFET Analog Performance as a Function of Temperature. IEEE Transactions on Electron Devices, v. 60, n. 8, p. 2493-2497, 2013Tradução . . Disponível em: https://doi.org/10.1109/ted.2013.2267614. Acesso em: 19 nov. 2025.

    • APA

      Agopian, P. G. D., Simoen, E., Vandooren, A., Rooyackers, R., & Martino, J. A. (2013). Experimental Comparison Between Trigate p-TFET and p-FinFET Analog Performance as a Function of Temperature. IEEE Transactions on Electron Devices, 60( 8), 2493-2497. doi:10.1109/ted.2013.2267614

    • NLM

      Agopian PGD, Simoen E, Vandooren A, Rooyackers R, Martino JA. Experimental Comparison Between Trigate p-TFET and p-FinFET Analog Performance as a Function of Temperature [Internet]. IEEE Transactions on Electron Devices. 2013 ; 60( 8): 2493-2497.[citado 2025 nov. 19 ] Available from: https://doi.org/10.1109/ted.2013.2267614

    • Vancouver

      Agopian PGD, Simoen E, Vandooren A, Rooyackers R, Martino JA. Experimental Comparison Between Trigate p-TFET and p-FinFET Analog Performance as a Function of Temperature [Internet]. IEEE Transactions on Electron Devices. 2013 ; 60( 8): 2493-2497.[citado 2025 nov. 19 ] Available from: https://doi.org/10.1109/ted.2013.2267614
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